Patent classifications
H01J49/161
SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD
A sample analyzer includes a voltage source that applies a voltage to a sample. A laser irradiator irradiates the sample with a laser beam. A detector detects a particle emitted from the sample. An operation device specifies the material of the particle detected by the detection device, by mass spectrometry of the particle and analyzes the structure of the sample. The operation device calculates a ratio in structure between model information indicating the structure of the sample, which is prepared in advance, and analysis information indicating the structure of the sample, which is obtained by the mass spectrometry, and applies the ratio to the analysis information so as to correct the analysis information.
Analytical device
An analytical device includes: a valve assembly that is connected to a plurality of gas supply conduits; and a gas supply chamber to which a plurality of gases are supplied through the valve assembly, wherein: the valve assembly includes a plurality of valves that regulate flow rates of the plurality of gases supplied to the gas supply chamber through the plurality of gas supply conduits, a fixing member that integrally fixes the plurality of valves, a plurality of first sealing members that seal the plurality of valves against the fixing member, and a retainer that is fastened to the fixing member to integrally press the first sealing member against the fixing member.
METHOD AND APPARATUS FOR DETERMINING THE PRESENCE OF IONS IN A SAMPLE BY RESONANCE IONIZATION
A method of determining the presence ions in a sample, comprising: (i) resonantly ionising a sample beam containing the sample with one or more lasers arranged collinearly with the sample beam; (ii) obtaining data relating to resonantly produced electrons resulting from the ionisation of the sample beam; and (iii) determining the presence of ions in the sample using the data relating to resonant electrons.
Surface Layer Disruption and Ionization Utilizing an Extreme Ultraviolet Radiation Source
A surface ionizer for a trace detection system includes an extreme ultraviolet light source and an ion transfer line. Activation of the extreme ultraviolet light disrupts a surface of a sample along with residue and ionizes the resulting vapor. The ionized vapor is collected in the ion transfer line and passed into an analysis device for detection of components in the vapor.
LOW POWER PHOTOIONIZATION DETECTOR (PID)
A photoionization detector is disclosed. The photoionization detector comprises a detector electrode that outputs a signal, an ultraviolet lamp, a lamp driver communicatively coupled to the ultraviolet lamp and configured to turn the ultraviolet lamp on and off in response to a control input, and a controller that is communicatively coupled to the output signal of the detector electrode and to the control input of the lamp driver, that outputs an indication of gas detection based on the output signal of the detector electrode, and that turns the lamp driver on and off with an on duty cycle of less than 10%.
Method for treating a cancer patient based on atomic therapeutic indexes and non-radiation therapy
The present invention relates to the generation of an Atomic Therapeutic Indicator (ATI) for a test sample by the quantification of manganese; in voxels of a 3D region of the sample, wherein the 3D region is topographically defined by co-ordinates XYZ. The ATI is used to assess the radio-responsiveness i.e. sensitivity or resistance to radiation treatment, of a cancer i.e. a tumor/neoplasm. In a preferred embodiment, the present invention relates to a method of generating the ATI, assessing the radio-responsiveness of a tumor/neoplasm based on the ATI and, based on the assessment, either treating or not treating the tumor with radiation. The present invention also relates to a method of determining if a cancer is likely to reoccur post radiation treatment comprising quantifying the level of manganese in voxels of a 3D region of a test sample from the cancer and determining the frequency of high metallomic regions (HMRs) in the cancer, wherein a high frequency of HMRs is indicative that the cancer is likely to reoccur and a low frequency of HMRs is indicative that the cancer is unlikely to reoccur; and associated methods of treatment. The invention further relates to a method of determining the radio-responsiveness of a melanoma, the method comprising determining the level of melanin in a test sample from the melanoma, wherein the lower the level of melanin the more sensitive the melanoma is to radiation and the higher the level of melanin the more resistant the melanoma is to radiation; and associated methods of treatment.
Sample loading apparatus for laser ablation
The present invention discloses a sample loading apparatus for laser ablation, including a target seat, a base, an air channel, an aerosol channel and a sample chamber, wherein a shrinking mouth is formed in the top of the sample chamber and positioned on a lower surface of the aerosol channel; a spring is arranged in the sample chamber; an opening is formed in a lower surface of the sample chamber and communicated with an air outlet; a stop valve is arranged at the air outlet; one end of the aerosol channel is communicated with a carrier gas inlet, and the other end is communicated with an aerosol outlet; and a top of the aerosol channel includes a first transparent material. The present invention increases stable reliability in a continuous use process, and improves consistency of aerosol transmission efficiency, so that different samples are analyzed.
Aerosol ionizer
A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.
VACUUM PROCESSING DEVICE AND MASS ANALYZING DEVICE
A vacuum processing apparatus 100 includes: a vacuum chamber 1; a stage 2 placed inside the vacuum chamber 1, on which an object to be processed is placed; an internal guide rail 31 laid in the vacuum chamber 1 to guide the stage 2; a through-hole 103 made in a sidewall 102 of the vacuum chamber 1; a connecting rod 4 coupled to the stage 2 at one end and inserted in the through-hole 103, the other end being disposed outside the vacuum chamber 1; a movable member 5 connected to the other end of the connecting rod 4; a driving mechanism 8 disposed outside the vacuum chamber 1 to move the movable member 5; and a bellows 6 disposed between the movable member 5 and the sidewall 102, the bellows 6 following the movement of the movable member 5 while maintaining airtightness of the vacuum chamber 1.
Apparatus for measuring ion mobility of harmful material and reference data obtaining method of the same
Provided are an apparatus for measuring an ionic mobility of a harmful material and a reference data obtaining method thereof. The method includes obtaining a measurement signal by detecting a charge of an ion between electrodes, obtaining a noise signal by insulating the electrodes from the ion, aligning the noise signal with the measurement signal, removing a part of the measurement signal aligned with the noise signal, and calculating reference data from a remaining part of the measurement signal.