A Time of Flight mass analyzer is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. The ions are then orthogonally accelerated ions from the first annular ion guide section into the second annular ion guide section. An ion detector is disposed within the annular ion guide and has an ion detecting surface arranged in a plane which is substantially perpendicular to the longitudinal axis.

An improved multi-pass time-of-flight or electrostatic trap mass spectrometer (70) with an orthogonal accelerator, applicable to mirror based multi-reflecting (MR) or multi-turn (MT) analyzers. The orthogonal accelerator (64) is tilted and after first ion reflection or turn the ion packets are back deflected with a compensated deflector (40) by the same angle α to compensate for the time-front steering and for the chromatic angular spreads. The focal distance of deflector (40) is control by Matsuda plates or other means for producing quadrupolar field in the deflector. Interference with the detector rim is improved with dual deflector (68). The proposed improvements allow substantial extension of flight path and number of ion turns or reflections. The problems of analyzer angular misalignments by tilting of ion mirror (71) is compensated by electrical adjustments of ion beam (63) energy and deflection angles in deflectors (40) and (68).

To acquire a mass spectrum for a wide mass range, a normal analysis execution controlling unit controls components to repeatedly perform measurement while changing setting m/z by a predetermined m/z at a time, and a mass spectrum summarizing processing unit summarizes data pieces each obtained by each time of measurement to generate the mass spectrum. Radio-frequency voltage applied to an ion guide and the like is changed based on the setting m/z. The radio-frequency voltage for the setting m/z is determined using a table in which a relationship between a position on an axis between upper and lower limits of the mass range and the radio-frequency voltage is substantially the same regardless of the mass range.

A lead-in electrode, of an orthogonal acceleration time-of-flight mass spectrometer, includes: a main body having an ion passing part and a first member including a main-body accommodating part that is a through-hole. One surface of the first member includes an extension part to define a position of one surface of the main body. A second member is attached to the first member. A through-hole is provided at a position of the second member. One surface of the second member includes a first area in contact with a surface opposite to the one surface of the first member and a second area located inside with respect to the first area. The second area is formed lower than a surface, of the first area, in contact with the surface opposite to the one surface. A lead-in electrode elastic member is disposed, in the second area, between the first member and second members.

A mass spectrometer is disclosed comprising an ion optics device housing having one or more external electrical connectors (1719) provided thereon. An ion optics device (301) is arranged inside the ion optics device housing, the ion optics device (301) comprising one or more electrodes for manipulating ions, the one or more electrodes being electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing. A voltage supply housing (1717) is provided having one or more external electrical connectors provided thereon. One or more voltage supplies are arranged inside the voltage supply housing (1717), the one or more voltage supplies being in electrical communication with the one or more external electrical connectors provided on the voltage supply housing. The one or more external electrical connectors provided on the voltage supply housing are directly physically and electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing.

An ionizer 1 including an ionization chamber 10, a sample gas introduction port 14 provided in the ionization chamber 10 for introducing sample gas, an electron beam emitting section 11 which emits an electron beam toward the ionization chamber 10, electron beam passage openings 10a and 10b which are formed on a path of the electron beam emitted from the electron beam emitting section 11 on a wall of the ionization chamber 10 and has a length in a direction of the path longer than a width of a cross section orthogonal to the direction, and an ion outlet 10c provided in the ionization chamber 10 for emitting an ion of the sample gas generated by irradiation with the electron beam, and a mass spectrometer 60 including the ionizer 1.

A mass spectrometer system comprises: (a) an ion source; (b) a mass filter or a time-of-flight (TOF) ion separator configured to receive a stream of first-generation ions from the ion source; (c) an ion storage device having an ion inlet configured to receive a stream of filtered ions comprising a plurality of ion species from the mass filter or TOF separator and to accumulate the plurality of ion species therein; (d) an ion mobility cell having an ion inlet configured to receive an accumulated batch of ion species from the ion storage device and an ion outlet configured to release, one at a time, the individual ion species therefrom; and (e) a mass analyzer configured to receive and mass analyze each first-generation ion species or each fragment ion species generated by fragmentation or other reaction of the various first-generation ion species.

An aperture plate assembly for an analytical instrument comprises a first sub-assembly comprising an aperture plate and a second sub-assembly comprising a guide. The first sub-assembly is configured to be attached to the second sub-assembly such that the aperture plate is positioned in a first position relative to the second sub-assembly. The first sub-assembly and the second sub-assembly are configured such that when the first sub-assembly is engaged by the guide, the aperture plate can be moved into the first position and the first sub-assembly can be attached to the second sub-assembly.

A drive unit for driving an acceleration electrode of a mass spectrometer is disclosed. The drive unit includes a power converter comprising a switching element and pulsing circuitry that can form output pulses suitable for driving an acceleration electrode of a mass spectrometer. The drive unit also includes a controller that is configured to synchronise operation of the switching element with the pulsing circuitry.

A time-of-flight mass spectrometer includes a flight tube, an ion introduction unit that is connected to the flight tube, an ion detector that detects an ion flown in the flight tube, and a control unit that controls the ion introduction unit and the flight tube, wherein: the control unit sequentially changes an accumulation state of the ion to be introduced into the flight tube by the ion introduction unit, for a plurality of measurement processes performed repeatedly.