Patent classifications
H01J49/401
ANALYTICAL DEVICE, ANALYSIS METHOD AND PROGRAM
An analytical device includes: a mass spectrometry unit that separates ions based on flight time and detects the ions having been separated; an analysis unit that creates data corresponding to a spectrum in which an intensity of the ions having been detected and the flight time or m/z corresponding to the flight time are associated; a peak width calculation unit that calculates a first peak width at a first intensity and a second peak width at a second intensity different from the first intensity for at least one peak in the spectrum; and an adjustment unit that performs an adjustment of the mass spectrometry unit based on the first peak width and the second peak width.
TIME-OF-FLIGHT MASS SPECTROMETRY DEVICE
A time-of-flight mass spectrometry device includes: an ion introduction unit; a vacuum chamber connected to the ion introduction unit; a support member provided inside the vacuum chamber; a flight tube having a part of the outer surface supported by the support member and provided inside the vacuum chamber; a temperature sensor provided in the vicinity of a connection portion with the support member of the vacuum chamber; a temperature adjustment element provided in the vicinity of the connection portion; and a temperature control unit that controls the temperature adjustment element based on a measurement result of the temperature sensor.
Orthogonal acceleration time-of-flight mass spectrometer
An orthogonal acceleration time-of-flight mass spectrometer (1) includes: an ion ejector (123) which ejects measurement-target ions in a predetermined direction; an orthogonal accelerator (132) which accelerates ions in a direction orthogonal to the direction in which the ions are ejected; a ring electrode (131) located between the ion ejector and the orthogonal accelerator, the ring electrode having an opening for allowing ions to pass through and arranged so that the central axis (C2) of the opening is shifted from the central axis (C1) of the ion ejector in a direction along the axis of the acceleration of the ions by the orthogonal accelerator; a reflectron electrode (134) which creates a repelling electric field for reversing the direction of the ions accelerated by the orthogonal accelerator; and an ion detector (135) which detects ions after the direction of flight of the ions is reversed by the reflectron electrode.
MASS ANALYSER
A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane. The injection interface includes at least one injection deflector located within the mass analyser, the at least one injection deflector being configured to deflect ions injected into the mass analyser in the direction of the drift path, wherein the injection interface is preferably configured so that ions guided along the 3D reference trajectory are, after injection into the mass analyser, kept adequately distant from the injection opening such that they are substantially unaffected by electric field distortions around the injection opening.
Time-of-flight mass spectrometer
A metallic plate holder 3 is directly placed on a flat bottom plate 1a of a sample chamber. A linear guide 21 extending in x-direction is located below the bottom plate. Another linear guide 22 extending in y-direction is fixed to a movable part 21a of the linear guide 21. A magnet 23, fixed to a movable part 22a of the linear guide 22, magnetically attracts the plate holder across the bottom plate. When the magnet is two-dimensionally driven by the linear guides, the plate holder follows it and moves two-dimensionally. The flat bottom plate limits the z-position of the plate holder, thereby reducing the fluctuation in the level of the sample on a sample plate 2 due to the movement. Thus, the variation in the level at different positions on the sample plate is reduced, so that the number of times of a calibrant measurement can be decreased.
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field (45) is arranged within a region of small ion energy for electronically controlled tilting of ion packets (54) time front. Tilt angle of time front (54) is strongly amplified by a post-acceleration in a flat field (48). Electrostatic deflector (30) downstream of the post-acceleration (48) allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. =0 for ion packet in location (55), for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator (40) rims, adjusting ion packets inclination angles .sub.2 and what is most important, compensating for mechanical misalignments of the optical components.
ION INJECTION INTO MULTI-PASS MASS SPECTROMETERS
An improved multi-pass time-of-flight or electrostatic trap mass spectrometer (70) with an orthogonal accelerator, applicable to mirror based multi-reflecting (MR) or multi-turn (MT) analyzers. The orthogonal accelerator (64) is tilted and after first ion reflection or turn the ion packets are back deflected with a compensated deflector (40) by the same angle to compensate for the time-front steering and for the chromatic angular spreads. The focal distance of deflector (40) is control by Matsuda plates or other means for producing quadrupolar field in the deflector. Interference with the detector rim is improved with dual deflector (68). The proposed improvements allow substantial extension of flight path and number of ion turns or reflections. The problems of analyzer angular misalignments by tilting of ion mirror (71) is compensated by electrical adjustments of ion beam (63) energy and deflection angles in deflectors (40) and (68).
MASS SPECTROMETER
A mass spectrometer is disclosed comprising an ion mobility spectrometer or separator and an ion guide arranged downstream of the ion mobility spectrometer or separator. A plurality of axial potential wells are created in the ion guide so that ions received from the ion mobility spectrometer or separator become confined in separate axial potential wells. The potential wells maintain the fidelity and/or composition of ions received from the ion mobility spectrometer or separator. The potential wells are translated along the length of the ion guide.
METHOD FOR CONTROLLING THE MASS FILTER IN A HYBRID IMS/MS SYSTEM
The invention provides a method for acquiring as many fragment mass spectra of selected substances, e.g. proteins, of complex mixtures, as possible using a hybrid mass spectrometric system which comprises an ion source, an ion mobility separator, a mass filter, a fragmentation cell, and a mass analyzer. The fragment mass spectra are used for identifying the substances by their fragment mass spectra. The invention proposes to control the dwell time of the mass filter and to adapt the dwell time to the length of the ion mobility signal in a mass-mobility map.
MASS SPECTROMETER
In a tandem mass spectrometer, when the measurement mode is switched between a positive ion measurement mode and a negative ion measurement mode, a DC offset voltage applied to a lens electrode to impart collision energy to an ion is temporarily switched to 0 V (S1). After being maintained at 0 V for a predetermined waiting time (S2), the voltage is changed to a DC offset voltage corresponding to a measurement mode which is used after the switching operation (S3). By such an operation, the voltage difference between the neighboring plate electrodes among the plate electrodes (171, 172, 173) included in the lens electrode can be decreased as compared to the case where the polarity of the DC offset voltage is immediately switched. Consequently, unintended electric discharge between the neighboring electrodes can be prevented.