The invention relates to time-of-flight mass spectrometers with pulsed ionization of samples, for example by matrix-assisted laser desorption (MALDI), where the samples are located on a sample support and are irradiated and ionized one after the other in a grid by a position-controlled desorption beam. An ion-optical puller lens arrangement is positioned in front of the sample support, with at least one of the lens diaphragms in the arrangement being subdivided into segments, and a voltage supply being able to supply the segments, or some of them, with different voltages, depending on the impact position of the desorption beam on the support plate. It is then possible to virtually shift the effective ion-optical focusing center of the lens away from the axis, and to focus an ion beam, which is generated off the real lens axis, into a beam which runs essentially parallel to the real lens axis, with no time phase shift for ions of the same mass. This beam can be brought back onto the axis by an x/y deflection unit, for example for operating the time-of-flight mass spectrometer with a reflector.

In one aspect, a time-of-flight mass spectrometer includes a source comprising a backing plate configured to operably couple to a core sample containing component, and an acceleration region. The time-of-flight mass spectrometer also includes a time-of-flight mass analyzer operably associated with the source region. In some embodiments, the core sample core sample containing component is a coring drill bit. In some embodiments, core containing component is configured to couple to the backing plate of the source region from the opposite side of the acceleration region. In some embodiments, core containing component is configured to couple to the backing plate of the source region on the acceleration region side of the backing plate. In some embodiments, the acceleration region is a single-stage acceleration region. In other embodiments, the acceleration region is a two-stage acceleration region.

The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

Methods for confirming charged-particle generation in an instrument are provided. A method to confirm charged-particle generation in an instrument includes providing electrical connections to a charged-particle optics system of the instrument while the charged-particle optics system is in a chamber. The method includes coupling an electrical component having an impedance to charged-particle current generated in the chamber. Moreover, the method includes measuring an electrical response by the electrical component to the charged-particle current. Related instruments are also provided.

A shielding plate 6 having a forward-side slit opening 61 and return-side slit opening 62 is placed in a free flight space 3 with no electric field. Ions which significantly deviate from a reference path are removed by the shielding plate 6 on both the forward-side and return-side paths. The opening width of the forward-side slit opening 61 is smaller than that of the return-side slit opening 62. Those opening widths and the placement position of the shielding plate 6 are determined based on the result of an ion trajectory calculation by accurate simulation. As compared to a conventional device with a shielding plate placed only on the return side, the present configuration allows for an increase in the opening width of the return-side slit opening while achieving the same level of resolving power. The ion transmission ratio is thereby improved, and the analytical sensitivity is enhanced.

A shielding plate 6 having a forward-side slit opening 61 and return-side slit opening 62 is placed in a free flight space 3 with no electric field. Ions which significantly deviate from a reference path are removed by the shielding plate 6 on both the forward-side and return-side paths. The opening width of the forward-side slit opening 61 is smaller than that of the return-side slit opening 62. Those opening widths and the placement position of the shielding plate 6 are determined based on the result of an ion trajectory calculation by accurate simulation. As compared to a conventional device with a shielding plate placed only on the return side, the present configuration allows for an increase in the opening width of the return-side slit opening while achieving the same level of resolving power. The ion transmission ratio is thereby improved, and the analytical sensitivity is enhanced.

A method for analyzing a plurality of molecules with cryogenic vibrational spectroscopy including the steps of providing a packet of molecules in a ionized form, injecting the packet into an ion mobility section, spatially separating the ions of the packet into subpackets according to their collisional cross section (CCS), recompressing the subpackets, by removing an empty space between them, loading the ions into a cryogenic ion trap by keeping subpackets with different collisional cross section in a respective separate compartment, cooling the ions in collisions with a buffer gas, tagging the ions by attaching a messenger molecule, sending a pulse to the trap to excite vibrations of the cold, trapped, and messenger-tagged ions, and separately ejecting ion subpacket from the trap into an extraction region of a time-of-flight mass spectrometer and measuring the number of remaining messenger-tagged ions and untagged ions for each subpacket.

The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

An acceleration voltage generator generates a high-voltage pulse applied to a push-out electrode, by operating a switch section to turn on and off a high direct-current voltage generated by a high-voltage power supply. A drive pulse signal is supplied from a controller to the switch section through a primary-side drive section, transformer, and secondary-side drive section. A primary-voltage controller receives a measurement result of ambient temperature of the acceleration voltage generator from a temperature sensor, and controls a primary-side power supply to change a primary-side voltage according to the temperature, thereby adjusting the voltage applied between the two ends of a primary winding of the transformer. The adjustment made on the primary-side voltage changes a slope angle of rise of a gate voltage in the MOSFET, and enables a correction to a discrepancy in the timing of the rise/fall of the high-voltage pulse caused by change in ambient temperature.

A multipole rod set of an ion guide is adapted to receive a radial RF trapping voltage and a radial dipole direct current DC voltage. A lens electrode of the ion guide is positioned at one end of the multipole rod set to extract ions from the multipole rod set and adapted to receive an axial trapping AC voltage and a DC voltage. A radial dipole DC voltage is applied to the multipole rod set and an axial trapping AC voltage is simultaneously applied to a lens electrode in order to extract a bandpass mass range of ions trapped in the multipole rod set. Alternatively, a radial RF trapping voltage amplitude is applied to the multipole rod set and an axial trapping AC voltage is simultaneously applied to the lens electrode in order to extract a bandpass mass range of ions trapped in the multipole rod set.