A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors (42) that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions (47) into the space between the mirrors using an ion introduction mechanism (43) such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors (42) as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism (44) after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism (43) and/or at least part of the ion receiving mechanism (44) is arranged between the mirrors (42).

A Time of Flight mass analyzer is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. An ion detector is disposed within the annular ion guide. Ions are orthogonally accelerated in a first axial direction from the first annular ion guide section into the second annular ion guide section. An axial DC potential is maintained along at least a portion of the second annular ion guide section so that the ions are reflected in a second axial direction which is substantially opposed to the first axial direction. The ions undergo multiple axial passes through the second annular ion guide section before being detected by the ion detector.

A method and apparatus are disclosed for improving resolution and duty-cycle of a multi-reflecting TOF mass spectrometer (MR-TOF) by arranging a cylindrical analyzer having an appropriate radial deflection means, means for limiting ion divergence in the tangential direction and a pulsed source providing ion packet divergence of less than 1 mm*deg. There are disclosed embodiments for fifth-order focusing cylindrical ion minors. Separate embodiments provide parallel tandem MS-MS within a single cylindrical MR-TOF.

A method of mass spectrometry is provided. The method comprises performing the following steps for each of a plurality of sub-ranges selected from an overall m/z range: accumulating in an ion store a sample of precursor ions to be analysed, the precursor ions having m/z values within the sub-range; accumulating in the ion store a sample of fragmented precursor ions to be analysed, the fragmented precursor ions being formed from fragmentation of precursor ions having m/z values within the sub-range; and simultaneously analysing the combined samples of the precursor ions and the fragmented precursor ions in a mass analyser.

An MT-TOFMS which is one mode of the present invention includes: a linear ion trap (2) configured to temporarily hold ions to be analyzed, and to eject the ions through an ion ejection opening (211) having a shape elongated in one direction; a loop flight section (3) configured to form a loop path (P) capable of making ions repeatedly fly; and a slit part (5) located on an ion path in which the ions ejected from the linear ion trap (2) travel until the ions are introduced into the loop path, the slit part configured to block a portion of the ions in a longitudinal direction of the ion ejection opening (211).

Certain embodiments described herein are directed to time of flight tubes comprising a cylindrical tube comprising an inner surface and an outer surface, the cylindrical tube comprising an effective thickness and sized and arranged to couple to and support a reflectron assembly inside the cylindrical tube. In some configurations, the cylindrical tube further comprises a conductive material disposed on the inner surface of the cylindrical tube, the conductive material present in an effective amount to provide a field free region for ions when the conductive material is charged.

A Time of Flight mass analyser is disclosed comprising an annular ion guide having a longitudinal axis and comprising a first annular ion guide section and a second annular ion guide section. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits within the first annular ion guide section about the longitudinal axis. An ion detector is disposed within the annular ion guide. Ions are orthogonally accelerated in a first axial direction from the first annular ion guide section into the second annular ion guide section. An axial DC potential is maintained along at least a portion of the second annular ion guide section so that the ions are reflected in a second axial direction which is substantially opposed to the first axial direction. The ions undergo multiple axial passes through the second annular ion guide section before being detected by the ion detector.

Used as an ion beam guiding unit for introducing primary ions to the surface of the sample is an ion optical system of reflectron TOFMS for achieving time focusing including an orthogonal acceleration unit for accelerating the ions in the orthogonal direction, a flight space of a non-electric field, and an ion reflector for forming a reflecting electric field. A dual stage type is used as the ion reflector to superimpose the correction potential showing a predetermined non-linear potential distribution on the potential having a linear gradient of a uniform electric field at the side deeper than the second order focusing position that fulfills the Mamyrin solution, thereby correcting the temporal spread of ion packets emitted from the orthogonal acceleration unit until the deviation of third or higher order in energy, achieving high time focusing.

An ion mirror (10) for use in a time of flight mass spectrometer (100) comprises a first conductor (20) for producing a quadratic field along a first axis (80), and a second conductor (30) for producing a quadratic field along a second axis (90), the axes (80, 90) being orthogonal.

A device for manipulating charged particles using an axial electric field as they travel along a longitudinal axis of the device is disclosed. The method comprises providing an outer electrode for generating an electric field and providing a plurality of inner electrodes that are separated by gaps of different lengths. The electric field generated by the outer electrode penetrates the gaps between the inner electrodes and the gaps are selected such that the desired potential profile is arranged along the longitudinal axis in order to manipulate the charged particles in the desired manner.