Patent classifications
H01J49/406
Ion trap mass spectrometer
An apparatus 41 and operation method are provided for an electrostatic trap mass spectrometer with measuring frequency of multiple isochronous ionic oscillations. For improving throughput and space charge capacity, the trap is substantially extended in one Z-direction forming a reproduced two-dimensional field. Multiple geometries are provided for trap Z-extension. The throughput of the analysis is improved by multiplexing electrostatic traps. The frequency analysis is accelerated by the shortening of ion packets and either by Wavelet-fit analysis of the image current signal or by using a time-of-flight detector for sampling a small portion of ions per oscillation. Multiple pulsed converters are suggested for optimal ion injection into electrostatic traps.
Mass Error Correction Due to Thermal Drift in a Time of Flight Mass Spectrometer
A method of calibrating a TOF-MS mass spectrum, to account for temperature changes, is disclosed. Ions are introduced into a Fourier Transform Mass Spectrometer and their mass to charge ratios are determined. Ions, including calibrant ions, are also introduced into a time of flight mass spectrometer and the mass to charge ratios of the calibrant ions at least are also determined. Specific peaks representative of calibrant ions are selected and matched between the TOF MS and FTMS spectra. The relative position of matched peaks in each spectrum is then used to determine a temperature correction factor for the TOF MS data, based upon the relative independence of the FTMS spectrum with respect to temperature.
Ion mirror, an ion mirror assembly and an ion trap
An ion mirror (10) for use in a time of flight mass spectrometer (100) comprises a first conductor (20) for producing a quadratic field along a first axis (80), and a second conductor (30) for producing a quadratic field along a second axis (90), the axes (80, 90) being orthogonal.
Quasi-planar multi-reflecting time-of-flight mass spectrometer
A multi-reflecting, time-of-flight (MR-TOF) mass spectrometer including two quasi-planar electrostatic ion mirrors extended along drill direction (Z) and formed of parallel electrodes, separated by a field free region. The MR-TOF includes a pulsed ion source to release ion packets at a small angle to X-direction which is orthogonal to the drill direction Z. Ion packets are reflected between ion mirrors and drill along the drift direction. The mirrors are arranged to provide time-of-flight focusing ion packets on the receiver. The MR-TOF mirrors provide spatial focusing M the Y-direction orthogonal to both drift direction Z and on injection direction X. In a preferred embodiment, at least one mirror has a feature providing periodic spatial focusing of ion packets in the drift Z-direction.
Multi-reflection mass spectrometer with deceleration stage
Disclosed herein is a multi-reflection mass spectrometer comprising two ion mirrors spaced apart and opposing each other in an X direction, each mirror elongated along a drift direction Y orthogonal to the direction X, and an ion injector for injecting ions as an ion beam into the space between the ion mirrors at an inclination angle to the X direction. Along a first portion of their length in the drift direction Y the ion mirrors converge with a first degree of convergence, and along a second portion of their length in the drift direction Y the ion mirrors converge with a second degree of convergence or are parallel, the first portion of their length being closer to the ion injector than the second portion and the first degree of convergence being greater than the second degree of convergence.
IMAGING MASS SPECTROMETER
A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array (71) to a corresponding array of positions on a position sensitive ion detector (79). The ion optics include at least one gridless ion mirror (76) for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.
Methods and systems for multi-pass encoded frequency pushing
A time-of-flight mass spectrometer (TOF MS) comprises a mass analyzer, an ion pushing device, a filtering device, a multi-pass reflector, a detector, and a decoder. The ion pushing device is arranged to push ions into the mass analyzer. The filtering device is arranged to filter a portion of the ions based on a mass range of the ions. The multi-pass reflector is arranged to selectively reflect the ions for further passes through the mass analyzer. The detector is arranged to receive the ions. The decoder is arranged to reconstruct a mass spectrum for the entire mass range of the ions.
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
A time-of-flight (ToF) mass analyser determines mass to charge ratio (m/z) of ions by determining flight times along an ion path. In first and second modes of operation, flight times of the ions along the ion path are determined to obtain respective first and second sets of data. In the first and second modes, the ion path has first and second path lengths and the paths are maintained at first and second pressures, respectively, wherein the first and second path lengths and/or the first and second pressures are different. An ion peak in the first set of data is compared to a corresponding ion peak in the second set of data, and a collision cross section of the associated ions is determined based on the comparison.
TIME OF FLIGHT MASS ANALYSIS SYSTEM
Methods of calibrating a Time of Flight (TOF) mass analyser comprise performing a plurality of calibration analyses of calibrant ions using the TOF mass analyser, each calibration analysis measuring flight times of the calibrant ions. The TOF mass analyser has an associated instrument parameter which effects the flight times of the calibrant ions. Each calibration analysis also comprises determining a reference calibration curve based on known mass to charge ratios of the calibrant ions and the respective flight times, wherein the reference calibration curve is associated with the instrument parameter for the respective calibration analysis. For each calibration analysis, a value of the instrument parameter of the TOF mass analyser is different. A calibration curve for use in a TOF mass analysis performed by the TOF mass analyser can be determined based on the plurality of reference calibration curves and the instrument parameter.
Apparatus and method for pulsed mode charge detection mass spectrometry
A charge detection mass spectrometer includes an ion trap configured to receive and store ions therein and to selectively release stored ions therefrom, and an electrostatic linear ion trap (ELIT) spaced apart from the ion trap, the ELIT including first and second ion mirrors and a charge detection cylinder positioned therebetween, and means for selectively controlling the ion trap to release at least some of the stored ions therefrom to travel toward and into the ELIT, and for controlling the first and second ion mirrors in a manner which traps in the ELIT a single one of the ions traveling therein and causes the trapped ion to oscillate back and forth between the first and second ion mirrors each time passing through and inducing a corresponding charge on the charge detection cylinder.