A multi-reflecting time-of-flight mass spectrometer (MR-TOF MS) includes an ion source, an orthogonal accelerator, and an ion mirror assembly. The ion source is capable of generating a beam of ions, and is arranged to accelerate the ions in a first direction along a first axis. The orthogonal accelerator is arranged to accelerate the ions in a second direction along a second axis. The second direction is orthogonal to the first direction. The ion mirror assembly includes a plurality of gridless planar mirrors and a plurality of electrodes. The plurality of electrodes are arranged to provide time-focusing of ions along a third axis substantially independent of ion energy and ion position.

An ion mirror 41 constructed of thin electrodes that are interconnected by resistive dividers 45 with potentials U1-U5 applied to knot electrodes to form segments 41-43 of linear potential distribution between the “knot” electrodes, yet without separating those field regions by meshes. Weak and controlled penetration of electric fields provide for a fine control over the field non linearity and over the equipotential line curvature, thus allowing to reach unprecedented level of ion optical quality: more than twice larger energy acceptance compared to thick electrode mirrors, up to sixth order time per energy focusing, ion spatial focusing and wide spatial acceptance. Novel mirrors can be formed very slim to arrange them into stacks for ion transverse displacement between ion reflections or for multiplexed mirror stacks. Printed circuit boards (PCB) are best suited for making novel ion mirrors, while novel ion mirrors are designed to suit PCB requirements.

Disclosed herein is an ion analysis instrument comprising a Time of Flight (“TOF”) mass analyser comprising a reflectron. The instrument is operable in at least a first mode and a second mode, wherein in said first mode ions are caused to turn around at a first point in the reflectron and wherein in said second mode ions are caused to turn around at a second point in the reflectron such that the distance traveled by ions within the Time of Flight mass analyser is greater in the second mode than the distance traveled by ions within the Time of Flight mass analyser in the first mode. In this way, the operating modes can be selectively optimised for the analysis of ions of different masses.

One or more ions are received along a central axis through a first set of reflectron plates of an ELIT. Voltages are applied to the first set of plates and to a second set of reflectron plates in order to trap and oscillate the one or more ions. A first induced current is measured from a cylindrical pickup electrode between the first set of reflectron plates and the second set of reflectron plates. A second induced current is measured from one or more plates of the first set of reflectron plates. A third induced current is measured from one or more plates of the second set of reflectron plates. The first measured induced current, second measured induced current and third measured induced current are combined to reduce higher order frequency harmonics of the induced current.

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi-reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

A voltage supply and a method for calibrating the voltage supply are provided. The voltage supply is for providing a reference voltage to supply a voltage to at least one electrode. The voltage supply comprises: an ultra-stable DC voltage source, an accurate DC voltage source, a tuning unit, a comparator, and a control unit. An ultra-stable voltage is applied to the tuning unit, which is provided based on a supplied voltage of the ultra-stable DC voltage source. The tuning unit provides an output voltage. A voltage based on the output voltage of the tuning unit is compared by the comparator with an accurate voltage. The accurate voltage is provided based on a supplied voltage of the accurate DC voltage source. The comparator provides a signal resulting from the comparison to the control unit, wherein the control unit is tuning the tuning unit during a tuning period according to the signal provided by the comparator to minimize the absolute difference between the voltage based on the output voltage of the tuning unit and the accurate voltage. The reference voltage of the voltage supply is provided based on the output voltage of the tuning unit after the tuning period.

A mass spectrometer comprising: a multi-reflecting time of flight (MRTOF) mass analyser or mass separator having two gridless ion mirrors 2 that are elongated in a first dimension (Z-dimension) and configured to reflect ions multiple times in a second orthogonal dimension (X-dimension) as the ions travel in the first dimension; the spectrometer configured to operate in: (i) a first mode for ions having a first rate of interaction with background gas molecules in the mass analyser or separator, such that the ions are reflected a first number of times between the ion mirrors 2; and (ii) a second mode for ions having a second, higher rate of interaction with background gas molecules in the mass analyser or separator, such that ions are reflected a second, lower number of times between the ion mirrors 2.

A multi-reflecting time-of-flight mass spectrometer MR TOF with an orthogonal accelerator (40) is improved with at least one deflector (30) and/or (30R) in combination with at least one wedge field (46) for denser folding of ion rays (73). Systematic mechanical misalignments (72) of ion mirrors (71) may be compensated by electrical tuning of the instrument, as shown by resolution improvements between simulated peaks for non compensated case (74) and compensated one (75), and/or by an electronically controlled global electrostatic wedge/arc field within ion mirror (71).

A time-of-flight (ToF) mass spectrometer, comprising: a pulsed ion injector for forming an ion beam that travels along an ion path; a detector for detecting ions in the ion beam that arrive at the detector at times according to their m/z values; an ion focusing arrangement located between the ion injector and the detector for focusing the ion beam in at least one direction orthogonal to the ion path; and a variable voltage supply for supplying the ion focusing arrangement with at least one variable voltage that is dependent on a charge state and/or an amount of ions of at least one species of ions in the ion beam. A corresponding method of mass spectrometry is provided. The charge state and/or an amount of ions may be acquired from a pre-scan, or predicted. Tuning of the spectrometer based on a charge state and/or an amount of ions of at least one species of ions in the ion beam may be performed on the fly.

A mass spectrometer comprising: an ion energy filter 14 arranged and configured to filter ions according to their kinetic energy and so as to only transmit ions having a component of kinetic energy in a first dimension (z-dimension) that is within a selected range; and a multi-reflecting time of flight mass analyser or mass separator 1 having an ion accelerator 6, and two gridless ion mirrors 2 that are elongated in the first dimension (z-dimension) and configured to reflect ions multiple times in a second orthogonal dimension (x-dimension), wherein the ion accelerator 6 is arranged to receive ions from the energy filter 14 and accelerate the ions into one of the ion mirrors 2.