After performing an analysis on a standard sample for a predetermined time, a plurality of ion optical elements such as an ion guide are sequentially selected one by one, and a direct-current voltage having a polarity different from that at the time of analysis is temporarily applied. Meanwhile, intensity data of ions having a specific m/z are continuously collected. After thus collecting the data, the ratio of the ion intensities before and after application of direct-current voltages having different polarities is calculated for each ion optical element, and it is determined whether or not the ratio is equal to or larger than a predetermined threshold value.

An electrostatic linear ion trap (ELIT) array includes multiple elongated charge detection cylinders arranged end-to-end and each defining an axial passageway extending centrally therethrough, a plurality of ion mirror structures each defining a pair of axially aligned cavities and an axial passageway extending centrally therethrough, wherein a different ion mirror structure is disposed between opposing ends of each cylinder, and front and rear ion mirrors each defining at least one cavity and an axial passageway extending centrally therethrough, the front ion mirror positioned at one end of the arrangement of charge detection cylinders and the rear ion mirror positioned at an opposite end of the arrangement of charge detection cylinders, wherein the axial passageways of the charge detection cylinders, the ion mirror structures, the front ion mirror and the rear ion mirror are coaxial to define a longitudinal axis passing centrally through the ELIT array. In a second aspect, an ELIT array comprises a plurality of non-coaxial ELIT regions, wherein ions are selectively guided into each of the ELIT regions.

A system for trapping ions for measurement thereof may include an electrostatic linear ion trap (ELIT), a source of ions to supply ions to the ELIT, a processor operatively coupled to ELIT, and a memory having instructions stored therein executable by the processor to produce at least one control signal to open the ELIT to allow ions supplied by the source of ions to enter the ELIT, determine an ion inlet frequency corresponding to a frequency of ions flowing from the source of ions into the open ELIT, generate or receive a target ion charge value, determine an optimum threshold value as a function of the target ion charge value and the determined ion inlet frequency, and produce at least one control signal to close the ELIT when a charge of an ion within the ELIT exceeds the optimum threshold value to thereby trap the ion in the ELIT.

Under the control of an analysis control unit (5), a mass spectrometer unit (2) performs a product-ion scan measurement for a target component in a target sample within a time range where the component is introduced. It also performs a scan measurement over an m/z range including the m/z of an ion originating from a standard component within the same segment of time. A mass correction information calculator (42) calculates mass correction information from measured and theoretical values of the m/z of the ion originating from the standard component observed on an MS spectrum obtained by the scan measurement. Using the mass correction information, a mass corrector (43) corrects the m/z of each ion peak originating from the target component observed on an MS/MS spectrum obtained by the product-ion scan measurement performed within the same cycle as the scan measurement concerned. It is possible to consider that the MS measurement and the MS/MS measurement within the same cycle have been almost simultaneously carried out. Accordingly, a mass correction which is almost equivalent to an internal standard method can be achieved.

After performing an analysis on a standard sample for a predetermined time, a plurality of ion optical elements such as an ion guide are sequentially selected one by one, and a direct-current voltage having a polarity different from that at the time of analysis is temporarily applied. Meanwhile, intensity data of ions having a specific m/z are continuously collected. After thus collecting the data, the ratio of the ion intensities before and after application of direct-current voltages having different polarities is calculated for each ion optical element, and it is determined whether or not the ratio is equal to or larger than a predetermined threshold value.

A quadrupole mass analyzer according to the present invention optimizes a stability band formation mode of a quadrupole system, so as to facilitate passing of ions and blocking of excessive ions, thereby improving the mass resolution without reducing the ion transmission efficiency. The solution of the present invention avoids the superimposition of high-frequency AC signals needed in the ion two-direction resonance frequency control in the prior art, and can effectively reduce the risk of quadrupole working performance reduction caused by the non-linear distortion of an RF voltage caused by bandwidth limitation in a fast RF circuit. In addition, a scanning speed of an ion-controlled electric field required by the quadrupole mass spectrometry can also be controlled faster because of reduction of limit bandwidth of various needed AC excitation signals. It is advantageous to obtain high-speed quadrupole scanning mass spectrometry performance.

Trapping ions in an ion trapping assembly is described. In one aspect, this is implemented by introducing ions into the ion trapping assembly, applying a first RF trapping amplitude to the ion trapping assembly so as to trap introduced ions which have m/z ratios within a first range of m/z ratios, and cooling the trapped ions. In some aspects, also performed is reducing the RF trapping amplitude from the first RF trapping amplitude to a second, lower, RF trapping amplitude so as to reduce the low mass cut-off of the ion trapping assembly and trapping, at the second, lower RF trapping amplitude, introduced ions having m/z ratios within a second range of m/z ratios. A lower mass limit of the second range of m/z ratios is below the low mass cut-off of the ion trapping assembly when the first RF trapping amplitude is applied.

Neutral particles are blocked by a deflector provided upstream of a detector. A controller changes a reference potential V2 of the deflector in connection with a change of a reference potential V1 of a collision cell such that a potential difference V between the reference potential V1 and the reference potential V2 is constant. The change of the reference potential V2 is executed during a period in which an ion pulse does not pass the deflector.

A method of time-of-flight mass spectrometry is disclosed comprising: providing two ion mirrors (42) that are spaced apart in a first dimension (X-dimension) and that are each elongated in a second dimension (Z-dimension) orthogonal to the first dimension; introducing packets of ions (47) into the space between the mirrors using an ion introduction mechanism (43) such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors (42) as they drift through said space in the second dimension (Z-dimension); oscillating the ions in a third dimension (Y-dimension) orthogonal to both the first and second dimensions as the ions drift through said space in the second dimension (Z-dimension); and receiving the ions in or on an ion receiving mechanism (44) after the ions have oscillated multiple times in the first dimension (X-dimension); wherein at least part of the ion introduction mechanism (43) and/or at least part of the ion receiving mechanism (44) is arranged between the mirrors (42).

A sample preparation apparatus for an elemental analysis system comprising a sample combustion and/or reduction and/or pyrolysis arrangement for receiving a sample of material to be analysed, and producing therefrom a sample gas flow containing atoms, molecules and/or compounds; a gas chromatography (GC) column into which the sample gas flow is directed; a heater for heating at least a part of the GC column; and a controller for controlling the heater. The controller is configured to control the heater so as to increase the temperature of at least the part of the GC column whilst the sample gas flow in the GC column elutes.