H01L29/1025

STATIC RANDOM ACCESS MEMORY (SRAM) DEVICE FOR IMPROVING ELECTRICAL CHARACTERISTICS AND LOGIC DEVICE INCLUDING THE SAME
20180190835 · 2018-07-05 ·

A static random access memory (SRAM) device includes a circuit element that includes a first inverter having a first load transistor and a first drive transistor and a second inverter having a second load transistor and a second drive transistor. Input and output nodes of the first inverter and the second inverter are cross-connected to each other. A first transfer transistor is connected to the output node of the first inverter, and a second transfer transistor is connected to the output nodes of the second inverter. Each of the first and second load transistors, the first and second drive transistors, and the first and second transfer transistors includes a transistor having multi-bridge channels. At least one of the first and second load transistors, the first and second drive transistors, and the first and second transfer transistors includes a transistor having a different number of multi-bridge channels from the other transistors.

Methods and systems for ultra-high quality gated hybrid devices and sensors

High electron mobility leads to better device performance and today is achieved by fabricating gated devices within a high-mobility two-dimensional electron gas (2DEG. However, the fabrication techniques used to form these devices lead to rapid degradation of the 2DEG quality which then can limits the mobility of the electronic devices. Accordingly, it would be beneficial to provide a process/technique which circumvents this processing and 2DEG layer damage. By exploiting a flip-chip methodology such damaging processing steps are separated to a second die/wafer which is then coupled to the 2DEG wafer. Extensions of the technique with two or more different semiconductor materials or material systems may be employed in conjunction with one or more electronic circuits to provide 2DEG enabled circuits in 2D and/or 3D stacked configurations. Further semiconductor materials providing EG elements may incorporate one or more of 2DEG, 1DEG, and zero DEG structures.

TREATMENT AND DIAGNOSTIC USING miRNA, PROTEIN AND GENE BIOMARKERS USING QUANTUM DOT FIELD-EFFECT TRANSISTOR (FET) SENSOR PLATFORM
20180120254 · 2018-05-03 ·

An array of biosensors diagnosing biomarkers device and a drug delivery vehicle system including a plurality of biosensor arrays for diagnosing biomarkers concentrations, and a delivery vehicle dispensing drug, a electronic interface, a plurality of algorithms to relate biomarker concentrations and drug dispensed, wherein biosensors in said plurality of biosensor arrays are constructed from quantum dot field-effect transistors, and wherein one or more layers of cladded quantum dots are assembled in the channel, gate, and channel and gate regions of FETs, and wherein quantum dots are functionalized by DNA aptamers, antisense oligoneuclotides (ASOs), and DNAs, to sense biomarkers concentrations comprising at least one of proteins, miRNAs, and genes, and wherein the concentrations of biomarkers changes and their values change the magnitude of drain current as a function of time, and wherein the drain current signal is processed by an electronic interface.

Fin-based field effect transistors

The present disclosure describes a semiconductor structure that includes a substrate from an undoped semiconductor material and a fin disposed on the substrate. The fin includes a non-polar top surface and two opposing first and second polar sidewall surfaces. The semiconductor structure further includes a polarization layer on the first polar sidewall surface, a doped semiconductor layer on the polarization layer, a dielectric layer on the doped semiconductor layer and on the second polar sidewall surface, and a gate electrode layer on the dielectric layer and the first polarized sidewall surface.

Static random access memory (SRAM) device for improving electrical characteristics and logic device including the same

A static random access memory (SRAM) device includes a circuit element that includes a first inverter having a first load transistor and a first drive transistor and a second inverter having a second load transistor and a second drive transistor. Input and output nodes of the first inverter and the second inverter are cross-connected to each other. A first transfer transistor is connected to the output node of the first inverter, and a second transfer transistor is connected to the output nodes of the second inverter. Each of the first and second load transistors, the first and second drive transistors, and the first and second transfer transistors includes a transistor having multi-bridge channels. At least one of the first and second load transistors, the first and second drive transistors, and the first and second transfer transistors includes a transistor having a different number of multi-bridge channels from the other transistors.