H01L2924/1304

Integrated fan-out package, semiconductor device, and method of fabricating the same

A semiconductor device including an integrated circuit, a protection layer, and a conductive via is provided. The integrated circuit includes at least one conductive pad. The protection layer covers the integrated circuit. The protection layer includes a contact opening, and the conductive pad is exposed by the contact opening of the protection layer. The conductive via is embedded in the contact opening of the protection layer, and the conductive via is electrically connected to the conductive pad through the contact opening. A method of fabricating the above-mentioned semiconductor device and an integrated fan-out package including the above-mentioned semiconductor device are also provided.

Integrated fan-out package, semiconductor device, and method of fabricating the same

A semiconductor device including an integrated circuit, a protection layer, and a conductive via is provided. The integrated circuit includes at least one conductive pad. The protection layer covers the integrated circuit. The protection layer includes a contact opening, and the conductive pad is exposed by the contact opening of the protection layer. The conductive via is embedded in the contact opening of the protection layer, and the conductive via is electrically connected to the conductive pad through the contact opening. A method of fabricating the above-mentioned semiconductor device and an integrated fan-out package including the above-mentioned semiconductor device are also provided.

Display Device
20170317153 · 2017-11-02 ·

A display device includes: a display substrate having an active area, which includes a pixel array, and a peripheral area around the active area; a driving chip on the display substrate; and a conductive combination member connecting the display substrate to the driving chip, wherein the display substrate includes: a first signal line in the peripheral area to transfer a driving signal from the driving chip to the active area, the first signal line including a first connection pad; a second connection pad at a different layer from the first connection pad and overlapping at least a portion of the first signal line; and a contact member contacting the first connection pad, the second connection pad, and the conductive combination member.

Display Device
20170317153 · 2017-11-02 ·

A display device includes: a display substrate having an active area, which includes a pixel array, and a peripheral area around the active area; a driving chip on the display substrate; and a conductive combination member connecting the display substrate to the driving chip, wherein the display substrate includes: a first signal line in the peripheral area to transfer a driving signal from the driving chip to the active area, the first signal line including a first connection pad; a second connection pad at a different layer from the first connection pad and overlapping at least a portion of the first signal line; and a contact member contacting the first connection pad, the second connection pad, and the conductive combination member.

POWER MODULE PACKAGE HAVING PATTERNED INSULATION METAL SUBSTRATE

A packaging structure is provided, including a substrate, a first chip, a second chip, and a conductive unit. The substrate includes a metal carrier, a patterned insulation layer disposed on the metal carrier and partially covering the metal carrier, and a patterned conductive layer disposed on the patterned insulation layer. The first chip is disposed on the metal carrier not covered by the patterned insulation layer. The second chip is disposed on the patterned conductive layer and electrically connected to the first chip by the conductive unit.

POWER MODULE PACKAGE HAVING PATTERNED INSULATION METAL SUBSTRATE

A packaging structure is provided, including a substrate, a first chip, a second chip, and a conductive unit. The substrate includes a metal carrier, a patterned insulation layer disposed on the metal carrier and partially covering the metal carrier, and a patterned conductive layer disposed on the patterned insulation layer. The first chip is disposed on the metal carrier not covered by the patterned insulation layer. The second chip is disposed on the patterned conductive layer and electrically connected to the first chip by the conductive unit.

Ultra-thin embedded semiconductor device package and method of manufacturing thereof

A package structure includes a first dielectric layer, semiconductor device(s) attached to the first dielectric layer, and an embedding material applied to the first dielectric layer so as to embed the semiconductor device therein, the embedding material comprising one or more additional dielectric layers. Vias are formed through the first dielectric layer to the at least one semiconductor device, with metal interconnects formed in the vias to form electrical interconnections to the semiconductor device. Input/output (I/O) connections are located on one end of the package structure on one or more outward facing surfaces thereof to provide a second level connection to an external circuit. The package structure interfits with a connector on the external circuit to mount the package perpendicular to the external circuit, with the I/O connections being electrically connected to the connector to form the second level connection to the external circuit.

SEMICONDUCTOR DEVICE

A semiconductor device includes a lead frame; a circuit board located on the lead frame; a power device that includes a switching element and is mounted on the circuit board via a bump located between the power device and the circuit board; and a heat releasing member connected to the power device. The circuit board may be a multi-layer wiring board. The circuit board may include a capacitor element, a resistor element, an inductor element, a diode element and a switching element.

Semiconductor Device and Method of Manufacture
20170338207 · 2017-11-23 ·

A semiconductor device and a method of manufacture are provided. In particular, a semiconductor device includes a first set of through vias between and connecting a top package and a redistribution layer (RDL), the first set of through vias in physical contact with a molding compound and separated from a die. The semiconductor device also includes a first interconnect structure between and connecting the top package and the RDL, the first interconnect structure separated from the die and from the first set of through vias by the molding compound. The first interconnect structure includes a second set of through vias and at least one integrated passive device.

Semiconductor Device and Method of Manufacture
20170338207 · 2017-11-23 ·

A semiconductor device and a method of manufacture are provided. In particular, a semiconductor device includes a first set of through vias between and connecting a top package and a redistribution layer (RDL), the first set of through vias in physical contact with a molding compound and separated from a die. The semiconductor device also includes a first interconnect structure between and connecting the top package and the RDL, the first interconnect structure separated from the die and from the first set of through vias by the molding compound. The first interconnect structure includes a second set of through vias and at least one integrated passive device.