The present invention aims to provide a technique for improving a non-defective product rate. One of typical reflectarrays of the present invention is a reflectarray including at least a layer of element patterns, a dielectric layer, and a ground layer laminated in this order, wherein the reflectarray includes at least one reflection control areal; the reflection control area includes at least two unit cells; one element pattern is arranged on each unit cell; the element pattern includes a cross-patch in which two rectangular patches are orthogonal to each other in an xy plane; and in the reflection control area, a first element width wx which is a width of the element pattern in an x axis direction or/and a second element width wy which is a width of the element pattern in a y axis direction is/are different between the element patterns arranged in the respective at least two unit cells.