An electrical connector includes an insulating body provided with a accommodating hole, and a terminal and an electrical conductor accommodated in the accommodating hole and separately provided. The terminal includes a base provided in the corresponding accommodating hole, and two elastic arms respectively formed by bending and extending from the base. Each elastic arm extends to form a contact portion. Each contact portion extends to form an extending arm. Each extending arm has a first side edge, a second side edge and an end edge. Each first side edge has an abutting portion for abutting the corresponding electrical conductor. Each first side edge has a first guide portion extending between a corresponding contact portion and a corresponding abutting portion, and a second guide portion extending between the corresponding abutting portion and a corresponding end edge.

An electrical contact for connecting a chip module to a print circuit board, the electrical contact comprises a main body, an upper elastic arm and a lower mounting arm extending upwardly from the main body, and a lower elastic arm and a lower mounting arm extending downwardly from the main body. The upper mounting arm is disposed at the downside of the upper elastic arm and forms a space therebetween; the lower mounting arm is disposed at the downside of the lower elastic arm and forms a space therebetween. The upper elastic arm and the lower elastic arm are respectively deformed by the chip module and print circuit board to resist to the upper mounting arm and lower mounting arm, thereby shortening the current path between the chip module and the print circuit board for improving the high frequency performance of an electrical connector.

A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).

A low profile interposer with multiple electrical contacts held in a housing. Each electrical contact is disposed within a respective opening of the housing. The electrical contact includes a base, a first beam extending from the base to a distal end of the first beam, a second beam extending from the base to a distal end of the second beam. When the electrical contact is in an uncompressed state, a first portion of the distal end of the first beam and a first portion of the distal end of the second beam are positioned between the top surface and the bottom surface; and a second portion of the distal end of the first beam extends above the top surface and a second portion of the distal end of the second beam extends below the bottom surface.

An electrical connector includes: a first terminal with one end having a first contact and a second terminal with one end having a second contact. The first contact is located in a first accommodating hole, and a first distance exists between the first contact and an inner wall of the first accommodating hole. A width of the second contact is greater than a width of the first contact. The second contact is located in a second accommodating hole, and a second distance exists between the second contact and the inner wall of the second accommodating hole. A width of the first accommodating hole at the first contact is equal to a width of the second accommodating hole at the second contact, and the first distance is greater than the second distance.

An electrical connector for connecting an electronic package to a printed circuit board, includes an insulative housing with a plurality of passageways therein, and a plurality of contacts are retained in the corresponding passageways, respectively. Each contact has a main body and opposite upper and lower contacting arms extending therefrom in a symmetrical manner in the vertical direction. Each of the upper contacting arm and the lower contacting arm has a pair of spring beams spaced from each other. Each beam includes an extension section directly extending from and coplanar with the main body, an oblique section extending from the extension section and a contacting section extending from the oblique section. The distance between the oblique sections of the pair of beams is essentially same with that of the extension sections thereof, while larger than that of the contacting sections thereof.

An electrical connector, used for electrically connecting a chip module to a circuit board, includes: an insulating body, provided with multiple accommodating grooves penetrating through the insulating body; and multiple conductive terminals, correspondingly accommodated in the accommodating grooves. Each conductive terminal includes a first terminal and a second terminal independently provided. The first terminal has a first connecting portion and an elastic arm, and the elastic arm has a contact portion to be in contact with the chip module. The second terminal has a second connecting portion and a conducting portion to be electrically connected with the circuit board. At least one fixing groove is provided on at least one of the first connecting portion and the second connecting portion, and the first terminal and the second terminal are mated and fixed along a vertical direction by the at least one fixing groove.

It is herein described a contact probe of a testing head of an apparatus for testing electronic devices comprising a probe body being essentially extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body and comprising an enlarged portion, projecting only in correspondence of a first side wall of the contact probe. Suitably, the at least one end portion further comprises at least one protrusion projecting from a second side wall, opposite to the first side wall and substantially extending toward the second and opposite wall along a longitudinal axis of the contact probe starting from the enlarged portion.

A systems for creating an electrical connection between two substrates is disclosed herein in various embodiments. In one embodiment, the system may include an upper substrate, a lower substrate, and a dielectric plate. As disclosed herein, the dielectric plate may have one or more passages with a first end wall and a second end wall. One or more contacts may be inserted in to the one or more passages. The one or more contacts may have an upper portion with a dome protrusion and a lower portion with a dome protrusion. When the one or more contracts is inserted into the one or more passages, and the upper and lower substrates are put into place, the contracts compress and create an electrical path. Moreover, various other embodiments may be further disclosed herein.

A PCB direct connector is directly mounted to a circuit board, and the PCB direct connector includes terminal members arranged in two rows to respectively contact upper conductive patterns and lower conductive patterns provided to an upper surface and a lower surface of the circuit board, and a connector housing configured to accommodate the terminal members therein and allow a connector connection portion formed at one side of an end of the circuit board to be fitted into and released from the connector housing.