A bonded substrate includes a quartz substrate and a piezoelectric substrate which is bonded on the quartz substrate and on which a surface acoustic wave propagates, wherein the quartz substrate and the piezoelectric substrate are bonded by covalently coupling at a bonding interface, and an orientation of the quartz substrate and an orientation of the piezoelectric substrate intersect with each other on an orthogonal direction side or in the range of 65 degrees to 115 degrees in a bonding surface direction.

An acoustic wave sensor device comprises a quartz material layer comprising a planar surface, a first interdigitated transducer formed over the planar surface of the quartz material layer, a first reflection structure formed over the planar surface of the quartz material layer, a second reflection structure formed over the planar surface of the quartz material layer, a first resonance cavity formed between the first interdigitated transducer and the first reflection structure and a second resonance cavity formed between the first interdigitated transducer and the second reflection structure. The planar surface of the quartz material layer is defined by a crystal cut of a quartz material of the quartz material layer with angles φ in the range of −14° to −24°, θ in the range of −25° to −45° and ψ in the range of +8° to +28°.

The present disclosure provides a high frequency surface acoustic wave resonator and a method for making the same. The high frequency surface acoustic wave resonator includes: a high wave velocity supporting substrate, a piezoelectric film disposed on a top surface of the high wave velocity supporting substrate, and a top electrode disposed on a top surface of the piezoelectric film; a velocity of a body wave propagating in the high wave velocity supporting substrate is greater than a velocity of a target elastic wave propagating in the piezoelectric film. The conductivity of the high wave velocity supporting substrate is greater than 1E3 Ω.Math.cm. The high frequency surface acoustic wave resonator and the method for making the same of the present disclosure solve the problem that the operating frequency of the traditional surface acoustic wave resonator is low.

In a surface acoustic wave resonator according to an embodiment, a quartz-crystal substrate includes an AT-cut 0° X-propagation first quartz-crystal substrate and a Z-cut second quartz-crystal substrate bonded over the first quartz-crystal substrate. A propagation direction of a surface acoustic wave in the second quartz-crystal substrate is inclined from an X-axis of a crystal by 27 to 33°, 87 to 93°, or 147 to 153°, and a thickness of the second quartz-crystal substrate is 0.2 to 1.0 times a wavelength of the surface acoustic wave.

A method of manufacturing a surface acoustic wave resonator includes forming or providing a support substrate layer, forming or providing piezoelectric layer of lithium niobate over the support substrate layer, and forming or providing an interdigital transducer electrode including a plurality of fingers over the piezoelectric layer. The piezoelectric layer formed or provided having a cut angle (e.g., the piezoelectric angle is cut so as to have a crystal orientation) that allows the surface acoustic wave device to operate as a longitudinally leaky surface acoustic wave device that confines the acoustic wave energy within the piezoelectric substrate and that has less propagation attenuation and a higher electromechanical coupling coefficient k.sup.2.

A surface acoustic wave device includes a quartz layer, a piezoelectric layer, and an Inter Digital Transducer. A rotation in a right-screw direction is assumed as a +-rotation. A three-dimensional coordinate system formed by an x1-axis, a y1-axis, and a z1-axis respectively matching an X-axis, a Y-axis, and a Z-axis as crystallographic axes of a quartz-crystal is rotated from +125.25° in a range of ±3° with the x1-axis as a rotation axis. Subsequently, the three-dimensional coordinate system is rotated from +45° in a range of ±2° with the z1-axis as the rotation axis. Subsequently, the three-dimensional coordinate system is rotated from −45° in a range of ±2° with the x1-axis as the rotation axis. The quartz layer is cut along a surface as a sectional plane perpendicular to the z1-axis. The quartz layer has a propagation direction of the surface acoustic wave in a direction parallel to the x1-axis.

A surface acoustic wave device includes a quartz layer, an amorphous silicon oxide layer, a piezoelectric layer, and an Inter Digital Transducer. The amorphous silicon oxide layer is laminated on the quartz layer. The piezoelectric layer is laminated on the amorphous silicon oxide layer. The Inter Digital Transducer is formed on the piezoelectric layer. The Inter Digital Transducer excites a surface acoustic wave on the piezoelectric layer. Assuming that the surface acoustic wave has a wavelength λ, 0.1≤a thickness of the amorphous silicon oxide layer/λ≤1, and 0.08<a thickness of the piezoelectric layer/λ≤1.

A composite substrate includes a supporting substrate composed of quartz, a piezoelectric material substrate, a first amorphous layer present between the supporting substrate and piezoelectric material substrate, and a second amorphous layer present between the supporting substrate and first amorphous layer. The first amorphous layer contains 10 to 30 atom % of silicon atoms, and the second amorphous layer contains 1 to 10 atom % of fluorine atoms.

A composite substrate includes a supporting substrate composed of quartz, a piezoelectric material substrate composed of a material selected from the group consisting of lithium niobate, lithium tantalate and lithium niobate-lithium tantalate; and an interface layer along a bonding interface between the supporting substrate and the piezoelectric material substrate. The interface layer has amorphous structure and contains constituent components including silicon, oxygen and at least one of tantalum and niobium. The interface layer has concentrations of hydrogen atoms, nitrogen atoms and fluorine atoms of 1×10.sup.18 atoms/cm.sup.3 or higher and 5×10.sup.21 atoms/cm.sup.3 or lower, respectively.

Guided Surface Acoustic Wave (SAW) devices with improved quartz orientations are disclosed. A guided SAW device includes a quartz carrier substrate, a piezoelectric layer on a surface of the quartz carrier substrate, and at least one interdigitated transducer on a surface of the piezoelectric layer opposite the quartz carrier substrate. The quartz carrier substrate includes an orientation that provides improved performance parameters for the SAW device, including electromechanical coupling factor, resonator quality factor, temperature coefficient of frequency, and delta temperature coefficient of frequency.