An error sampler circuit includes a differential input voltage input, a differential reference voltage input, a master latch circuit, and a slave latch circuit. The master latch circuit includes a slicer circuit. The slicer circuit includes a first input, a second input, and a differential output. The first input is coupled to the differential input voltage input. The second input is coupled to the differential reference voltage input. The slave latch includes a differential input coupled to the differential output of the slicer circuit.

A flip-flop circuit includes first and second latches. The first latch comprises a first inverting logic element and a second inverting logic element. The first inverting logic element has a first logic threshold voltage. The second inverting logic element is connected in antiparallel to the first inverting logic element and has a second logic threshold voltage. The first and second logic threshold voltages are set with respect to one half of a power supply voltage. The second latch comprises a third inverting logic element and a fourth inverting logic element. The third inverting logic element is connected to the first latch and has a third logic threshold voltage. The fourth inverting logic element is connected in antiparallel to the third inverting logic element and has a fourth logic threshold voltage. The third and fourth logic threshold voltages are set with respect to one half of the power supply voltage.

In a method computer storage element operation, first and second rising (or falling) clock edges are applied to first and second power inputs of the computer storage element having a transistor array between the first and second power inputs over time T1 whereupon a logic value applied to an input of the transistor array is stored therein. Thereafter, first and second falling (or rising) clock edges are applied to the first and second power inputs over time T2, whereupon part of an electrical charge or energy associated with the logic value stored in the transistor array is provided to circuitry that generates the first and/or second clock edge(s), wherein the value(s) of time T1 and/or time T2 is/are greater than a product of RC, where R is resistance associated with the computer storage element, and C is a load capacitance associated with the computer storage element.

Spiking neuron circuits and methods are provided in this disclosure. A spiking neuron may include a triggerable and frequency-controllable oscillator that is configured to generate an oscillator signal. The spiking neuron may further include a spike signal detector that is configured to generate spike detection signals in response to detection of input spike signals. The spike signal detector may generate the spike detection signals based on the oscillator signal. The spiking neuron may further include a neuron structure that is configured to provide an output spike signal based on the spike detection signals and the oscillator signal.

A flip-flop includes an input switching circuit configured to output an intermediate signal based on an input signal and at least one of a phase of a clock signal or a phase of an inverted clock signal, the phase of the inverted clock signal being opposite to the phase of the clock signal, and block application of a driving voltage to at least one circuit element of the input switching circuit in response to receiving a reset signal representing a reset operation of the flip-flop, and a latch circuit configured to generate an output signal based on the intermediate signal according to the at least one of the phase of the clock signal or the phase of the inverted clock signal.

An error sampler circuit includes a differential input voltage input, a differential reference voltage input, a master latch circuit, and a slave latch circuit. The master latch circuit includes a slicer circuit. The slicer circuit includes a first input, a second input, and a differential output. The first input is coupled to the differential input voltage input. The second input is coupled to the differential reference voltage input. The slave latch includes a differential input coupled to the differential output of the slicer circuit.

A flip-flop circuit includes first and second latches. The first latch comprises a first inverting logic element and a second inverting logic element. The first inverting logic element has a first logic threshold voltage. The second inverting logic element is connected in antiparallel to the first inverting logic element and has a second logic threshold voltage. The first and second logic threshold voltages are set with respect to one half of a power supply voltage. The second latch comprises a third inverting logic element and a fourth inverting logic element. The third inverting logic element is connected to the first latch and has a third logic threshold voltage. The fourth inverting logic element is connected in antiparallel to the third inverting logic element and has a fourth logic threshold voltage. The third and fourth logic threshold voltages are set with respect to one half of the power supply voltage.

A filp-flop circuit includes master latch including a first inverter and a first tri-state inverter, wherein the first tri-state inverter includes a first NMOS transistor and a first PMOS transistor; a slave latch including a second inverter and a second tri-state inverter, wherein the second tri-state inverter includes a second PMOS transistor and a second NMOS transistor; and at least one of a first wiring configured to connect a source of the first PMOS transistor and a source of the first NMOS transistor and a second wiring configured to connect a source of the second PMOS transistor and a source of the second NMOS transistor.

A flip-flop includes a first master latch in a first row, a second master latch in a second row, a first slave latch in the first row, and a second slave latch in the second row. The first master latch and the second master latch are adjacently disposed in the second direction, and the first slave latch and the second slave latch are adjacently disposed in the second direction.

A semiconductor device and a method of operating a semiconductor device are provided. The semiconductor device includes a first latching circuit and a second latching circuit coupled to the first latching circuit. The second latching circuit includes a first feedback circuit and a first transmission circuit, the first feedback circuit configured to receive a first clock signal of a first phase and a second clock signal of a second phase, and the first transmission circuit configured to receive the second clock signal and a third clock signal of a third phase. The first feedback circuit is configured to be turned off by the first clock signal and the second clock signal before the first transmission circuit is turned on by the second clock signal and the third clock signal.