Exemplary embodiments provide a sensing amplifier based flip-flop applying a nonvolatile memory device which is applicable to a mobile device which has a small hardware area, uses a small control signal, does not include a separate write circuit, has low writing power consumption, a short reading time and small power consumption, and requires a low power operation.

This invention is a retention circuit retaining the state of a circuit node driven by a primary drive circuit. This circuit includes cross coupled first and second inverters and a transmission gate. The transmission gate receives a retention mode signal and isolates the retention circuit and the circuit node when a retention mode is active and connects the retention circuit and the circuit node when the retention mode is inactive. In the preferred embodiment the primary drive circuit is constructed of transistors having a standard voltage threshold and the retention circuit is constructed of transistors having a high voltage threshold greater than said standard voltage threshold. A tristate inverter isolates the retention circuit from the circuit node when not in retention mode and supplies an inverse of a signal from output of said first inverter when in retention mode.

A flip-flop includes an input switching circuit configured to output an intermediate signal based on an input signal and at least one of a phase of a clock signal or a phase of an inverted clock signal, the phase of the inverted clock signal being opposite to the phase of the clock signal, and block application of a driving voltage to at least one circuit element of the input switching circuit in response to receiving a reset signal representing a reset operation of the flip-flop, and a latch circuit configured to generate an output signal based on the intermediate signal according to the at least one of the phase of the clock signal or the phase of the inverted clock signal.

Embodiments include apparatuses, methods, and systems for a flip-flop circuit with low-leakage transistors. The flip-flop circuit may be coupled to a logic circuit of an integrated circuit to store data for the logic circuit when the logic circuit is in a sleep state. The flip-flop circuit may pass a data signal for the logic circuit along a signal path. A capacitor may be coupled between the signal path and ground to store a value of the data signal when the logic circuit is in the sleep state. A low-leakage transistor, such as an IGZO transistor, may be coupled between the capacitor and the signal path and may selectively turn on when the logic circuit transitions from the active state to the sleep state to store the value of the data signal in the capacitor. Other embodiments may be described and claimed.

Two retention flip-flop topologies that utilize a data retention control circuit and a slave/retention latch (sub-circuit) to reliably retain a data bit during standby/sleep operating modes without the need for a local clock signal. The slave/retention latch is controlled using a local clock signal to store sequentially received data bit values during normal operating modes. During standby/sleep modes, the local clock signal is de-activated (i.e., by turning off the supply voltage provided to the local clock generator circuit), and the data retention control circuit operates in accordance with an externally supplied retention enable control signal to both isolate and control the slave/retention latch such that a last-received data bit value is reliably retained in the slave/retention latch. When normal operation is resumed, the local clock signal is re-activated, and the data retention control circuit controls the slave/retention latch to pass the last-received data bit value to an output driver.

A switch control device includes a retention circuit configured to generate a trigger signal based on a fault signal indicating whether a fault indicated by a power signal occurred, generate a reset signal based on the trigger signal, store a present value of a driving signal at a time during a duration of an active edge of the trigger signal, and output the stored driving signal as a retention signal during a time duration of the reset signal; and a driving circuit configured to generate a switch control signal based on the retention signal and the driving signal, and output the switch control signal to a switch.

A semiconductor device that suppresses operation delay due to stop and restart of the supply of a power supply potential is provided. A potential corresponding to data held while power supply potential is continuously supplied is backed up in a node connected to a capacitor while the supply of the power supply potential is stopped. Then, by utilizing change in resistance of a channel in a transistor whose gate is the node, the data is restored with restart of the supply of the power supply potential. Note that by supplying a high potential to the node before the data back up, high-speed and accurate data back up is possible.

A non-volatile flip flop integrated circuit includes a master latch circuit, a slave latch circuit coupled to the master latch circuit, and a non-volatile memory array coupled to the slave latch circuit. The non-volatile memory array includes a first pair of memory cells coupled to the slave latch circuit, and a second pair of memory cells coupled to the slave latch circuit in parallel with the first pair of memory cells. The first and second pair of memory cells are configured to store data from the slave latch circuit, and to restore data to the slave latch circuit.

A system-on-chip (SoC) includes a logic circuit having a scan flip-flop and a an on-chip clock controller. The scan flip-flop is configured to store data using a passive keeper. The on-chip clock controller is configured to receive a reference clock for driving the logic circuit, to generate an internal clock based on a high-state interval of the reference clock, and to provide the internal clock to the scan flip-flop.

A non-volatile flip flop integrated circuit includes a master latch circuit, a slave latch circuit coupled to the master latch circuit, and a non-volatile memory array coupled to the slave latch circuit. The non-volatile memory array includes a first pair of memory cells coupled to the slave latch circuit, and a second pair of memory cells coupled to the slave latch circuit in parallel with the first pair of memory cells. The first and second pair of memory cells are configured to store data from the slave latch circuit, and to restore data to the slave latch circuit.