Patent classifications
H03K3/3562
Register circuitry with asynchronous system reset
Integrated circuits having flip-flops with asynchronous reset capabilities are provided. The flip-flops may be single event upset (SEU) hardened registers implemented using dual-interlocked cell (DICE) latch circuits. A logic gate may be inserted at the data input of each flip-flop. A multiplexer may be inserted at the input of the clock tree that is being used to feed clock signals to each of the flip-flops. Both the logic gate and the multiplexer may receive an asynchronous reset signal. The multiplexer may also receive a normal clock signal and a delayed clock pulse signal that is triggered in response to detecting assertion of the reset signal.
TRI-STATE INVERTER, D LATCH AND MASTER-SLAVE FLIP-FLOP COMPRISING TFETS
Tri-state inverter comprising: a n-TFET and a p-TFET, the drain of the n-TFET being connected to the drain of the p-TFET and to an output of the tri-state inverter, the gates of the n-TFET and p-TFET being connected to an input of the tri-state inverter; a control circuit able to apply a first control voltage on the source of the n-TFET and a second control voltage on the source of the p-TFET, the values of the first and second control voltages being positive or zero; and wherein, when the tri-state inverter is intended to work as an inverter, the value of the first control voltage is lower than the value of the second control voltage, and when the tri-state inverter is intended to be tri-stated, the value of the first control voltage is higher than the value of the second control voltage.
FLIP FLOP USING DUAL INVERTER FEEDBACK
Embodiments of the present disclosure relate to a flip flop circuit that obviates the need of a transmission gate. The flip flop includes a first match multiplexer, a second match multiplexer and a separable inverter. The first match multiplexer receives an input data signal and generates a feedback output based on the input data signal and the logic levels at two nodes coupled to the first match multiplexer. The separable inverter receives the feedback output and switches the logic level of one of two nodes but maintains the logic level per each clock cycle. The second match multiplexer generates a signal output based on the logic levels at the two nodes and the signal output that is fed back into the second match multiplexer. Embodiments may reduce power consumption and operate at lower voltages.
Flip-Flop Circuit with Glitch Protection
A flip-flop with glitch protection is disclosed. The flip-flop includes a differential amplifier circuit that generates amplifier output signals based on an input data and clock signals and precharges a true data node when a clock signal is inactive. A latch circuit is coupled to the differential amplifier and includes a latch node. Responsive to a current value of the input data signal having a first logic state, the latch node is set at a logic value equivalent to the precharged value during an active phase of the clock signal. Responsive to the current value of the input data signal having a second logic state complementary to the first, during the active phase of the clock signal, the latch circuit causes the latch node to be set to a logic value complementary to the precharged value, using the clock signal and the current value of the input data signal.
HIGH-SPEED FLIP FLOP CIRCUIT INCLUDING DELAY CIRCUIT
A flip flop includes a master latch and a slave latch. The master latch includes a delay circuit configured to receive a clock signal and generate a first internal signal, and is configured to generate an internal output signal by latching a data signal based on the first internal signal. The slave latch is configured to generate a final signal by latching the internal output signal. The delay circuit is further configured to generate the first internal signal by delaying the clock signal by a delay time when the clock signal has a first logic level and generate the first internal signal based on the data signal when the clock signal has a second logic level.
Semiconductor device
Disclosed is a semiconductor device including a substrate with first and second regions adjacent to each other in a first direction, and first to third gate electrodes extending from the first region toward the second region. Each of the first and second regions includes a PMOSFET region and an NMOSFET region. The first to third gate electrodes extend in the first direction and are sequentially arranged in a second direction different from the first direction. The first and third gate electrodes are supplied with a first signal. The second gate electrode is supplied with a second signal that is an inverted signal of the first signal. The first gate electrode includes a first gate of the first region and a first gate of the second region. The first gates are aligned and connected with each other in the first direction.
SEMICONDUCTOR DEVICE
A semiconductor device according to an aspect of the present disclosure includes: a plurality of line layers; a first line; and a second line that is not connected to the first line and is redundantly provided to transfer a signal having a level same as a level of a signal transferred through the first line. The first line and the second line are included in different layers out of the plurality of line layers, and a distance between the first line and the second line is longer than an interlayer distance between line layers next to each other out of the plurality of line layers.
SEMICONDUCTOR DEVICE
A semiconductor device includes: a first line; a second line that is not connected to the first line and is provided to transfer a signal having a level same as a level of a signal transferred through the first line; and another line different from the first line and the second line. In a line layer, a distance between the first line and the second line is longer than a distance between the first line and the other line, and is longer than a distance between the second line and the other line.
FAULT RESILIENT FLIP-FLOP WITH BALANCED TOPOLOGY AND NEGATIVE FEEDBACK
The disclosure relates to a latch including a first inverter with a first pair of field effect transistors (FETs) configured with a first channel width to length ratio (W/L), and a second inverter with a second pair of FETs configured with a second W/L different than the first W/L. Another latch includes first and second inverters; a first negative feedback circuit including first and second FETs coupled between first and second voltage rails, the input of the first inverter coupled between the first and second FETs, and the first and second FETs including gates coupled to an output of the first inverter; and a second negative feedback circuit including third and fourth FETs coupled between the first and second voltage rails, the input of the second inverter coupled between the third and fourth FETs, and the third and fourth FETs including gates coupled to an output of the second inverter.
Pre-discharging based flip-flop with a negative setup time
A pre-discharging based flip-flop having a negative setup time can include a flip-flop with an inverted output QN. The flip-flop includes a master section and a slave section. The master section latches a data input or a scan input signal based on a scan enable signal, and the slave section retains a previous value of the inverted output QN when a clock signal is at a low logic level. The master section retains a previously latched value of the data input or the scan input signal and the slave section fetches the latched value of the master section and provides a new inverted output QN when the clock signal is at a high logic level. Further, the master section includes sub-sections that are operated using a negative clock signal. An output of the master section is discharged to zero for a half of a phase of the clock cycle.