A timer block includes: a digital control block including a mode selector and a register loading a time delay; a counter coupled to the register of the digital control block, wherein the counter loads a counter value corresponding to the time delay based on an operational mode selected by the mode selector and generates a digital output indicating the counter value that is decremented at each clock; and a pulse generator configured to generate a pulse signal based on the counter value of the counter. The timer block is integrated in a programmable logic device (PLD) including a programmable fabric and a signal wrapper that is configured to provide signals between the timer block and the programmable fabric. The operational mode of the timer block is programmably configured using the programmable fabric and the signal wrapper.

A timing adjustment method for a drive circuit, including: a rise detector for a rise start when a voltage-driven semiconductor element is turned off; a timing signal output unit outputting a speed change timing signal after a set delay time has elapsed from the rise start; and a conduction controller for a conduction control terminal of the semiconductor element using the timing signal, comprises: defining an estimated terminal voltage of the conduction control terminal when a rise completion time elapses; increasing a delay time by a predetermined unit time, and changing the drive signal to a turning off level again, when the conduction control terminal doesn't fall below the estimated terminal voltage after the drive signal is changed to a turning off level before the level is inverted; and determining a delay time, when the conduction control terminal falls below the estimated terminal voltage initially, as a set value.

A timer block includes: a digital control block including a mode selector and a register loading a time delay; a counter coupled to the register of the digital control block, wherein the counter loads a counter value corresponding to the time delay based on an operational mode selected by the mode selector and generates a digital output indicating the counter value that is decremented at each clock; and a pulse generator configured to generate a pulse signal based on the counter value of the counter. The timer block is integrated in a programmable logic device (PLD) including a programmable fabric and a signal wrapper that is configured to provide signals between the timer block and the programmable fabric. The operational mode of the timer block is programmably configured using the programmable fabric and the signal wrapper.

A clock mode configuration circuit for a memory device is described. A memory system includes any number of memory devices serially connected to each other, where each memory device receives a clock signal. The clock signal can be provided either in parallel to all the memory devices or serially from memory device to memory device through a common clock input. The clock mode configuration circuit in each memory device is set to a parallel mode for receiving the parallel clock signal, and to a serial mode for receiving a source synchronous clock signal from a prior memory device. Depending on the set operating mode, the data input circuits will be configured for the corresponding data signal format, and the corresponding clock input circuits will be either enabled or disabled. The parallel mode and the serial mode is set by sensing a voltage level of a reference voltage provided to each memory device.

A timer block includes: a digital control block including a mode selector and a register loading a time delay; a counter coupled to the register of the digital control block, wherein the counter loads a counter value corresponding to the time delay based on an operational mode selected by the mode selector and generates a digital output indicating the counter value that is decremented at each clock; and a pulse generator configured to generate a pulse signal based on the counter value of the counter. The timer block is integrated in a programmable logic device (PLD) including a programmable fabric and a signal wrapper that is configured to provide signals between the timer block and the programmable fabric. The operational mode of the timer block is programmably configured using the programmable fabric and the signal wrapper.

A clock mode configuration circuit for a memory device is described. A memory system includes any number of memory devices serially connected to each other, where each memory device receives a clock signal. The clock signal can be provided either in parallel to all the memory devices or serially from memory device to memory device through a common clock input. The clock mode configuration circuit in each memory device is set to a parallel mode for receiving the parallel clock signal, and to a serial mode for receiving a source synchronous clock signal from a prior memory device. Depending on the set operating mode, the data input circuits will be configured for the corresponding data signal format, and the corresponding clock input circuits will be either enabled or disabled. The parallel mode and the serial mode is set by sensing a voltage level of a reference voltage provided to each memory device.

A delay circuit includes: a plurality of delay units that are serially coupled with each other in a form of loop and sequentially delay an input signal of the delay circuit; an input control unit that selects a delay unit to receive the input signal of the delay circuit among the plurality of the delay units; and an output control unit that controls an output signal of a predetermined delay unit among the plurality of the delay units to be outputted as an output signal of the delay circuit, when the output signal of the predetermined delay unit is enabled N times, where N is an integer equal to or greater than 0.

A clock mode configuration circuit for a memory device is described. A memory system includes any number of memory devices serially connected to each other, where each memory device receives a clock signal. The clock signal can be provided either in parallel to all the memory devices or serially from memory device to memory device through a common clock input. The clock mode configuration circuit in each memory device is set to a parallel mode for receiving the parallel clock signal, and to a serial mode for receiving a source synchronous clock signal from a prior memory device. Depending on the set operating mode, the data input circuits will be configured for the corresponding data signal format, and the corresponding clock input circuits will be either enabled or disabled. The parallel mode and the serial mode is set by sensing a voltage level of a reference voltage provided to each memory device.

A clock mode configuration circuit for a memory device is described. A memory system includes any number of memory devices serially connected to each other, where each memory device receives a clock signal. The clock signal can be provided either in parallel to all the memory devices or serially from memory device to memory device through a common clock input. The clock mode configuration circuit in each memory device is set to a parallel mode for receiving the parallel clock signal, and to a serial mode for receiving a source synchronous clock signal from a prior memory device. Depending on the set operating mode, the data input circuits will be configured for the corresponding data signal format, and the corresponding clock input circuits will be either enabled or disabled. The parallel mode and the serial mode is set by sensing a voltage level of a reference voltage provided to each memory device.

A timing adjustment method for a drive circuit, including: a rise detector for a rise start when a voltage-driven semiconductor element is turned off; a timing signal output unit outputting a speed change timing signal after a set delay time has elapsed from the rise start; and a conduction controller for a conduction control terminal of the semiconductor element using the timing signal, comprises: defining an estimated terminal voltage of the conduction control terminal when a rise completion time elapses; increasing a delay time by a predetermined unit time, and changing the drive signal to a turning off level again, when the conduction control terminal doesn't fall below the estimated terminal voltage after the drive signal is changed to a turning off level before the level is inverted; and determining a delay time, when the conduction control terminal falls below the estimated terminal voltage initially, as a set value.