An electronic device includes a unit interval detector including a plurality of delay cells and that receives a first signal, a second signal, and a third signal and detects a code indicating a unit interval from the first signal, the second signal, and the third signal, a clock recovery circuit that generates a clock signal from the first signal, the second signal, and the third signal in response to the code, and a data recovery circuit that generates a first receive signal, a second receive signal, and a third receive signal from the first signal, the second signal, and the third signal in response to the code and the clock signal. A total delay amount of the delay cells is smaller than a length of the unit interval and the unit interval detector performs a multi-stage detection operation including coarse detection and fine detection by using the delay cells.

Performing a temperature measurement operation includes a first phase and a second phase. The first phase includes providing a voltage indicative of a measured temperature to a first input of a comparator, providing a ramp signal to a second input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. The second phase includes providing the voltage indicative of a measured temperature to the second input of the comparator, providing the ramp signal to the first input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. Performing the temperature measurement operation also includes utilizing the pulses generated during the first and second phases to provide a digital indication of the measured temperature.

The present invention provides a voltage monitoring apparatus capable of stable operation even in a low-voltage region.

The voltage monitoring apparatus (1) includes: an inner voltage generating portion (40), lowering an input voltage (VIN) to generate an inner voltage (Vreg); an input voltage monitoring portion (30), receiving a power supply from an output terminal of the inner voltage generating portion (40) to operate; a switch portion (50), disposed between an input terminal of the input voltage (VIN) and the output terminal of the inner voltage generating portion (40); and a switch driving portion (60), turning on the switch portion (50) when the input voltage (VIN) is lower than a threshold voltage (for example, Vy<Vref), and turning off the switch portion (50) when the input voltage (VIN) is higher than the threshold voltage (for example, Vy>Vref). Furthermore, the threshold voltage is preferably set as, for example, turning off the switch portion (50) upon the inner voltage generating portion (40) changing to a state capable of outputting the inner voltage (Vreg) that is at least higher than a minimum operating voltage of the input voltage monitoring portion (30).

A current limiter circuit for limiting current through a pass device is disclosed. The current limiter circuit includes a accurate/fast current limiter circuit, a coarse/slow current limiter control circuit and a pass device having an input port, an output port and an on/off control port. A control circuit couple to the accurate/fast current limiter circuit and the on/off control port is also included. The accurate/fast current limiter circuit is coupled to the input port and the output port and the coarse/slow current limiter control circuit is coupled to the input port and the output port and an on/off control port of the accurate/fast current limiter circuit.

A segment selectable signal conditioning circuit and a measurement device are provided. The circuit outputs respective voltage threshold signals through various voltage threshold sub-circuits. The voltage threshold signals are preset to have different threshold values. Each segment voltage conditioning sub-circuit conditions the input voltage signal according to the corresponding conduction signal to obtain a corresponding output voltage signal. The selection circuit receives the input voltage signal and each voltage threshold signal, and compares the voltage value of the input voltage signal to the threshold value of each voltage threshold signal respectively, and outputs the corresponding conduction signal based on the comparison result to achieve segment selectable voltage signal conditioning.

A signal conditioning circuit and a measurement device are provided. A selection circuit of the signal conditioning circuit outputs a first conduction signal when a voltage value of an input voltage signal is less than a threshold value of a voltage threshold signal, such that a first segmented voltage conditioning sub-circuit conditions, based on the received first conduction signal, the input voltage signal and outputs a first output voltage signal. The selection circuit outputs a second conduction signal when the voltage value of the input voltage signal is greater than the threshold value of the voltage threshold signal, such that the second segmented voltage conditioning sub-circuit conditions the input voltage signal and outputs a second output voltage signal.

Performing a temperature measurement operation includes a first phase and a second phase. The first phase includes providing a voltage indicative of a measured temperature to a first input of a comparator, providing a ramp signal to a second input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. The second phase includes providing the voltage indicative of a measured temperature to the second input of the comparator, providing the ramp signal to the first input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. Performing the temperature measurement operation also includes utilizing the pulses generated during the first and second phases to provide a digital indication of the measured temperature.

A semiconductor device includes an input determination circuit. The input determination circuit includes: a comparator that is driven based on a first reference potential and includes an input voltage terminal and a reference voltage terminal; a reference voltage generation circuit that inputs a reference voltage that is generated from a connection point between a constant current source and a resistor to the reference voltage terminal of the comparator, the constant current source and the resistor being interposed between a second reference potential that is separated from the first reference potential and a third potential that is higher than the first reference potential and the second reference potential; and a first low pass filter that is interposed between a signal input system that is connected to the input voltage terminal of the comparator and the second reference potential.

An adaptive clamp circuit includes a clamp circuit and a clamp control circuit. The clamp circuit includes a first transistor, a second transistor, and a variable resistor. The first transistor includes a first current terminal, a second current terminal, and a control terminal. The first current terminal is coupled to a switching terminal. The second current terminal is coupled to a ground terminal. The second transistor includes a first current terminal, a second current terminal, and a control terminal. The first current terminal of the second transistor is coupled to the control terminal of the first transistor. The second current terminal of the second transistor is coupled to the switching terminal. The variable resistor is coupled between the control terminal of the second transistor and the ground terminal. The clamp control circuit is coupled between the switching terminal and the variable resistor.

An adaptive clamp circuit includes a clamp circuit and a clamp control circuit. The clamp circuit includes a first transistor, a second transistor, and a variable resistor. The first transistor includes a first current terminal, a second current terminal, and a control terminal. The first current terminal is coupled to a switching terminal. The second current terminal is coupled to a ground terminal. The second transistor includes a first current terminal, a second current terminal, and a control terminal. The first current terminal of the second transistor is coupled to the control terminal of the first transistor. The second current terminal of the second transistor is coupled to the switching terminal. The variable resistor is coupled between the control terminal of the second transistor and the ground terminal. The clamp control circuit is coupled between the switching terminal and the variable resistor.