The present invention provides a multi-phase clock generating circuit and liquid crystal display panel, said circuit comprising: a shift register including N shift registration units, which are cascaded with each other; a first output terminal of nth shift registration units connected to a first input terminal of an (n+1)th shift registration unit; a thin film transistor set including N thin film transistors, said control terminals of said thin film transistors of a nth stage are respectively connected to said first output terminals of (Nn+1) shift registration units.

The present invention provides a multi-phase clock generating circuit and liquid crystal display panel, said circuit comprising: a shift register including N shift registration units, which are cascaded with each other; a first output terminal of nth shift registration units connected to a first input terminal of an (n+1)th shift registration unit; a thin film transistor set including N thin film transistors, said control terminals of said thin film transistors of a nth stage are respectively connected to said first output terminals of (Nn+1) shift registration units.

An integrated circuit device includes a clock gating circuit, which is configured to generate a first plurality of clocks in response to a first reference clock at a first frequency and a plurality of operation enable signals. A plurality of functional circuits are provided, which are responsive to respective ones of the first plurality of clocks. The plurality of functional circuits is configured to generate respective ones of the plurality of operation enable signals, with each of the plurality of operation enable signals having a first logic state that enables a respective clock within said clock gating circuit and a second logic state that disables the respective clock within said clock gating circuit.

A transistor with excellent electrical characteristics (e.g., on-state current, field-effect mobility, or frequency characteristics) is provided. The transistor includes an oxide semiconductor layer including a channel formation region, a first gate electrode, a second gate electrode, a source electrode, and a drain electrode. The oxide semiconductor layer is between the first gate electrode and the second gate electrode. The oxide semiconductor layer has a pair of side surfaces in contact with the source electrode and the drain electrode and includes a region surrounded by the first gate electrode and the second gate electrode without the source electrode and the drain electrode interposed therebetween.

A first flipflop outputs a first signal synchronized with a first clock signal. In the first transistor, the first clock signal is input to a first terminal and the second signal is output from a second terminal. In the fourth transistor, a first signal is input to a first terminal and a second terminal is electrically connected to a gate of the first transistor. In the sixth transistor, the third signal is input to a first terminal, a second terminal is electrically connected to the gate of the fourth transistor, and the gate of the sixth transistor is electrically connected to the first terminal.

Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

A circuit for reducing a time to switch between the redundant clock signals applied to a phase lock loop. The circuit includes a phase frequency detector of the phase lock loop that detects a shift in the phase of a reference clock signal relative to the phase of a feedback clock signal. The circuit further includes a coarse tuning mechanism configured to delay the feedback clock signal until the feedback clock signal is aligned with a backup reference clock signal. Furthermore, the circuit includes a fine tuning mechanism configured to align the edge of the feedback clock signal with the edge of the backup reference clock signal, such as by utilizing a series of delay elements to delay the backup reference clock signal at different points in time and selecting the appropriate delayed backup reference clock signal whose edge is aligned with the edge of the feedback clock signal.

Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

Analog-to-digital converter (ADC) circuitry including a delay domain ADC that outputs converted analog input data along with a delay domain clock. A clock delay driver outputs a digital domain clock, an early clock leading the digital domain clock signal, and a late clock lagging the digital domain clock. An output latch latches the ADC output by the digital domain clock signal. The circuitry includes a timing error detection circuit with inputs receiving the delay domain clock, the early clock, and the late clock. The timing error detection circuit outputs early and late fail flags responsive to detecting timing errors of the digital domain clock relative to the early and late clocks, respectively. Timing loop circuitry has an input coupled to the error flag output of the timing error detection circuitry, and an output coupled to a control input of the clock delay driver.

A circuit for reducing a time to switch between the redundant clock signals applied to a phase lock loop. The circuit includes a phase frequency detector of the phase lock loop that detects a shift in the phase of a reference clock signal relative to the phase of a feedback clock signal. The circuit further includes a coarse tuning mechanism configured to delay the feedback clock signal until the feedback clock signal is aligned with a backup reference clock signal. Furthermore, the circuit includes a fine tuning mechanism configured to align the edge of the feedback clock signal with the edge of the backup reference clock signal, such as by utilizing a series of delay elements to delay the backup reference clock signal at different points in time and selecting the appropriate delayed backup reference clock signal whose edge is aligned with the edge of the feedback clock signal.