H03K19/018571

Transmitting device using calibration circuit, semiconductor apparatus and system including the same
10304503 · 2019-05-28 · ·

A transmitting device includes a calibration circuit and a transmission circuit. The calibration circuit generates calibration codes by performing a calibration operation. The calibration circuit also generates compensation calibration codes by increasing or decreasing values of the calibration codes according to whether a number of codes among the calibration codes having a predetermined level is greater than or equal to a threshold value. The transmission circuit drives a signal transmission line based on an input signal and the compensation calibration codes.

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
20190157450 · 2019-05-23 · ·

A p.sup.-type isolation region is provided at a part between a p-type ground region and a circuit region (a high potential region and an intermediate potential region) in an n-type well region. The p.sup.-type isolation region is electrically connected with a H-VDD pad and an n.sup.+-type drain region of a HVNMOS. The p.sup.-type isolation region has between n.sup.+-type pickup connect regions and between n.sup.+-type drain regions of two of the HVNMOSs, a protruding part (a T-shaped part, an L-shaped part, a partial U-shaped part) or an additional part that protrudes toward a p-ground region.

Semiconductor device for detecting a poor contact of a power pad
10283213 · 2019-05-07 · ·

A semiconductor device may include a first pad configured to provide a first voltage. The semiconductor device may include a second pad. The semiconductor device may include a connection circuit configured to couple the first pad to the second pad on the basis of a connection signal or electrically separate the second pad from the first pad on the basis of the connection signal. The semiconductor device may include a detection circuit configured to generate a defect detection signal on the basis of a test mode signal and a second voltage received from the second pad.

Voltage translator device

In at least one general aspect, an apparatus can include a first voltage domain circuit configured to operate based on a first upper voltage and a first lower voltage, and a second voltage domain circuit configured to operate based on a second upper voltage and a second lower voltage. The apparatus can include a capacitive coupling circuit electrically connected between the first voltage domain circuit and the second voltage domain circuit, and a driver circuit including a switch device and electrically coupled to the second voltage domain circuit. The apparatus can also include an intermediate voltage domain circuit configured to trigger switching of the switch device included in the driver circuit where the intermediate voltage domain is configured to operate based on an intermediate voltage and the second upper voltage or the second lower voltage.

COMPLEMENTARY CURRENT FIELD-EFFECT TRANSISTOR DEVICES AND AMPLIFIERS
20190123688 · 2019-04-25 · ·

The present invention relates to a novel and inventive compound device structure, enabling a charge-based approach that takes advantage of sub-threshold operation, for designing analog CMOS circuits. In particular, the present invention relates to a solid state device based on a complementary pair of n-type and p-type current field-effect transistors, each of which has two control ports, namely a low impedance port and gate control port, while a conventional solid state device has one control port, namely gate control port. This novel solid state device provides various improvement over the conventional devices.

TRANSMITTING DEVICE USING CALIBRATION CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM INCLUDING THE SAME
20190096450 · 2019-03-28 · ·

A transmitting device includes a calibration circuit and a transmission circuit. The calibration circuit generates calibration codes by performing a calibration operation. The calibration circuit also generates compensation calibration codes by increasing or decreasing values of the calibration codes according to whether a number of codes among the calibration codes having a predetermined level is greater than or equal to a threshold value. The transmission circuit drives a signal transmission line based on an input signal and the compensation calibration codes.

LEVEL SHIFTER AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
20240235553 · 2024-07-11 ·

A level shifter includes: an input circuit receiving an input signal swinging between a reference voltage and a first power supply voltage having a level higher than a level of the reference voltage; an output circuit outputting an output signal swinging between a second power supply voltage having a level higher than the level of the first power supply voltage and a third power supply voltage having a level higher than the level of the second power supply voltage; and a tolerant circuit connected between the input circuit and the output circuit, and configured to limit an output voltage of the input circuit to a range between the reference voltage and the second power supply voltage.

SEMICONDUCTOR DEVICES WITH VOLTAGE ADJUSTMENT
20240235187 · 2024-07-11 ·

A semiconductor device includes: a voltage clamping circuit including a plurality of first elements operating upon receiving a voltage having a first level and configured to output a clamp signal swinging in the first level by adjusting a voltage of an external input signal swinging in a second level more than twice the first level; a first buffer circuit configured to buffer the clamp signal; a level down shifter circuit configured to reduce the voltage of the clamp signal and output an internal input signal swinging in the first level between a predetermined reference voltage and a first power supply voltage higher than the reference voltage; and a second buffer circuit configured to buffer the internal input signal and transmits the internal input signal to a core circuit.

Memory device

A device includes a memory cell array configured to store data; and a signal propagation circuit configured to propagate a signal between the memory cell array and a host. The signal propagation circuit includes a first inverted signal output circuit, a second inverted signal output circuit including an input terminal connected to i) an output terminal of the first inverted signal output circuit and ii) an output terminal of the second inverted signal output circuit, a third inverted signal output circuit including an input terminal connected to i) the output terminal of the first inverted signal output circuit and ii) the output terminal of the second inverted signal output circuit, and a fourth inverted signal output circuit including an input terminal connected to i) an output terminal of the third inverted signal output circuit and ii) an output terminal of the fourth inverted signal output circuit.

Complementary current field-effect transistor devices and amplifiers

The present invention relates to a novel and inventive compound device structure, enabling a charge-based approach that takes advantage of sub-threshold operation, for designing analog CMOS circuits. In particular, the present invention relates to a solid state device based on a complementary pair of n-type and p-type current field-effect transistors, each of which has two control ports, namely a low impedance port and gate control port, while a conventional solid state device has one control port, namely gate control port. This novel solid state device provides various improvement over the conventional devices.