The present disclosure provides systems and methods for improving operation of integrated circuit device including a logic region, which includes a plurality of logic gates that operate based at least in part on a clock signal to facilitate providing a target function, and a clock tree, which includes a clock switch block that receives a source clock signal from a clock source and a branch communicatively coupled between the clock switch block and the logic region, in which the branch operates to provide the clock signal to the logic region based at least in part on the source clock signal and the branch includes a tunable delay buffer that operates to apply a delay to the clock signal based at least in part on a clock skew expected to be introduced by the branch.

A selection circuit, a method for controlling the selection circuit, and a multiplexing circuit are provided. The selection circuit includes N control circuits and M booster circuits. Control terminals of M control circuits among the N control circuits are coupled to output terminals of the M booster circuits, respectively, and first input terminals of the M booster circuits are coupled to receive M control signals among N control signals, respectively. Second input terminals of the M booster circuits are coupled to receive M boost signals respectively, and each booster circuit is configured to provide the received control signal to an output terminal of the booster circuit and increase a potential at the output terminal of the booster circuit by using the received boost signal.

In certain aspects, a memory device includes an array of memory cells, an input/output (I/O) circuit, and control logic coupled to the I/O circuit. The array of memory cells includes a plurality of banks including a plurality of main banks and a redundant bank. The I/O circuit is coupled to each pair of adjacent banks of the plurality of banks and configured to direct a piece of data to or from either bank of each pair of adjacent banks. The control circuit is configured to select one bank of each pair of adjacent banks based on bank fail information indicative of a failed main bank of the plurality of main banks. The control circuit is further configured to control the I/O circuit to direct the piece of data to or from the selected bank of each pair of adjacent banks.

In certain aspects, a method for operating a memory device is disclosed. The memory device includes memory planes and multiplexers (MUXs). Each MUX includes an output coupled to a respective one of the memory planes, a first input receiving a non-asynchronous multi-plane independent (AMPI) read control signal, and a second input receiving an AMPI read control signal. Whether an instruction is an AMPI read instruction or a non-AMPI read instruction is determined. In response to the instruction being an AMPI read instruction, an AMPI read control signal is generated based on the AMPI read instruction, and a corresponding MUX is controlled to enable outputting the AMPI read control signal from the second input to the corresponding memory plane. In response to the instruction being a non-AMPI read instruction, a non-AMPI read control signal is generated based on the non-AMPI read instruction, and each MUX is controlled to enable outputting the non-AMPI read control signal from the respective first input to the respective memory plane.

A radio frequency (RF) multiplexer circuit is provided. The multiplexer includes a first circuit coupled between a first input terminal and a first output terminal. The first circuit is configured and arranged to transfer a first RF signal coupled at the first input terminal to the first output terminal as a first output signal when a first control signal is at a first logic value. The multiplexer includes a second circuit coupled between a second input terminal and the first output terminal. The second circuit is configured and arranged to transfer a second RF signal coupled at the second input terminal to the first output terminal as a second output signal having a gain higher than the gain of the second RF signal when the first control signal is at a second logic value.

A phase correction circuit includes: a test clock generation unit including a plurality of signal paths and configurable to generate a plurality of test clock signals in response to a plurality of selection signals and a plurality of phase control signals; a detection unit configured to generate a plurality of detection voltages using the plurality of test clock signals; and a control unit configured to generate the plurality of selection signals, detect phase skews of the plurality of signal paths according to the plurality of detection voltages, and generate the plurality of phase control signals for correcting the phase skews.

A processing device is provided which comprises memory configured to store data and a processor. The processor comprises a plurality of MACs configured to perform matrix multiplication of elements of a first matrix and elements of a second matrix. The processor also comprises a plurality of logic devices configured to sum values of bits of product exponents values of the elements of the first matrix and second matrix and determine keep bit values for product exponents values to be kept for matrix multiplication. The processor also comprises a plurality of multiplexor arrays each configured to receive bits of the elements of the first matrix and the second matrix and the keep bit values and provide data for selecting which elements of the first matrix and the second matrix values are provided to the MACs for matrix multiplication.

A device includes a multiplexer circuit with a plurality of input circuits. Each input circuit is connected to a respective input node and a shared output node. The input circuits are configured to pass, in response to a respective control signal, a signal between the respective input and shared output node. An output circuit is configured to store data from the shared output node in a latch mode and to act as a buffer in a pass-through mode. A control circuit is configured to switch, in response to a configuration signal, the output circuit between the latch mode and the pass-through mode.

Integrated circuits such as programmable integrated circuits may include programmable logic regions that can be configured to perform custom user functions. The programmable logic regions may include lookup table (LUT) circuitry driven using vectored multiplexing circuits. The vectored multiplexing circuits may include a first multiplexer stage controlled by common configuration bits, a second multiplexer stage, and means for connecting either outputs of the first multiplexer stage or the output of the second multiplexer stage to corresponding logic circuits. The vectored multiplexing circuits may be used to generate multiple signal variants to vectored lookup table circuitry. The vectored lookup table circuitry may include a first stage of LUTs sharing some number of inputs and a second stage of LUTs at least some of which can be switched out of use. The second stage of LUTs may have inputs that are deactivated in a fractured mode.

A novel programmable logic device is provided. Programmable switches each include a first transistor and a second transistor. The first transistor in a first programmable switch controls conduction between a first wiring and a gate of the second transistor in the first programmable switch. The second transistor in the first programmable switch controls conduction between the first wiring and a second wiring. The first transistor in the second programmable switch controls conduction between another first wiring and a gate of the second transistor in the second programmable switch.