Silicon test structures are described that enable separate measurement of n-channel metal-oxide semiconductor (NMOS) and p-channel metal-oxide semiconductor (PMOS) transistor delays. NMOS and PMOS specific non-inverting stages may be used to construct a multi-stage ring oscillator. Each of the non-inverting stages generates either a rising or falling primary transition that is determined by either NMOS or PMOS transistors, respectively. The opposing transition for a particular non-inverting stage is triggered by propagation of the primary transition to a subsequent non-inverting stage (producing a “reset” pulse). A frequency of the ring oscillator is determined by the primary transition and one transistor type (NMOS or PMOS). Specifically, the frequency is determined by the propagation delay of the primary transition through the entire ring oscillator.

The present technology includes a replica circuit and an oscillator including the same. The replica circuit includes a first terminal to which a replica voltage having a positive voltage is supplied, a second terminal to which a ground voltage is supplied, a replica main circuit connected between the first terminal and the second terminal and configured to form a first current path in response to a voltage of the first terminal, and a replica sub circuit connected in parallel with the replica main circuit between the first terminal and the second terminal and configured to form a second current path in response to the voltage of the first terminal. A current flowing through the second current path having a replica sub current amount is less than a current flowing through the first current path having a replica main current amount.

An integrated circuit that includes a generating circuit is described. During operation, the generating circuit may provide an edge clock having a target phase within a clock period of an input clock, where the generating circuit does not include a delay-locked loop (DLL). For example, the generating circuit may include a gated ring oscillator that provides a reference clock having a first fundamental frequency that is larger than a second fundamental frequency of the input clock. Note that the gated ring oscillator may be programmable to adjust the first fundamental frequency within a predefined range of values. Moreover, the generating circuit may include a control circuit that determines a reference count of a number of edges of the reference clock within a reference period of the reference clock.

A ring oscillator including: an oscillation circuit including an even number of inverters connected in a ring configuration, the oscillation circuit outputting a clock signal; plural potential fixing circuits respectively connected between pairs of the inverters, each of plural potential fixing circuits being switchable between a connected and a disconnected state in response to a first control signal; and an adjustment circuit that adjusts a drive capability of the inverters based on a second control signal, wherein, during startup, the drive capability is controlled to be a first capability, in which the potential fixing circuits are connected, by the first control signal, and wherein, after a predetermined time has elapsed after the first control signal is output, the drive capability is controlled to be a second capability, higher than the first capability, in which the potential fixing circuits are disconnected, by the second control signal.

A digital phase-locked loop (PLL) includes a time-to-digital converter (TDC) and a digitally controlled oscillator (DCO). The DCO generates a PLL clock signal and various sampling clock signals that are mesochronous. The TDC samples a phase difference between a reference clock signal and a frequency-divided version of the PLL clock signal based on the sampling clock signals and various enable signals. The enable signals are generated based on a calibration of the digital PLL. Each enable signal is associated with a sampling clock signal and indicates whether the associated sampling clock signal is to be utilized for sampling the phase difference. Further, the TDC generates control data indicative of the sampled phase difference. The DCO generates the PLL clock signal and the sampling clock signals based on the control data until the digital PLL is in a phase-locked state.

A phase-locked loop (PLL) device includes a first phase detector to receive an in-phase reference clock and an in-phase feedback clock, the first phase detector to output a first phase error; a second phase detector to receive a quadrature reference clock and a quadrature feedback clock, the second phase detector to output a second phase error; a proportional path component to generate first current pulses from the first phase error and second current pulses from the second phase error; an integrator circuit coupled to the proportional path component, the integrator circuit to sum, within a current output signal, the first current pulses and the second current pulses; a ring oscillator to be driven by the current output signal; and a pair of phase interpolators coupled to an output of the ring oscillator, the pair of phase interpolators to respectively generate the in-phase feedback clock and the quadrature feedback clock.

A clock and data recovery circuit includes a sampling circuit, a phase detector, a first processing circuit, a second processing circuit and an oscillator circuit. The sampling circuit is configured to sample input data according to an output clock, and generate a sampling result. The phase detector is configured to generate a detection result according to the sampling result. The first processing circuit is configured to process the sampling result to generate a first digital code. The second processing circuit is configured to accumulate a portion of the first digital code to generate a second digital code. A rate of change of a code value of the second digital code is slower than a rate of change of a code value of the first digital code. The oscillator circuit is configured to generate the output clock according to the detection result, the first digital code and the second digital code.

A novel phase locked loop design utilizing novel phase-frequency detector, charge pump, loop filter and voltage controlled oscillator is disclosed. The phase-frequency detector includes a dual reset D-flip flop for use in multi-GHz phase locked loops. Traditional dead zone issues associated with phase frequency detector are improved/addressed by use with a charge transfer-based PLL charge pump.

An apparatus having a digitally controlled timing adjustment circuit configured to receive a first clock and a second clock and output a third clock and a fourth clock in accordance with a noise cancellation signal and a gain control signal, an analog phase detector configured to receive the third clock and the fourth clock and output an analog timing error signal, a filtering circuit configure to receive the analog timing error signal and output an oscillator control signal, a controllable oscillator configured to receive the oscillator control signal and output a fifth clock, a clock divider configured to receive the fifth clock and output the second clock in accordance with a division factor, a modulator configured to receive a clock multiplication factor and output the division factor and the noise cancellation signal, wherein a mean value of the division factor is equal to the clock multiplication factor, a digital phase detector configured to receive the third clock and the fourth clock and output a digital timing error signal, wherein the digital phase detector is self-calibrated so that a mean value of the digital timing error signal is zero, and a correlation circuit configured to receive the timing error signal and the noise cancellation signal and output the gain control signal.

An integrated circuit with a phase-locked loop (PLL) is provided. The PLL may include a phase frequency detector, a charge pump, a source follower circuit, a variable oscillator, a frequency divider, and a control block. The phase frequency detector may be configured to align or lock a feedback clock signal to a reference clock signal. The control block includes clock loss detection circuits that are used to determine whether the reference clock signal or the feedback clock signal has stopped toggling. In response to detecting a clock loss event for either the reference or the feedback clock signal, the control block may disable the phase frequency detector to place the charge pump in a tristate mode and may apply a predetermined bias voltage to the source follower circuit to help minimize electrical overstress.