An oscillator calibration circuit is presented. The oscillator calibration includes a first frequency locking circuit (FLC) coupled to a first oscillator, wherein the first FLC calibrates the frequency of the first oscillator using an over-the-air reference signal, wherein the first FLC calibrates the first oscillator prior to a data transmission session and remains free running during the data transmission session; and a second FLC coupled to a second oscillator, wherein the second FLC calibrates the frequency of the second oscillator using the over-the-air reference signal, wherein the second FLC calibrates the second oscillator immediately prior to a data transmission session and remains free running during the data transmission session.

An oscillator calibration circuit is presented. The oscillator calibration includes a first frequency locking circuit (FLC) coupled to a first oscillator, wherein the first FLC calibrates the frequency of the first oscillator using an over-the-air reference signal, wherein the first FLC calibrates the first oscillator prior to a data transmission session and remains free running during the data transmission session; and a second FLC coupled to a second oscillator, wherein the second FLC calibrates the frequency of the second oscillator using the over-the-air reference signal, wherein the second FLC calibrates the second oscillator immediately prior to a data transmission session and remains free running during the data transmission session.

A circuit device includes a time-to-digital conversion circuit, to which a first clock signal generated using a first resonator, and having a first clock frequency, and a second clock signal generated using a second resonator, and having a second clock frequency different from the first clock frequency are input, and which converts time into a digital value using the first and second clock signals, and a PLL circuit adapted to perform phase synchronization between the first and second clock signals.

A circuit device includes a time-to-digital conversion circuit, to which a first clock signal generated using a first resonator, and having a first clock frequency, and a second clock signal generated using a second resonator, and having a second clock frequency different from the first clock frequency are input, and which converts time into a digital value using the first and second clock signals, and a PLL circuit adapted to perform phase synchronization between the first and second clock signals.

Oscillator calibration circuits and wireless transmitters including oscillator calibration circuits. An oscillator calibration circuit includes a first frequency locking circuit (FLC) coupled to a first oscillator, wherein the first FLC calibrates the frequency of the first oscillator using an over-the-air reference signal, wherein the first FLC calibrates the first oscillator prior to a data transmission session and remains free running during the data transmission session.

Oscillator calibration circuits and wireless transmitters including oscillator calibration circuits. An oscillator calibration circuit includes a first frequency locking circuit (FLC) coupled to a first oscillator, wherein the first FLC calibrates the frequency of the first oscillator using an over-the-air reference signal, wherein the first FLC calibrates the first oscillator prior to a data transmission session and remains free running during the data transmission session.

Methods, systems, and devices for section-based data protection in a memory device are described. In one example, a memory device may include a set memory sections each having memory cells configured to be selectively coupled with access lines of the respective memory section. A method of operating the memory device may include selecting at least one of the sections for a voltage adjustment operation based on a determined value of a timer, and performing the voltage adjustment operation on the selected section by activating each of a plurality of word lines of the selected section. The voltage adjustment operation may include applying an equal voltage to opposite terminals of the memory cells, which may allow built-up charge, such as leakage charge accumulating from access operations of the selected memory section, to dissipate from the memory cells of the selected section.

An adaptive voltage converter adapted to compensate for the exponential sensitivities of sub-threshold and near-threshold circuits. The converter can change its power/performance characteristics between different energy modes. The converter may comprise two or more voltage converters/regulators. A multiplexing circuit selects between the outputs of the several converters/regulators depending on the state of a control signal generated by a control facility. The converter is specially adapted to change the output of each converter/regulator based on a number of variables, including, for example, process corner, temperature and input voltage.

An adaptive voltage converter adapted to compensate for the exponential sensitivities of sub-threshold and near-threshold circuits. The converter can change its power/performance characteristics between different energy modes. The converter may comprise two or more voltage converters/regulators. A multiplexing circuit selects between the outputs of the several converters/regulators depending on the state of a control signal generated by a control facility. The converter is specially adapted to change the output of each converter/regulator based on a number of variables, including, for example, process corner, temperature and input voltage.

A system to test a PLL circuit driven by a reference clock includes a first counter coupled to a reference clock output, a first buffer coupled to the first counter, a second counter coupled to a controlled-oscillator (CO) output of the PLL circuit, a second buffer coupled to the second counter, and a processor configured to compute a PLL lock time according to second count values in the second buffer, and to compute a PLL startup slope according to the first count values in the first buffer and the second count values in the second buffer. A method includes powering up a PLL circuit of a wafer, sampling count values of a reference clock and second count values of the PLL circuit and computing a PLL performance parameter according to the sampled count values in a buffer.