A circuit device includes a control circuit having a successive approximation register, a D/A conversion circuit adapted to perform D/A conversion on output data from the successive approximation register, and a comparison circuit adapted to compare an analog input signal and an output signal from the D/A conversion circuit with each other, the control circuit includes an upper limit value register and a lower limit value register adapted to respectively hold an upper limit value and a lower limit value of a conversion range, and increases the upper limit value or decreases the lower limit value in the case in which the same comparison result has been output by the comparison circuit a predetermined number of times or more.

A semiconductor device includes an analog-to-digital converter configured to perform a process of sampling an analog input signal and a successive-approximation process, execute an AD conversion process, and output a digital output signal. The AD converter includes an upper DAC, a redundant DAC, a lower DAC, a comparator configured to compare a comparative reference voltage and output voltages of the upper DAC, the redundant DAC and the lower DAC, a control circuit configured to control successive approximations by the upper DAC, the redundant DAC and the lower DAC based on the comparison result of the comparator, and generate a digital output signal, and a correction circuit. The correction circuit includes an error correction circuit configured to correct an error of the upper bit with the redundant bit, and an averaging circuit configured to calculate an average value of conversion values of a plurality of the lower bits supplied multiple times.

An analog-to-digital converter of non-binary capacitor array with redundancy bits and its chip. The non-binary capacitor array with redundancy bits comprises a common-mode voltage, analog signal input, no less than one redundancy bit capacitor and multiple capacitors; each capacitor of capacitors with redundancy bits and multiple capacitors is connected in parallel between common-mode voltage and analog signal input and marked in a sequence from highest to lowest/lowest to highest bit; the sum of the capacitance of capacitors from the lowest bit capacitor to an random capacitor must be no less than the capacitance of the higher bit capacitor adjacent to the random capacitor. The ratio of the capacitance of each capacitor to the capacitance of unit capacitor is set to be positive. The capacitor array is applied into an analog-to-digital converter or fabricated as a chip.

A circuit device includes a control circuit having a successive approximation register, a D/A conversion circuit adapted to perform D/A conversion on output data from the successive approximation register, and a comparison circuit adapted to compare an analog input signal and an output signal from the D/A conversion circuit with each other, the control circuit includes an upper limit value register and a lower limit value register adapted to respectively hold an upper limit value and a lower limit value of a conversion range, and increases the upper limit value or decreases the lower limit value in the case in which the same comparison result has been output by the comparison circuit a predetermined number of times or more.

An analog-to-digital converter (ADC) includes an input terminal configured to receive an analog input voltage signal. A first ADC stage is coupled to the input terminal and is configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal. An inverter based residue amplifier is configured to receive the first analog residue signal, amplify the first analog residue signal, and output an amplified residue signal. The amplified residue signal is converted to a second digital value, and the first and second digital values are combined to create a digital output signal corresponding to the analog input voltage signal.

An asynchronous successive approximation register analog-to-digital converter (SAR ADC), which utilizes one or more overlapping redundant bits in each digital-to-analog converter (DAC) code word, is operable to generate an indication signal that indicates completion of each comparison step and indicates that an output decision for each comparison step is valid. A timer may be initiated based on the generated indication signal. A timeout signal may be generated that preempts the indication signal and forces a preemptive decision, where the preemptive decision sets one or more remaining bits up to, but not including, the one or more overlapping redundant bits in a corresponding digital-to-analog converter code word for a current comparison step to a particular value. For example, the one or more remaining bits may be set to a value that is derived from a value of a bit that was determined in an immediately preceding decision.

An analog-to-digital converter (ADC) is provided, having two comparators, two digital-to-analog converters (DACs), and an adder circuit. The ADC receives an input value and, over a plurality of conversion cycles of the ADC, generates an output value representative of the input value. Each respective DAC generates a plurality of threshold levels, which are defined, at least in part, by predetermined redundancy levels that are binary-scaled. The comparator arrangement provides an output code in a respective conversion cycle and, for at least two adjacent conversion cycles, the two comparators collectively provide 2-bit output codes. The adder circuit provides a plurality of output bits of the output value, and is capable of overlapping and adding a first significant bit of the 2-bit output code provided for a predetermined conversion cycle with a second significant bit of the 2-bit output code provided for a previous conversion cycle to generate one output bit.

An analog-to-digital converter (ADC) is provided, having two comparators, two digital-to-analog converters (DACs), and an adder circuit. The ADC receives an input value and, over a plurality of conversion cycles of the ADC, generates an output value representative of the input value. Each respective DAC generates a plurality of threshold levels, which are defined, at least in part, by predetermined redundancy levels that are binary-scaled. The comparator arrangement provides an output code in a respective conversion cycle and, for at least two adjacent conversion cycles, the two comparators collectively provide 2-bit output codes. The adder circuit provides a plurality of output bits of the output value, and is capable of overlapping and adding a first significant bit of the 2-bit output code provided for a predetermined conversion cycle with a second significant bit of the 2-bit output code provided for a previous conversion cycle to generate one output bit.

A digital-to-analog converter (DAC) for generating an analog output from a digital input includes a controller configured to generate a control signal based on the digital input, and a segment cell circuit including a plurality of segment cells turned on or off based on the control signal and configured to generate the analog output based on outputs of the plurality of segment cells, wherein the plurality of segment cells include a plurality of first segment cells each configured to generate an output corresponding to each of bits included in a first bit group of the digital input, a plurality of second segment cells each configured to generate an output corresponding to each of bits included in a second bit group of the digital input, and an additional segment cell configured to generate an output corresponding to a lowermost bit among the bits included in the second bit group.

An analog input voltage is converted to a digital code by, generating a first set of confirmed bits based on a first series of comparisons of an output of a digital-to-analog converter with the analog input voltage and generating a second set of confirmed bits based on a second series of comparisons of the output of the digital-to-analog converter with the analog input voltage. The first set of confirmed bits is independent of the second series of comparisons. The bits of the digital output code corresponding to the analog input voltage are generated based on the first set of confirmed bits, the second set of confirmed bits and a constant value representative of a voltage shift introduced in the digital-to-analog converter between the first series of comparisons and the second series of comparisons.