A method of operating a redundant successive approximation analog-to-digital converter (ADC) includes: sampling an input signal; and successively approximating the sampled input signal using a digital-to-analog converter (DAC) including DAC reference elements having at least one sub-binary weighted DAC reference element. Successively approximating the sampled input signal includes performing a plurality of successive approximation cycles. Each successive approximation cycle of the plurality of successive approximation cycles including: generating a DAC input word using a successive approximation register (SAR), offsetting the DAC input word to form an offset DAC input word when the successive approximation cycle corresponds to the at least one sub-binary weighted reference element, applying the offset DAC input word to an input of the DAC to produce a first DAC output signal, comparing the first DAC output signal with the sampled input signal using a comparator, and setting a bit of the SAR based on the comparison.

A method of operating an image sensor includes generating an analog pixel signal, including a reset component and an image component, based on incident light received by a pixel in the image sensor. Operations are performed to repeatedly sample the reset component of the analog pixel signal using a ramp signal, during a first time interval, and then repeatedly sample the image component of the analog pixel signal using the ramp signal, during a second time interval subsequent to the first time interval. A digital signal corresponding to an effective image component of the incident light is then generated. This digital signal is based on the repeatedly sampled reset component of the analog pixel signal and the repeatedly sampled image component of the analog pixel signal. In addition, during both the first and second time intervals, the ramp signal decreases in magnitude and increases in magnitude.

An analog to digital converter comprising: a plurality of voltage generators, each voltage generator having a control input and being capable of generating an output whose voltage is dependent on a signal applied to the control input; a comparison stage arranged to compare the input signal with one or more outputs of the voltage generators and generate one or more comparator outputs indicative of the result(s) of the comparison(s); and a controller arranged to receive the comparator outputs, the controller being configured to: (i) signal the control inputs of a number V.sub.1 of the voltage generators, and estimate a number B.sub.1 of bits of the digital representation; and subsequently (ii) signal the control input(s) of a number V.sub.2 of the voltage generators, and estimate a number B.sub.2 of bits of the digital representation; wherein V.sub.2 is less than V.sub.1.

A pipelined analog-to-digital converter (ADC) using a multiplying digital-to-analog converter (MDAC) and two sub-range analog-to-digital converters (sub-range ADCs) is disclosed. The MDAC samples an analog input and performs multiplication on the sampled analog input based on control bits. The first sub-range ADC provides the MDAC with the control bits. The second sub-range ADC is coupled to the MDAC for conversion of a multiplied signal output from the MDAC. The first sub-range ADC samples the analog input to generate the control bits for the MDAC as well as pre-estimated bits for the second sub-range ADC. The second sub-range ADC operates based on the pre-estimated bits and thereby a first section of digital bits are generated by the second sub-range ADC. A second section of digital bits are provided by the first sub-range ADC. The first and second sections of digital bits represent the analog input.

Systems and methods are related to a successive approximation analog to digital converter (SAR ADC). The SAR ADC includes a sample and digital to analog conversion (DAC) circuit configured to sample an input voltage, a comparator circuit coupled to the sample and DAC circuit and having an output, a first set of storage circuits, and a comparator driver. The comparator driver is disposed between the output and the first set of storage circuits (e.g., ratioed latched. The first set of storage circuits are coupled to the comparator circuit and the sample and DAC circuit. The comparator driver can include a first driver and second driver. The first driver is coupled to a first input of a first storage circuit of the first set of storage circuits, and the second driver is coupled to first inputs of a second set of storage circuits within the first set of storage circuits.

Performing a temperature measurement operation includes a first phase and a second phase. The first phase includes providing a voltage indicative of a measured temperature to a first input of a comparator, providing a ramp signal to a second input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. The second phase includes providing the voltage indicative of a measured temperature to the second input of the comparator, providing the ramp signal to the first input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. Performing the temperature measurement operation also includes utilizing the pulses generated during the first and second phases to provide a digital indication of the measured temperature.

A pipelined analog-to-digital converter (ADC) using a multiplying digital-to-analog converter (MDAC) and two sub-range analog-to-digital converters (sub-range ADCs) is disclosed. The MDAC samples an analog input and performs multiplication on the sampled analog input based on control bits. The first sub-range ADC provides the MDAC with the control bits. The second sub-range ADC is coupled to the MDAC for conversion of a multiplied signal output from the MDAC. The first sub-range ADC samples the analog input to generate the control bits for the MDAC as well as pre-estimated bits for the second sub-range ADC. The second sub-range ADC operates based on the pre-estimated bits and thereby a first section of digital bits are generated by the second sub-range ADC. A second section of digital bits are provided by the first sub-range ADC. The first and second sections of digital bits represent the analog input

An analog to digital converter comprising: a plurality of voltage generators, each voltage generator having a control input and being capable of generating an output whose voltage is dependent on a signal applied to the control input; a comparison stage arranged to compare the input signal with one or more outputs of the voltage generators and generate one or more comparator outputs indicative of the result(s) of the comparison(s); and a controller arranged to receive the comparator outputs, the controller being configured to: (i) signal the control inputs of a number V.sub.1 of the voltage generators, and estimate a number B.sub.1 of bits of the digital representation; and subsequently (ii) signal the control input(s) of a number V.sub.2 of the voltage generators, and estimate a number B.sub.2 of bits of the digital representation; wherein V.sub.2 is less than V.sub.1.

Analogue-to-digital converter, ADC, circuitry, including: an analogue input terminal; a comparator having first and second comparator-input terminals; and successive-approximation control circuitry to apply a potential difference across the first and second comparator-input terminals based on an input voltage signal, and to control the potential difference for a series of successive approximation operations to cause the comparator to test in each successive approximation operation whether a magnitude of an analogue input voltage signal is larger or smaller than a corresponding test value, the test value for each successive approximation operation being, dependent on a comparison result generated by the comparator in the preceding approximation operation, bigger or smaller than the test value for the preceding approximation operation by a difference amount configured for that successive approximation operation.

The present application relates to an EQ circuit, a method of operating it and a system comprising the EQ circuit and an ADC. The EQ circuit has a configurable load section, which is provided for selectively exposing one of a plurality of distinct loads to a reference source connected to a reference voltage signal input of the equalization circuit, and a logic section, which is arranged to accept a state signal from the ADC and to selectively connect one distinct load out of the plurality of distinct loads in response to the state signal. The state signal is indicative of an actual operation state of the ADC.