A method of measuring light intensity comprising exposing a photodiode to light to cause the photodiode to provide a current of a first polarity, supplying said current to an integrator to integrate said current to provide an integrated output voltage, and comparing the output voltage with a threshold voltage. Charge packages of opposite polarity are applied to said first polarity to reset the integration voltage prior to the start of the integration time. At the end of the integration time, the photodiode is disconnected from said integrator and a reference voltage coupled to the integrator input, whilst a resistance is coupled into the circuit until the comparison signal switches. The comparison signal is monitored to measure a time between the end of the integration time and the switching of the comparison signal to provide a measure of a residual voltage.

A system and method for reducing or eliminating undesired effects of an artifact on a received signal is disclosed. The signal is generated from stimulating a sample. A receiver includes estimations of artifacts on the signal that are subtracted at different stages of the receiver. The estimations of the artifact may be performed via a successive approximation register scheme.

Analog-to-digital converters (ADCs) can be used inside ADC architectures, such as delta-sigma ADCs. The error in such internal ADCs can degrade performance. To calibrate the errors in an internal ADC, comparator offsets of the internal ADC can be estimated by computing a mean of each comparator of the internal ADC. Relative differences in the computed means serves as estimates for comparator offsets. If signal paths in the internal ADC are shuffled, the estimation of comparator offsets can be performed in the background without interrupting normal operation. Shuffling of signal paths may introduce systematic measurement errors, which can be measured and reversed to improve the estimation of comparator offsets.

Disclosed successive approximation register analog-to-digital converters (SAR ADCs) and conversion methods detect a statistical effect of meta-stability induced errors and limit the level of such errors. One illustrative integrated circuit chip includes: a SAR ADC that employs asynchronous bit cycles to convert a sequence of analog signal samples into a sequence of digital signal samples; and a detector that accelerates the asynchronous bit cycles when a meta-stability error bias exceeds a predetermined threshold. An illustrative analog-to-digital conversion method includes: converting a sequence of analog signal samples to a sequence of digital signal samples using a successive approximation register analog to digital converter (SAR ADC) with asynchronous bit cycles; deriving a meta-stability error bias from the sequence of digital signal samples; and accelerating the asynchronous bit cycles when the meta-stability error bias exceeds a predetermined threshold.

A SAR ADC is disclosed. The SAR ADC includes a plurality of SAR-capacitors. For each of the SAR-capacitors, a sampling-switching-block is configured to connect a first plate of the associated SAR-capacitor to either: v-ref-low, v-ref-high or an input-voltage. The SAR ADC also includes an offset-capacitor and an offset-switching-block configured to connect a first plate of the offset-capacitor to either: v-ref-low, or v-ref-high. The SAR ADC further includes a SAR machine configured to provide signals to the sampling-switching-blocks and the offset-switching-block in order to define a calibration-sampling-mode-of-operation, a calibration-conversion-mode-of-operation, a sampling-mode-of-operation and a conversion-mode-of-operation. A code converter is also includes and is configured to subtract the offset-value from the raw-digital-word in order to provide a digital-output-signal.

A comparator configured to calibrate an offset according to a control signal, including an input circuit configured to receive a first input signal and a second input signal, and to generate a first internal signal corresponding to the first input signal and a second internal signal corresponding to the second input signal; a differential amplification circuit configured to consume a supply current flowing from a positive voltage node having a positive supply voltage to a negative voltage node having a negative supply voltage, and to generate an output signal by amplifying a difference between the first internal signal and the second internal signal; and a current valve configured to adjust at least a portion of the supply current based on the control signal.

Coulomb counter circuitry operable in a first mode of operation and a second mode of operation, the coulomb counter circuitry comprising: first analog to digital converter (ADC) circuitry configured to generate a first ADC output signal indicative of a current through a load coupled to the coulomb counter circuitry; second analog to digital converter (ADC) circuitry; offset correction circuitry; and accumulator circuitry configured to generate a signal indicative of a cumulative amount of charge transferred to the load, wherein in the second mode of operation, the coulomb counter circuitry is operable to enable the second ADC circuitry and to generate an offset correction factor based at least in part on a second ADC output signal output by the second ADC circuitry, and wherein in subsequent operation of the coulomb counter circuitry in the first mode of operation, the offset correction circuitry applies the offset correction factor to the first ADC output signal.

A multiplexer (MUX) calibration system includes main MUX circuitry, first replica MUX circuitry, digital-to-analog (DAC) circuitry, detection circuitry, and control circuitry. The main MUX circuitry receives clock signals and outputs a first data signal based on the clock signals. The first replica MUX circuitry receives the clock signals and outputs a second data signal based on the clock signals. The DAC circuitry generates an offset voltage. The detection circuitry receives the second data signal and the offset voltage and generates a first error signal based on one or more of the second data signal and the offset voltage. The control circuitry receives the first error signal and generates a first control signal indicating an adjustment to the clock signals.

An analog-to-digital converter (ADC) circuit is configured to receive an analog input signal and convert the analog input signal to a digital output signal. The ADC circuit includes a first circuit that is configured to convert the analog input signal into a first digital signal that includes a first subset of bits of the digital output signal and further provide a residue signal based on the first digital signal; and a second circuit, coupled to the first circuit, and is configured to determine a discharging time duration by simultaneously amplifying and discharging the residue signal.

Disclosed is a successive approximation register (SAR) analog to digital converter (ADC) that uses two or more comparators. This allows the output of one comparator to be latched while the other comparators are comparing and switching. Statistical measures are used to correct the offsets of one or more of the comparators. If a statistically significant mismatch in the number of 1's and 0's occurs in a subset of the bits, adjustments to the offsets of one or more of the comparators are made until there is roughly an equal number of 1 and 0 values. This can reduce or eliminate the need for dedicated offset correction cycles.