An apparatus comprising M time-interleaved analog to digital converters (ADC) that sample an input signal at M sampling phases, wherein M is equal to or greater than 4. A phase control circuit adjusts at least M1 sampling phases of the M sampling phases. The phase control circuit comprises M1 phase error detector circuits. Each phase error detector circuit detects a corresponding phase error for a corresponding sampling phase of the M1 sampling phases based on a sample captured at a sampling phase of the M sampling phases immediately preceding the corresponding sampling phase and a sample captured at a sampling phase of the M sampling phases immediately subsequent to the corresponding sampling phase.

An analog to digital conversion apparatus that includes an analog to digital converter (ADC), a linearity calculating module and a calibration module is provided. The ADC includes a capacitor array, a comparator and a control circuit. The capacitor array receives an input signal to perform a capacitor-switching to generate a capacitor array output signal. The comparator compares the capacitor array output signal and a comparing signal to generate a digital code output result. The control circuit controls the capacitor-switching according to the digital code output result. The linearity calculating module generates a linearity related parameter according to the digital code output result. The calibration module generates a weighting parameter according to the linearity related parameter when the linearity related parameter is not within a predetermined range to adjust the digital code output result based on the weighting parameter to generate an adjusted digital code output result.

Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

According to an embodiment, a digital-to-analog converter may be provided. The digital-to-analog converter may include a resistive ladder network including a plurality of paths corresponding to bit currents, respectively. The digital-to-analog converter may include a switching circuit configured to include a plurality of weighted elements respectively coupled to the paths. The digital-to-analog converter may include a reference voltage setting circuit coupled to the weighted elements and the paths, and configured to minimize a variation of threshold voltages of the weighted elements.

In described examples, a digital-to-analog converter includes an output, multiple most significant bit (MSB) connector resistors each having a resistance R??R, multiple least significant bit (LSB) connector resistors each having a resistance R, and multiple binary arm resistors each having a resistance 2R. The MSB connector resistors are coupled in a series beginning with the output and ending with a first one of the LSB connector resistors, and the LSB connector resistors are coupled in a series beginning with the first LSB connector resistor. A terminal of one of the binary arm resistors is coupled to an ending of the LSB connector resistor series, and a terminal of each of different remaining ones of the binary arm resistors is coupled between a different pair of the MSB and/or LSB connector resistors.

A self-calibrating digital-to-analog converter (DAC) is disclosed. The self-calibrating DAC includes a DAC including a least significant bit (LSB) side resistor network and a most significant bit (MSB) side resistor network. At least the MSB side resistor network includes a plurality of trimmable resistors. A resistance to frequency converter coupled with an output of the DAC is included to generate a frequency f.sub.L based on a value of the LSB side resistor network or the MSB side resistor network. A monitor is included to generate a counter value by comparing f.sub.L with a high frequency clock having a constant frequency f.sub.H. A memory is included to store at least two counter values generating by comparing f.sub.L and f.sub.H once when the LSB side resistor network is connected while the MSB side resistor network is floating and once when the LSB side resistor network is floating while only one of the resistors in the MSB side resistor network is connected and all other resistors in the MSB side resistor network are floating. A comparator is included to compare the at least two counter values. A trimming controller is included to generate a trimming signal to trim one of the plurality of trimmable resistors based on an output of the comparator.

A method for calibrating an analog-to-digital converter includes the following steps: conducting an initial performance test and judgement on the analog-to-digital converter; if the initial performance test succeeds, performing a pre-trimming and judgement on the analog-to-digital converter; if the pre-trimming succeeds, performing an error extraction on the analog-to-digital converter, obtaining errors of conversion stages of the analog-to-digital converter; performing an error soft trimming and test on the analog-to-digital converter according to the errors of the conversion stages; and if the error soft trimming and test of the analog-to-digital converter succeed, performing an error hard trimming and test on the analog-to-digital converter according to the errors of the conversion stages.

According to an embodiment, a digital-to-analog converter may be provided. The digital-to-analog converter may include a resistive ladder network including a plurality of paths corresponding to bit currents, respectively. The digital-to-analog converter may include a switching circuit configured to include a plurality of weighted elements respectively coupled to the paths. The digital-to-analog converter may include a reference voltage setting circuit coupled to the weighted elements and the paths, and configured to minimize a variation of threshold voltages of the weighted elements.

An analog to digital conversion apparatus that includes an analog to digital converter (ADC), a linearity calculating module and a calibration module is provided. The ADC includes a capacitor array, a comparator and a control circuit. The capacitor array receives an input signal to perform a capacitor-switching to generate a capacitor array output signal. The comparator compares the capacitor array output signal and a comparing signal to generate a digital code output result. The control circuit controls the capacitor-switching according to the digital code output result. The linearity calculating module generates a linearity related parameter according to the digital code output result. The calibration module generates a weighting parameter according to the linearity related parameter when the linearity related parameter is not within a predetermined range to adjust the digital code output result based on the weighting parameter to generate an adjusted digital code output result.

Methods and apparatus for adaptively adjusting a resistance of a resistor network in a digital-to-analog converter (DAC), such as a current-steering DAC for a transmit chain. An example DAC generally includes a plurality of DAC cells. One or more of the DAC cells generally includes a current source and a resistor network. The resistor network includes a plurality of resistive elements, has an adjustable resistance, and is coupled between a power supply rail and the current source. In this manner, the DAC may support a wide range of full-scale currents, while maintaining a higher degeneration voltage and reduced noise and mismatch for a given headroom. For certain aspects, the one or more of the DAC cells further include a plurality of switches (e.g., implemented with PFETs) coupled to one or more of the resistive elements and configured to adjust the resistance of the resistor network.