A serial data receiver circuit included in a computer system may include a front-end circuit, a sample circuit that includes multiple analog-to-digital converter circuits, and a recovery circuit. The front-end circuit may generate an equalized signal using multiple signals that encode a serial data stream of multiple data symbols. Based on a baud rate of the serial data stream, a determined number of the multiple analog-to-digital converter circuits sample, using a recovered clock signal, the equalized signal at the respective times to generate corresponding samples. The recovery circuit generates, using the samples, the recovered clock signal and recovered data symbols.

An Analog-to-Digital Converter (ADC) includes a plurality of ADC channels connected to an in-service signal input via an isolated power combiner; an on-chip circuit including a calibration source connected to the isolated power combiner; and one or more switches configured to switch the ADC between an in-service mode and a calibration mode. The one or more switches are set such that, in the calibration mode, the in-service signal input is disconnected and the on-chip circuit is connected to the isolated power combiner, and, in the in-service mode, the in-service signal input is connected and the on-chip circuit is disconnected to the isolated power combiner. In the calibration mode, the on-chip circuit is configured to provide a test signal to the plurality of ADC channels for a determination of interleave errors in the plurality of ADC channels.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a controlling circuit. The ADC circuits are configured to generate first quantized outputs according to clock signals. The calibration circuit is configured to perform at least one error operation according to the first quantized outputs to generate second quantized outputs, and is configured to analyze time difference information of the clock signals according to the second quantized outputs to generate adjustment signals. The controlling circuit is configured to analyze the first quantized outputs to generate at least one control signal to the calibration circuit, wherein the at least one control signal is configured to control the calibration circuit to selectively perform the at least one error operation and selectively analyze the time difference information of the clock signals.

A sample holding circuit includes a signal input terminal, a first sampling unit, a second sampling unit, and a holding unit. The signal input terminal receives a first reference voltage or a second reference voltage, the first sampling unit samples the first reference voltage when a first clock signal is triggered to obtain a first sampling voltage, the second sampling unit samples the second reference voltage when a second clock signal is triggered to obtain a second sampling voltage. The holding unit receives the first sampling voltage and the second sampling voltage when a third clock signal is triggered. The sample holding circuit effectively simplifies circuit structure and reduces the use of amplifiers, also improving the signal to noise ratio.

The present disclosure provides an analog-to-digital converter system comprising a sampler configured to sample an input signal and provide at least two output signals with a predetermined output sample rate, and an analog-to-digital converter for each one of the output signals and configured to convert the respective output signal into a digital signal with a predetermined converter sample rate, wherein the converter sample rate is higher than the output sample rate. Further, the present disclosure provides a respective method.

An error correction method and a time-interleaved analog-to-digital converter (TIADC) are provided. The method is applied to a TIADC that includes a plurality of analog-to-digital converters (ADCs), and the method includes: determining whether a current value of a codeword of a first ADC in the plurality of ADCs is within a preset range; when the current value of the codeword of the first ADC is not within the preset range, adjusting a plurality of codewords that are in a one-to-one correspondence with the plurality of ADCs; and controlling a clock frequency division circuit to generate, by using a plurality of adjusted codewords, a plurality of sampling clocks that are in a one-to-one correspondence with the plurality of ADCs. In embodiments of this application, a sampling time-period skew existing between ADCs may be adjusted by adjusting codewords corresponding to the ADCs.

The present disclosure relates to a bootstrapped switch circuit, a track-and-hold circuit, an analog-to-digital converter, a method for operating a track-and-hold circuit, a base station, and a mobile station. The bootstrapped switch circuit comprises an output for an output signal, a first input, a switching element configured to couple the output with a signal from the first input, a bootstrapper capacitor configured to drive the switching element, and a second input coupled to the bootstrapper capacitor.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. An auto-correlator generates a sign of a correlation error for a pair of ADC digital outputs. SAR bits are tested with the correlation sign bit determining when to add or subtract SAR bits. First all pairs are calibrated in a first level of a binary tree of mux-correlators. Then skews between remote pairs and groups are calibrated in upper levels of the binary tree using auto-correlators with inputs muxed from groups of ADC outputs input to the binary tree of mux-correlators. The binary tree of mux-correlators can include bypasses for odd and non-binary values of N. Sampling clock and component timing skews are reduced to one LSB among both adjacent channels and remote channels.

A time-interleaved analog-to-digital converter (TIADC) operates in a first mode or a second mode and includes M analog-to-digital converters (ADCs), a reference ADC, a digital correction circuit, and a control circuit. The M ADCs sample an input signal according to M enable signals to generate M digital output codes. The reference ADC samples the input signal according to a reference enable signal to generate a reference digital output code. The digital correction circuit corrects the M digital output codes to generate M corrected digital output codes. The control circuit generates the M enable signals and the reference enable signal according to a clock. The control circuit outputs the M corrected digital output codes in turn but does not output the reference digital output code in the first mode and randomly outputs the M corrected digital output codes and the reference digital output code in the second mode.

An analog-to-digital conversion circuit includes; a first analog-to-digital converter (ADC), a second ADC and a third ADC collectively configured to perform conversion operations according to a time-interleaving technique, and a timing calibration circuit configured to calculate correlation values and determine differences between the correlation values using first samples generated by the first ADC, second samples generated by the second ADC, and third samples generated by the third ADC during sampling periods, wherein the timing calibration circuit is further configured to control a phase of a clock signal applied to the second ADC in response to a change in absolute value related to the differences generated during the sampling periods.