Disclosed successive approximation register analog-to-digital converters (SAR ADCs) and conversion methods detect a statistical effect of meta-stability induced errors and limit the level of such errors. One illustrative integrated circuit chip includes: a SAR ADC that employs asynchronous bit cycles to convert a sequence of analog signal samples into a sequence of digital signal samples; and a detector that accelerates the asynchronous bit cycles when a meta-stability error bias exceeds a predetermined threshold. An illustrative analog-to-digital conversion method includes: converting a sequence of analog signal samples to a sequence of digital signal samples using a successive approximation register analog to digital converter (SAR ADC) with asynchronous bit cycles; deriving a meta-stability error bias from the sequence of digital signal samples; and accelerating the asynchronous bit cycles when the meta-stability error bias exceeds a predetermined threshold.

The disclosure concerns controlling circuitry operably connectable to a plurality of constituent analog-to-digital converters (sub-ADCs) of an asynchronous time-interleaved analog-to-digital converter (TI-ADC). The controlling circuitry is configured to maintain a set of a number of sub-ADCs currently available for processing of an input sample, wherein the set is a subset of the plurality. Maintenance of the set is achieved by reception, from each of one or more of the sub-ADCs of the plurality, of an availability signal indicative of availability of the corresponding sub-ADC, and (responsive to the reception of the availability signal) addition of the corresponding sub-ADC to the set. Maintenance of the set is further achieved by (for each new input sample) selection of a sub-ADC of the set for processing of the new input sample, and (responsive to the selection) removal of the selected sub-ADC from the set and causing of the selected sub-ADC to process the new input sample. Corresponding TI-ADC, wireless communication receiver, wireless communication node, method and computer program product are also disclosed.

A pipeline analog to digital converter (ADC) includes converter circuitries, a detector circuitry, and a clock generator circuit. The converter circuitries sequentially convert an input signal to be digital codes. One of the converter circuitries includes a sub-ADC circuit and a multiplying digital to analog converter (MDAC) circuit. The sub-ADC circuit performs a quantization according to a first signal to generate a corresponding one of the digital codes, in which the first signal is the input signal or a previous stage residue signal. The MDAC circuit processes the corresponding one of the digital codes in response to a first clock signal, in order to generate a current stage residue signal. The detector circuitry detects whether the quantization is complete, in order to generate a control signal. The clock generator circuit adjusts a timing of the first clock signal according to the control signal.

A pipelined ADC that does not wait for the residue of a signal to settle to be delivered to the next stage of the pipeline, and thus passes signals to subsequent stages at faster than conventional speeds. A pipelined ADC is used that processes signals representing the boundaries of the search space. Thus, each stage does not necessarily receive the signal as pre-processed by the prior stage, but rather the search space boundaries as pre-processed by the prior stage. Reducing the “search space” of the ADC is equivalent to creating the residues in each step of a pipeline as in the prior art. An ADC operating in this fashion operates without error even if the residual search space boundary outputs from one state are presented to the next stage before the outputs have settled, and can run faster for a given power and bandwidth.

An analog-to-digital converter (ADC) is described. This ADC includes a conversion circuit with multiple bit-conversion circuits. During operation, the ADC may receive an input signal. Then, the conversion circuit may asynchronously perform successive-approximation-register (SAR) analog-to-digital conversion of the input signal using the bit-conversion circuits, where the bit-conversion circuits to provide a quantized representation of the input signal. For example, the bit-conversion circuits may asynchronously and sequentially perform the SAR analog-to-digital conversion to determine different bits in the quantized representation of the input signal. Moreover, the ADC may selectively perform self-calibration of a global delay of the bit-conversions circuits. Note that the timing self-calibration may be iterative and subject to a constraint that a maximum conversion time is less than a target conversion time.

The present disclosure provides asynchronous successive approximation register analog-to-digital convener (ASAR ADC) circuits and signal conversion method thereof. An exemplary ASAR AC circuit includes a sample/hold circuit configured to input a first analog signal and output a second analog signal; a digital-to-analog converter circuit configured to output a third analog signal; a first voltage comparison circuit configured to respond to a valid level of a latch signal, and output a first logic level and a second logic level; a first logic circuit configured to respond to a valid level of a flag signal, and identify a comparison result of the first voltage comparison circuit and output the first digit signal; and a pulse generation circuit configured to generate the latch signal and the flag signal with a generation time of the valid levels independently from the first logic level and the second logic level.

A method of increasing SAR ADC conversion rate and reducing power consumption by employing a new timing scheme and minimizing timing delay for each bit-test during binary-search process. The high frequency clock input requirement is eliminated and higher speed rate can be achieved in SAR ADC.

A pipelined SAR ADC includes a first stage and passive residue transfer is used to boost a conversion speed. Owing to the passive residue transfer, the first stage may be released during a residue amplification phase, cutting down a large part of the first-stage timing budget. An asynchronous timing scheme may also be adopted in both the first- and second-stage SAR ADCs to maximize the overall conversion speed. Lastly, a dynamic amplifier with proposed PVT stabilization technique may be employed to further save power consumption and improve the conversion speed simultaneously.

The present disclosure belongs to the technical field of analog or digital-analog hybrid integrated circuits, and relates to a high-speed SAR_ADC digital logic circuit, in particular to a high-speed digital logic circuit for SAR_ADC and a sampling adjustment method. The digital logic circuit includes a comparator, a logic control unit parallel to the comparator, and a capacitor array DAC. The comparator and the logic control unit are simultaneously triggered by a clock signal. The comparator outputs a valid comparison result Dp/Dn, the logic control unit outputs a corresponding rising edge signal, the rising edge signal is slightly later than Dp/Dn output by the comparator through setting a delay match, Dp/Dn is captured by the corresponding rising edge signal, thereby settling a capacitor array. The present disclosure eliminates the disadvantage of the improper settling of the capacitor array of the traditional parallel digital logic.

Described are apparatus and methods for analog to digital converter (ADC) with factoring and background clock calibration. An apparatus includes an ADC configured to sample and convert differential input signals using a reference clock to obtain a defined number of samples during a first state in an acquisition clock cycle, and a finite state machine circuit configured to obtain the defined number of samples from the ADC using a clock based on the reference clock, factor the defined number of samples based on at least a common mode offset associated with the ADC, and send offset factored output to a controller.