An apparatus, system, and method for are provided. A device includes a time-to-digital converter (TDC) situated to convert a time-domain signal to a digital value, a delay circuit situated in parallel with the TDC and to delay the time-domain signal by a specified amount of time resulting in a delayed time-domain signal, a time-to-voltage converter (TVC) situated to produce a voltage-domain signal based on the delayed time-domain signal, and a successive approximation (SAR) circuit situated to receive the digital value and the voltage-domain signal and produce a digital-domain version of the input signal.

Examples herein relate to electronic devices that include an asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) that implements timing adjustment based on output statistics. In an example, an electronic device includes an asynchronous SAR ADC, a statistics monitor, and an operation setting circuit. The asynchronous SAR ADC is configured to output output data. The statistics monitor is configured to capture samples at a bit position of the output data. The statistics monitor is further configured to generate an operational setting based on the captured samples. The operation setting circuit is configured to adjust an operating condition of the asynchronous SAR ADC based on the operational setting.

The invention provides a signal processing system, for transferring analog signals from a probe to a remote processing unit. The system comprises a first ASIC at a probe, which is adapted to receive an analog probe signal. The first ASIC comprises an asynchronous sigma-delta modulator, wherein the asynchronous sigma-delta modulator is adapted to: receive the analog probe signal; and output a binary bit-stream. The system further comprises a second ASIC at the remote processing unit, adapted to receive the binary bit-stream. The asynchronous may further include a time gain function circuit, the first ASIC may further comprise a multiplexer, the second ASIC may further comprise a time-to-digital converter. The time to digital converter may be a pipelined time-to-digital converter.

Described are apparatus and methods for analog to digital converter (ADC) with factoring and background clock calibration. An apparatus includes an ADC configured to sample and convert differential input signals using a reference clock to obtain a defined number of samples during a first state in an acquisition clock cycle, and a finite state machine circuit configured to obtain the defined number of samples from the ADC using a clock based on the reference clock, factor the defined number of samples based on at least a common mode offset associated with the ADC, and send offset factored output to a controller.

This invention is related to the method providing computation of the signal frequency components in an acceptable accuracy in contravention of the shifts in the phase and the magnitude information caused by asynchronous sampling of the signals in the process of asynchronous sampling of metal detectors wherein the received signal by the receiver unit (4) divided into time intervals, say timing values those are far shorter than the sampling period and correspond to nearest probable sampling of the ADC (6); providing the computation of the sine and cosine coefficients or exponents of time constant coefficients of the said timing value from previously located or dynamically generated coefficient table; resulting the elimination of the requirement of synchronous sampling and the requirement of the signal period is multiple of the sampling period.

The invention provides a signal processing system, for transferring analog signals from a probe to a remote processing unit. The system comprises a first ASIC at a probe, which is adapted to receive an analog probe signal. The first ASIC comprises an asynchronous sigma-delta modulator, wherein the asynchronous sigma-delta modulator is adapted to: receive the analog probe signal; and output a binary bit-stream. The system further comprises a second ASIC at the remote processing unit, adapted to receive the binary bit-stream. The asynchronous may further include a time gain function circuit, the first ASIC may further comprise a multiplexer, the second ASIC may further comprise a time-to-digital converter. The time to digital converter may be a pipelined time-to-digital converter.

A voltage-controlled oscillator analog-to-digital converter (VCO-ADC) includes a first source follower coupled between a first input terminal and a first internal node; a first VCO having an input coupled to a second internal node; a first variable resistor coupled between the first internal node and the second internal node; and a digital signal processing component coupled between an output of the first VCO and a output terminal.

Example embodiments relate to systems and methods for analog-to-digital signal conversion. One embodiment includes a system for analog-to-digital signal conversion. The system includes an analog input signal. The system also includes a digital-to-analog converter configured to generate a reference signal. Further, the system includes an amplifier configured to amplify an error signal that includes a difference between the analog input signal and the reference signal. Additionally, the system includes a level-crossing based sampling circuit that includes a first comparator configured to compare the error signal with respect to a first reference level, and a second comparator configured to compare the error signal with respect to a second reference level, thereby generating event-based reset signals corresponding to a plurality of sampling instances in order to reset the digital-to-analog converter. Yet further, the system includes a trigger circuit configured to generate reset signals asynchronous to the event-based reset signals.

An analog-to-digital converter according to one or more embodiments is disclosed that converts an analog input to a digital converted value by repeating a conversion data generation operation by a conversion data generator, a potential generation operation by a capacitance DAC, and a comparison operation by a comparator for a resolution bit, the analog-to-digital converter. a comparator operation signal generation circuit predicts the time when a potential generated by the capacitance DAC becomes settled based on a charging or discharging time to a capacitance element whose characteristics are equal to those of the capacitance used in the capacitance DAC, and generates a comparator operation signal to allow the comparator to start the comparison operation.

A successive-approximation analog-to-digital converter includes a sampling circuit for sampling an analog input signal to acquire a sampled voltage, and a regenerative comparator for comparing the sampled voltage with a succession of reference voltages to generate, for each reference voltage, a decision bit indicating the comparison result. The converter also includes a digital-to-analog converter which is adapted to generate the succession of reference voltages, in dependence on successive comparison results in the comparator, to progressively approximate the sampled voltage. The regenerative comparator comprises an integration circuit for generating output signals defining the decision bits, and a plurality of regeneration circuits for receiving these output signals. The regeneration circuits are operable, in response to respective control signals, to store respective decision bits defined by successive output signals from the integration circuit.