A circuit includes a phase control logic, an analog-to-digital converter (ADC), and digital logic. The phase control logic is configured to couple to a plurality of power phases of a multi-phase power supply. The digital logic is configured to couple to the phase control logic and the ADC, to receive an instruction to operate in a self-calibration mode of operation, receive a first message including a value associated with a calibrated load configured to couple to the plurality of power phases, perform a self-calibration sub-routine for each power phase of the plurality of power phases based at least partially on the received instruction, the received first message, and a signal received from the ADC, and receive a second message instructing the digital logic to store a result of the self-calibration in a memory of the circuit.

A switched-capacitor gain stage circuit and method include an amplifier connected to an input sampling circuit with sampling switched capacitors for coupling an input voltage and a first or second reference voltage to one or more central nodes during a sampling phase and for coupling the one or more central nodes to an amplifier input during a gain phase, wherein a reference loading circuit uses a plurality of sampling switched capacitors connected in a switching configuration to selectively couple a first reference voltage and/or a second reference voltage to the central node by pre-charging the plurality of sampling switched capacitors with the first and second reference voltages during the sampling phase, and by coupling each of the first and second reference voltages to at least one of the plurality of sampling switched capacitors when connected to the central node during the gain phase.

A switched-capacitor gain stage circuit and method include an amplifier connected to an input sampling circuit with sampling switched capacitors for coupling an input voltage and a first or second reference voltage to one or more central nodes during a sampling phase and for coupling the one or more central nodes to an amplifier input during a gain phase, wherein a reference loading circuit uses a plurality of sampling switched capacitors connected in a switching configuration to selectively couple a first reference voltage and/or a second reference voltage to the central node by pre-charging the plurality of sampling switched capacitors with the first and second reference voltages during the sampling phase, and by coupling each of the first and second reference voltages to at least one of the plurality of sampling switched capacitors when connected to the central node during the gain phase.

An image sensing device includes: a first source ramp voltage generation circuit suitable for generating a first source ramp voltage that is adjusted a first voltage unit for each first period, a second source ramp voltage generation circuit suitable for generating a second source ramp voltage that is adjusted the first voltage unit for each first period and has a set voltage difference from the first source ramp voltage, and a ramp voltage generation circuit suitable for generating a ramp voltage that is adjusted a second voltage unit that is less than the first voltage unit for each second period that is shorter than the first period based on the first and second source ramp voltages and a plurality of first control signals.

The analog-to-digital converter includes a first stage in which a voltage to be converted is applied to the input of a first comparator. The first comparator delivers, on a first digital output, a first digital result representative of the comparison between the voltage to be converted and the comparison voltage. The first digital output is connected to a calculator of a first intermediate voltage. A second comparator compares the first intermediate voltage with the comparison voltage and delivers a second digital result on a second digital output terminal. The second digital output terminal is connected to a second calculator of residual voltage that is a function of the voltage to be converted, of first and second voltages and of the first and second digital results. The first calculator is formed by the second calculator.

The analog-to-digital converter includes a first stage in which a voltage to be converted is applied to the input of a first comparator. The first comparator delivers, on a first digital output, a first digital result representative of the comparison between the voltage to be converted and the comparison voltage. The first digital output is connected to a calculator of a first intermediate voltage. A second comparator compares the first intermediate voltage with the comparison voltage and delivers a second digital result on a second digital output terminal. The second digital output terminal is connected to a second calculator of residual voltage that is a function of the voltage to be converted, of first and second voltages and of the first and second digital results. The first calculator is formed by the second calculator.

An analog to digital conversion device according to one or more embodiments may include sequential comparison type analog to digital converters, wherein each of the analog to digital converters converts an analog signal to a digital signal by repeating comparative voltage generation processing to generate a comparative voltage and comparison processing to compare the analog signal with the comparative voltage. Each of the analog to digital converters may include a noise notification part that generates a noise notification signal to give notification of noise production and inputs the noise notification signal to a different one of the analog to digital converters. At start of operation, based on the notification noise signal inputted from the different analog to digital converter, each of the analog to digital converters may be synchronized with the different analog to digital converter performing the comparative voltage generation processing and the comparison processing.

A switched-capacitor gain stage circuit and method include an amplifier connected to an input sampling circuit with sampling switched capacitors for coupling an input voltage and a first or second reference voltage to one or more central nodes during a sampling phase and for coupling the one or more central nodes to an amplifier input during a gain phase, wherein a common-mode reference voltage generation circuit uses one or more additional sampling switched capacitors to selectively couple the first and second reference voltages to the amplifier input during the gain phase when the input voltage is between the high and low threshold voltages using a switching configuration of switches that are controllable to connect the sampling switched capacitors to the one or more central nodes in the sampling phase, and to connect the amplifier output in feedback to the input sampling circuit in the gain phase while simultaneously connecting the one or more central nodes to the first amplifier input.

An analog to digital conversion device according to one or more embodiments may include sequential comparison type analog to digital converters, wherein each of the analog to digital converters converts an analog signal to a digital signal by repeating comparative voltage generation processing to generate a comparative voltage and comparison processing to compare the analog signal with the comparative voltage. Each of the analog to digital converters may include a noise notification part that generates a noise notification signal to give notification of noise production and inputs the noise notification signal to a different one of the analog to digital converters. At start of operation, based on the notification noise signal inputted from the different analog to digital converter, each of the analog to digital converters may be synchronized with the different analog to digital converter performing the comparative voltage generation processing and the comparison processing.

An analog-to-digital converter configured to convert an analog signal into a digital signal includes a first converter configured to receive an input signal of an analog type, compare the input signal with a plurality of reference signals, select one of the plurality of reference signals based on the comparison, and output an upper bit that is a portion of the digital signal based on the selected reference signal, a second converter configured to perform an oversampling operation n times based on a residue signal indicating a difference between an upper analog signal corresponding to the upper bit value and the input signal and output an intermediate bit value of the digital signal corresponding to the first to n-th oversampling signals generated respectively during the oversampling operations performed n times, and a third converter configured to output a lower bit value of the digital signal corresponding to the n-th oversampling signal.