A system and method of converting an analog input signal to a digital output signal includes coupling an analog input signal to a plurality of analog-to-digital converters (ADCs) arranged in a parallel configuration. Pseudo-random discrete valued complementary offset voltage levels that span an input voltage range of the sum of the plurality of ADCs are generated. An amount of continuous, analog dither that randomly varies at values between the discrete offset voltage levels is generated, the analog dither being less than steps between the discrete offset voltage levels. On different clock cycles, different discrete offset voltage levels are coupled to at least some of the ADCs. At each ADC, the respectively coupled analog input, discrete offset voltage level, and continuous analog dither are quantized to obtain a digital output. The respective digital outputs are combined to obtain a linearized digital representation of the analog input signal.

A timing signal diagnostic system includes a chassis housing an input system that receives a timing signal, a timing system that receives the timing signal from the input system, an analog-to-digital converter system that receives the timing signal from the input system, and a processing system that is coupled to the timing system and the analog-to-digital converter system. The processing system uses the timing system to output reference time signals to the analog-to-digital converter system that are based on the timing signal, and uses the analog-to-digital converter system to sample the timing signal based on the reference time signals over a plurality of different timing signal cycles. Based on the sampling of the timing signal, the processing system generates a waveform for the timing signal, and provides a timing signal diagnostic result based on the waveform for the timing signal.

An analog-to-digital converter ADC may be provided. The ADC may include a current driving circuit. The current driving circuit may include an additive current driving circuit and a subtractive current driving circuit configured for adjusting a voltage level of a node. The ADC may include a comparison circuit including a plurality of comparators. Each of the plurality of comparators may be configured to compare a voltage level of the node with a reference voltage.

The disclosure provides a circuit. The circuit includes a first analog to digital converter (ADC) that generates a coarse output in response to a first input and a second input. The first ADC generates the coarse output in a differential phase. A pipeline ADC generates a differential signal in response to the coarse output, the first input and the second input. The pipeline ADC generates the differential signal in a common-mode phase. The first ADC generates a common mode signal in the common-mode phase.

Optimizing data approximation analysis using low power circuitry including receiving a plurality of data bits each corresponding to a binary indication of a test result; placing each of the plurality of data bits on an approximation circuit, wherein each of the data bits is placed on the approximation circuit by applying, to a first capacitor during a set time period, a voltage corresponding to the data bit, and wherein placing each of the plurality of data bits on the approximation circuit results in a resulting voltage stored on the first capacitor; and determining a potential correlation of the test results by comparing the resulting voltage to a voltage threshold.

A flash analog-to-digital converter (ADC) includes comparators that convert an analog input signal to a digital output signal. Offsets of these comparators introduce noise and can hurt the performance of the ADC. Thus, these comparators are calibrated using calibration codes. Conventional calibration methods determine these calibration codes by removing the ADC from an input signal. Otherwise, it is difficult to distinguish the noise from the signal in the calibration measurement. In contrast, an embodiment can determine the calibration codes while the ADC converts the input signal to a digital signal. Such an embodiment can be achieved by a frequency-domain technique. In an embodiment employing a frequency-domain power meter, an input signal can be removed from the power measurement. This removal enables accurate measurement of in-band noise without having the measurement be corrupted by input signal power.

Apparatuses and methods for a multi-level communication architectures are disclosed herein. An example apparatus may include an input/output (I/O) circuit comprising a driver circuit configured to convert a first bitstream directed to a first memory device and a second bitstream directed to a second memory device into a single multilevel signal. The driver circuit is further configured to drive the multilevel signal onto a signal line coupled to the first memory device and to the second memory device using a driver configured to drive more than two voltages.

A pipelined analog-to-digital converter (ADC) and an operating method are provided. The pipelined ADC includes a multiplying digital-to-analog converter (MDAC) and a sub-ADC. The MDAC alternatively operates in an amplifying phase and a sampling phase according to two non-overlapping clocks, and performs operations on an input signal in the amplifying phase according to a target voltage determined by a digital code. The sub ADC includes multiple comparators, a determination circuit, and an encoding circuit. The comparators generate multiple comparison results by comparing the input signal with multiple predetermined voltages. The determination circuit generates multiple comparison completion signals in a non-overlapping interval of the two clocks according to the comparison results. The comparison completion signals respectively indicate whether the comparators complete the comparison. The encoding circuit determines the digital code according to the comparison results and the comparison completion signals.

A pipelined analog-to-digital converter (ADC) and an operating method are provided. The pipelined ADC includes a multiplying digital-to-analog converter (MDAC) and a sub-ADC. The MDAC alternatively operates in an amplifying phase and a sampling phase according to two non-overlapping clocks, and performs operations on an input signal in the amplifying phase according to a target voltage determined by a digital code. The sub-ADC includes multiple comparators, a determination circuit, and an encoding circuit. The comparators generate multiple comparison results by comparing the input signal with multiple predetermined voltages. The determination circuit generates multiple comparison completion signals in a non-overlapping interval of the two clocks according to the comparison results. The comparison completion signals respectively indicate whether the comparators complete the comparison. The encoding circuit determines the digital code according to the comparison results and the comparison completion signals.

The disclosure provides an analog to digital converter (ADC). The ADC includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.