An analog-to-digital converter including a converter arrangement configured to provide a digital output signal as an output of the analog-to-digital converter based on an analog input signal comprising an input to the analog-to-digital converter, the analog-to-digital converter including a calibration module configured to provide calibration signalling to set one or more of a gain of one or more components of the converter arrangement and an offset of one or more components of the converter arrangement, the calibration module further configured to provide, as an output, diagnostic information based on the calibration signalling for use in determining the occurrence of a fault in the analog-to-digital converter.

An analog-to-digital converter including a converter arrangement configured to provide a digital output signal as an output of the analog-to-digital converter based on an analog input signal comprising an input to the analog-to-digital converter, the analog-to-digital converter including a calibration module configured to provide calibration signalling to set one or more of a gain of one or more components of the converter arrangement and an offset of one or more components of the converter arrangement, the calibration module further configured to provide, as an output, diagnostic information based on the calibration signalling for use in determining the occurrence of a fault in the analog-to-digital converter.

An analog-to-digital converter ADC may be provided. The ADC may include a current driving circuit. The current driving circuit may include an additive current driving circuit and a subtractive current driving circuit configured for adjusting a voltage level of a node. The ADC may include a comparison circuit including a plurality of comparators. Each of the plurality of comparators may be configured to compare a voltage level of the node with a reference voltage.

The present disclosure relates to an input circuit comprising positive and negative branches, each branch comprising a transistor arranged for receiving an input voltage at its gate terminal and a first fixed voltage at its drain terminal via a first switch characterized in that the source terminal of the transistor in each of the positive branch and the negative branch is connectable via a second switch to a first plate of a first capacitor in the positive branch and of a second capacitor in the negative branch, respectively, with a second plate of the first capacitor and of the second capacitor being connected to a second fixed voltage and the input circuit further being arranged for receiving a first reset voltage on the first plate of the first capacitor in the positive branch and a second reset voltage on the first plate of the second capacitor in the negative branch.

Disclosed herein is an analog-to-digital converter (ADC) for converting an input analog voltage to an output digital code, the ADC comprising a first node of the input analog voltage: nodes of a plurality of reference voltages; a plurality of comparators, inputs of each comparator being coupled to the first node and a node of a corresponding reference voltage of the plurality of reference voltages; a logic circuit block for receiving outputs of the plurality of comparators and generating the output digital code; and a voltage stabilizer, terminals of the voltage stabilizer being coupled with the first node and a node of a first reference voltage among the plurality of reference voltages.

An analog-to-digital converter configured to convert an analog signal into a digital signal includes a first converter configured to receive an input signal of an analog type, compare the input signal with a plurality of reference signals, select one of the plurality of reference signals based on the comparison, and output an upper bit that is a portion of the digital signal based on the selected reference signal, a second converter configured to perform an oversampling operation n times based on a residue signal indicating a difference between an upper analog signal corresponding to the upper bit value and the input signal and output an intermediate bit value of the digital signal corresponding to the first to n-th oversampling signals generated respectively during the oversampling operations performed n times, and a third converter configured to output a lower bit value of the digital signal corresponding to the n-th oversampling signal.

An ADC includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.

A plurality of devices of a circuit perform a function associated with the circuit. A compensation module obtains a temperature value and/or core voltage value associated with the circuit and uses the temperature value and/or the core voltage value to adjust at least one device of the plurality of devices. The adjustment may include using one or more source resisters connected to the at least one device of the plurality of devices to adjust a device voltage threshold. The plurality of devices may perform analog to digital conversion, and the compensation module may generate a digital offset value using the temperature value and/or the core voltage value and add or subtract the digital offset value from an unadjusted digital output value to compensate for a change in the temperature value and/or the core voltage value.

An example computing device includes an array of memory cells, such as 8-transistor SRAM cells, where the read bit-lines are isolated from the nodes storing the memory states such that simultaneous read activation of memory cells sharing a respective read bit-line would not upset the memory state of any of the memory cells. The computing device also includes an output interface having capacitors connected to respective read bit-lines and have capacitance that differ, such as by factors of powers of 2, from each other. The output interface is configured to charge or discharge the capacitors from the respective read bit-lines and to permit the capacitors to share charge with each other to generate an analog output signal, where the signal from each read bit-line is weighted by the capacitance of the capacitor connected to the read bit-line. A method of making a computing device as described is also disclosed.

This disclosure includes an analog-to-digital converter (ADC) including multiple digital-to-analog converter (DAC) elements and multiple comparators, with an output of each of the comparators provided to an input of a different one of the multiple DAC elements. The ADC also includes a first voltage connection provided to each of the multiple comparators and multiple second voltage connections, with a different second voltage connection provided to each of the multiple comparators. The ADC further includes first and second resistor ladders, with the first resistor ladder configured to be switchably coupled to a first voltage supply and the second resistor ladder configured to be switchably coupled to a second voltage supply. Each of the second voltage connections is configured to be switchably coupled to a different one of the nodes in the first resistor ladder and to a different one of the nodes in the second resistor ladder.