Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

Disclosed herein is an analog-to-digital converter circuit configured for digitizing an analog input signal. The analog-to-digital converter comprises an analog input configured for receiving the analog input signal. The analog-to-digital converter circuit further comprises at least one sub-ADC connected to the analog input signal, wherein the at least one sub-ADC is configured to output at least one encoded output vector in response to receiving the analog input signal. The analog-to-digital converter circuit further comprises a lookup circuit comprising a nested lookup table. The lookup circuit is configured to select an output value from the nested lookup table using the at least one encoded output vector, wherein the lookup circuit is configured to provide the output value as the digitization of the analog input signal.

A temperature sensing circuit includes a current generation circuit generating an initial current proportional to absolute temperature (Iptat), and a voltage generation circuit configured to mirror Iptat using an adjustable current source to produce a scaled current and to source the scaled current to a first terminal of a resistor to produce a reference voltage at the first terminal. A second terminal of the resistor has a voltage complementary to absolute temperature (Vctat) applied thereto. An analog-to-digital converter (ADC) has a reference input receiving the reference voltage, and a data input receiving Vctat or an externally sourced voltage. The ADC generates an output code indicative of a ratio between: a) either Vctat or the externally sourced voltage, and b) the reference voltage. A digital circuit determines a temperature readout from the output code and calibrates the reference voltage and the temperature readout determination based upon the output code.

An apparatus and method are disclosed with some embodiments including an analog and time to digital converter (ATDC) including a receiver, the receiver for receiving an analog channel input for conversion to a digital data, the digital data having at least one bit, and a defined absolute reference time stamp, the defined absolute reference time stamp representing an absolute reference time associated with conversion of the analog channel input to the digital data and an analog-to-digital converter, the converter converting the analog channel input to the digital data.

Disclosed herein is an analog-to-digital converter circuit configured for digitizing an analog input signal. The analog-to-digital converter comprises an analog input configured for receiving the analog input signal. The analog-to-digital converter circuit further comprises at least one sub-ADC connected to the analog input signal, wherein the at least one sub-ADC is configured to output at least one encoded output vector in response to receiving the analog input signal. The analog-to-digital converter circuit further comprises a lookup circuit comprising a nested lookup table. The lookup circuit is configured to select an output value from the nested lookup table using the at least one encoded output vector, wherein the lookup circuit is configured to provide the output value as the digitization of the analog input signal.

An analog-to-digital conversion system includes: a first conversion device configured to communicate with a first analog-to-digital converter configured to convert a first analog signal into a first digital signal; a second conversion device configured to communicate with a second analog-to-digital converter configured to convert a second analog signal into a second digital signal; a first reference low power supply; and a second reference low power supply. The first conversion device is configured to correct the first digital signal, based on a variation amount of a second reference low voltage or a second reference low current. The second conversion device is configured to correct the second digital signal, based on a variation amount of a first reference low voltage or a first reference low current.

An apparatus and method for processing signals in the analog domain. A signal is derived from analog circuit properties that is shift and scale invariant. Although the circuit properties are not quantized as in traditional digital signal processing, the signal is immune from effects of the properties, such as common mode noise, absolute voltage or current level, finite settling time, etc., as a digital signal would be. The shift and scale invariance allows for mathematical operations of addition, subtraction, multiplication and division of signals. By combining these operations, various circuits may be constructed, including a voltage controlled amplifier, a time gain amplifier, and an analog-to-digital converter. The circuits are constructed using almost no non-linear, active devices, and will thus use less power for a given speed than comparable digital devices, and will often be faster as there are no delay elements and no need to wait for the circuit properties to settle.

An apparatus and method for processing signals in the analog domain. A signal is derived from analog circuit properties that is shift and scale invariant. Although the circuit properties are not quantized as in traditional digital signal processing, the signal is immune from effects of the properties, such as common mode noise, absolute voltage or current level, finite settling time, etc., as a digital signal would be. The shift and scale invariance allows for mathematical operations of addition, subtraction, multiplication and division of signals. By combining these operations, various circuits may be constructed, including a voltage controlled amplifier, a time gain amplifier, and an analog-to-digital converter. The circuits are constructed using almost no non-linear, active devices, and will thus use less power for a given speed than comparable digital devices, and will often be faster as there are no delay elements and no need to wait for the circuit properties to settle.

In accordance with some embodiments of the present disclosure, an apparatus including a crossbar circuit is provided. The crossbar circuit may include a plurality of cross-point devices with programmable conductance, a transimpedance amplifier (TIA), and an analog-to-digital converter (ADC). The TIA is configured to produce an output voltage based on an input current corresponding to a summation of current from a first plurality of the cross-point devices. The ADC is configured to generate a digital output corresponding to a digital representation of the output voltage of the TIA. To generate the digital output, the ADC is to generate, using a comparator, a first plurality of bits (e.g., MSBs) of the digital output by performing a coarse conversion process and a second plurality of bits (e.g., LSBs) of the digital output by performing a fine conversion process on a sample-and-hold voltage produced in the coarse conversion process.

Amplifiers can be found in pipelined ADCs and pipelined-SAR ADCs as inter-stage amplifiers. The amplifiers can in some cases implement and provide gains in high speed track and hold circuits. The amplifier structures can be open-loop amplifiers, and the amplifier structures can be used in MDACs and samplers of high speed ADCs. The amplifiers can be employed without resetting, and with incomplete settling, to maximize their speed and minimize their power consumption. The amplifiers can be calibrated to improve performance.