An application specific integrated circuit (ASIC) can drive semiconductor devices, such as, radio frequency amplifiers, switches, etc. The ASIC can include a supply and reference voltage generation circuit, a digital core, a clock generator, a plurality of analog-to-digital converters, low and high-speed communications interfaces, drain and gate sensing circuits (that can include one or more current sense amplifiers), and a gate driver circuit. The ASIC can be a low voltage semiconductor integrated circuit.

An application specific integrated circuit (ASIC) can drive semiconductor devices, such as, radio frequency amplifiers, switches, etc. The ASIC can include a supply and reference voltage generation circuit, a digital core, a clock generator, a plurality of analog-to-digital converters, low and high-speed communications interfaces, drain and gate sensing circuits (that can include one or more current sense amplifiers), and a gate driver circuit. The ASIC can be a low voltage semiconductor integrated circuit.

An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

In certain aspects, an analog-to-digital converter (ADC) includes a comparator having a first input, a second input, and an output. The ADC also includes a digital-to-analog converter (DAC) coupled to the first input of the comparator, a switching circuit, a first capacitor coupled between the first input of the comparator and the switching circuit, a second capacitor coupled between the first input of the comparator and the switching circuit, and an amplifying circuit having an input and an output, wherein the input of the amplifying circuit is coupled to the switching circuit. The ADC further includes a first switch coupled between the output of the amplifying circuit and the DAC, and a successive approximation register (SAR) having an input and an output, wherein the input of the SAR is coupled to the output of the comparator, and the output of the SAR is coupled to the DAC.

In accordance with some embodiments of the present disclosure, an apparatus including a crossbar circuit is provided. The crossbar circuit may include a plurality of cross-point devices with programmable conductance, a transimpedance amplifier (TIA), and an analog-to-digital converter (ADC). The TIA is configured to produce an output voltage based on an input current corresponding to a summation of current from a first plurality of the cross-point devices. The ADC is configured to generate a digital output corresponding to a digital representation of the output voltage of the TIA. To generate the digital output, the ADC is to generate, using a comparator, a first plurality of bits (e.g., MSBs) of the digital output by performing a coarse conversion process and a second plurality of bits (e.g., LSBs) of the digital output by performing a fine conversion process on a sample-and-hold voltage produced in the coarse conversion process.

A circuit portion comprising a clock domain is disclosed. A first clock is arranged to clock components in the clock domain. An analogue to digital converter is clocked by a second clock with a duty cycle. The second clock is derived from the first clock. The analogue to digital converter is arranged to output a feedback signal upon finishing a conversion of a sample, and the feedback signal is arranged to control the duty cycle.

A PAM-4 receiver with jitter compensation clock and data recovery is provided. The receiver includes a first-order delay-locked loop (DLL) which employs a bang-bang phase detector (BBPD) and a voltage-controlled delay line (VCDL) circuit supporting 40 MHz jitter tracking bandwidth and static phase skew elimination. A second-order wideband phase-locked loop (WBPLL) using the ¼-rate reference clock provides multi-phase clock generation with low input-to-output latency. To suppress the consequent jitter transfer, a jitter compensation circuit (JCC) acquires the jitter transfer amplitude and frequency information by detecting the DLL loop filter voltage (VLF(s)) signal, and generates an inverted loop filter voltage signal, denoted as VLF.sub.INV(s). The VLF.sub.INV(S) modulates a group of complementary VCDLs (C-VCDLs) to attenuate the jitter transfer on both recovered clock and data. With the provided receiver, a jitter compensation ratio up to 60% can be supported from DC to 4 MHz, with a −3-dB corner frequency of 40 MHz.

An architecture for a chopper stabilized multiplier-accumulator (MAC) uses a chop clock and common Unit Element (UE), the MAC formed as a plurality of MAC UEs receiving X and W values and a sign bit exclusive ORed with the chop clock, a plurality of Bias UEs receiving E value and a sign bit exclusive ORed with the chop clock, and a plurality of Analog to Digital Conversion (ADC) UEs which collectively perform a scalable MAC operation and generate a binary result. Each MAC UE, BIAS UE and ADC UE comprises groups of NAND gates with complementary outputs arranged in NAND-groups, each NAND gate coupled to a differential charge transfer bus through a binary weighted charge transfer capacitor. The analog charge transfer bus is coupled to groups of ADC UEs with an ADC controller which enables and disables the ADC UEs using successive approximation to determine the accumulated multiplication result.

Provided are an analog-to-digital converter and/or an operating method thereof. The analog-to-digital converter includes a sample/hold circuit, a digital-to-analog converter, a comparing circuit, and a control logic circuit, wherein the digital-to-analog converter includes a first capacitor connected to a first comparison node and a first filtering node, a first reference voltage switch connected to the first filtering node and connected to a first delivery node or a first transmission node, a first pre-charge switch connected to the first filtering node or the first delivery node, and a first pre-charge capacitor connected to the first pre-charge switch and a ground voltage.

Numerous embodiments of a hybrid memory system are disclosed. The hybrid memory can store weight data in an array in analog form when used in an analog neural memory system or in digital form when used in a digital neural memory system. Input circuitry and output circuitry are capable of supporting both forms of weight data.