A time-interleaved noise-shaping successive-approximation analog-to-digital converter (TI NS-SAR ADC) is shown. A first successive-approximation channel has a first set of successive-approximation registers, and a first coarse comparator operative to coarsely adjust the first set of successive-approximation registers. A second successive-approximation channel has a second set of successive-approximation registers, and a second coarse comparator operative to coarsely adjust the second set of successive-approximation registers. A fine comparator is provided to finely adjust the first set of successive-approximation registers and the second set of successive-approximation registers alternately. A noise-shaping circuit is provided to sample residues of the first and second successive-approximation channels for the fine comparator to finely adjust the first and second sets of successive-approximation registers.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A Digital-to-Analog Converter, DAC, is provided. The DAC comprises one or more first DAC cells configured to generate a first analog signal based on first digital data. The one or more first DAC cells are coupled to a first output node for coupling to a first load. The DAC comprises one or more second DAC cells configured to generate a second analog signal based on second digital data. The one or more second DAC cells are coupled to a second output node for coupling to a second load. The one or more first DAC cells and the one or more second DAC cells are couplable to a power supply for drawing a supply current. The DAC further comprises a data generation circuit configured to generate the second digital data based on the first digital data.

A digital-to-analog converter device including a set of components, each component included in the set of components including a number of unit cells, each unit cell being associated with a unit cell size indicating manufacturing specifications of the unit cell is provided by the present disclosure. The digital-to-analog converter device further includes a plurality of switches, each switch included in the plurality of switches being coupled to a component included in the set of components, and an output electrode coupled to the plurality of switches. The digital-to-analog converter device is configured to output an output signal at the output electrode. A first unit cell size associated with a first unit cell included in the set of components is different than a second unit cell size associated with a second unit cell included in the set of components.

A computing device in some examples includes an array of memory cells, such as 8-transisor SRAM cells, in which the read bit-lines are isolated from the nodes storing the memory states such that simultaneous read activation of memory cells sharing a respective read bit-line would not upset the memory state of any of the memory cells. The computing device also includes an output interface having capacitors connected to respective read bit-lines and have capacitance that differ, such as by factors of powers of 2, from each other. The output interface is configured to charge or discharge the capacitors from the respective read bit-lines and to permit the capacitors to share charge with each other to generate an analog output signal, in which the signal from each read bit-line is weighted by the capacitance of the capacitor connected to the read bit-line. The computing device can be used to compute, for example, sum of input weighted by multi-bit weights.

A switched capacitor digital power amplifier (DPA) or a digital-to-analog converter (DAC) is disclosed. The DPA/DAC includes a plurality of switched capacitor cells connected in parallel. Each switched capacitor cell includes a capacitor and a switch. The switch selectively drives the capacitor in response to an input digital codeword. The switched capacitor cells are divided into sub-arrays and a series capacitor is inserted in series between two adjacent sub-arrays of switched capacitor cells. All the sub-arrays of switched capacitor cells may be in a unary-coded structure. Alternatively, at least one of the sub-arrays may be in a C-2C structure and at least one another sub-array may be in a unary-coded structure. The switch in the switched capacitor cells is driven by a local oscillator signal, and a phase correction buffer may be added for adjusting a delay of the local oscillator signal supplied to sub-arrays of switched capacitor cells.

The present disclosure provides digital to analog conversion circuitry comprising: a set of input nodes for receiving a digital input code; an output node for outputting an analog output signal representative of the input code; and a plurality of selectable conversion elements, wherein a parameter of each of the plurality of selectable conversion elements is configured such that a transfer function between the input code and the output analog signal is non-monotonic.

The present invention provides an analog-digital hybrid architecture, which performs 256 multiplications and additions at a time. The system comprises 256 Processing Elements (PE) (108), which are arranged in a matrix form (16 rows and 16 columns). The digital inputs (110) are converted to analog signal (114) using digital to analog converters (DAC) (102). One PE (108) produces one analog output (115) which is nothing but the multiplication of the analog input (114) and the digital weight input (112). The implementation of PE is done by using i) capacitors and switches and ii) resistor and switches. The outputs from multiple PEs (108) in a column are connected together to produce one analog MAC output (116). In the similar manner, the system produces 16 MAC outputs (118) corresponding to 16 columns. Analog to digital converters (ADC) (104) are used to convert the analog MAC output (116) to digital form (118).

A semiconductor device includes first and second terminals, a reference resister being coupled between the first and second terminals, third and fourth terminals, a sensor resister being coupled between the third and fourth terminals, a first buffer which supplies a first reference voltage to the first terminal, a second buffer which supplies a second reference voltage to the fourth terminal, a reference voltage generation circuit which supplies one of first and second voltages alternately in a time division manner as the first reference voltage and supplies the other as the second reference voltage, a first analog-to-digital conversion circuit which performs analog-to-digital conversion on a signal line coupled to the third terminal, an RC filter disposed on the signal line, a noise detector which detects noise of the signal line, wherein a time constant of the RC filter is changed based on a result of the noise detector.

An analog-to-digital conversion device and analog-to-digital conversion method thereof are provided. The analog-to-digital conversion device includes an analog circuit configured to output an analog input signal, and an analog-to-digital converter configured to receive the analog input signal and configured to outputting a digital output signal corresponding to the analog input signal with the use of first and second capacitor arrays, each of the first and second capacitor arrays including a first capacitor having a calibration capacitor connected thereto and a second capacitor having no calibration capacitor connected thereto, wherein the analog-to-digital converter is configured to calibrate the capacitance of the first capacitor by providing a first calibration voltage to the calibration capacitor and is configured to output the digital output signal corresponding to the analog input signal with the use of the calibrated capacitance of the first capacitor.