A delta-sigma modulator includes a first integrator and a comparator. The comparator's positive input couples to the first integrator's positive output, and the comparator's negative input couples to the first integrator's negative output. A first current DAC comprises a current source device, and first and second transistors. The first transistor has a first transistor control input and first and second current terminals. The first current terminal couples to the current source device, and the second current terminal couples to the first integrator positive output. The second transistor has a second transistor control input and third and fourth current terminals. The third current terminal couples to the current source device, and the fourth current terminal couples to the first integrator negative output. A first capacitive device couples to the second transistor control input and to both the second current terminal and the first integrator positive output.

Integrator circuits comprising switched capacitors, non-switched capacitors, and an op amp. One embodiment is directed to an integrator circuit comprising an op amp having an inverting input, a non-inverting input, an inverting output and a non-inverting output, a first sampling capacitor and a first feedback capacitor, and a first non-switched capacitor. The first feedback capacitor is coupled between the inverting input and the non-inverting output of the op amp, and the first non-switched capacitor is coupled between the negative integrator input and the inverting input of the op amp. During a sampling phase, a positive integrator input is coupled to the first sampling capacitor, and during an integration phase, a charge sampled across the first sampling capacitor during the sampling phase is transferred to the first integration capacitor.

A multi-bit continuous-time sigma-delta modulator, SDM, includes an input configured to receive an input analog signal; a first summing junction configured to subtract a feedback analog signal from the input analog signal; a loop filter configured to filter an output signal from the first summing junction (304): an analog-to-digital converter, ADC, configured to convert the filtered analog output signal to a digital output signal; and a feedback path for routing the digital output signal to the first summing junction. The feedback path includes a plurality of digital-to-analog converters, DACs, configured to convert the digital output signal to an analog form. The ADC comprises a plurality of N-bit comparator latches that are each locally time-interleaved with at least a pair of latches and configured to function in a complementary manner and provide a combined complementary output.

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.

A delta-sigma modulator and a delta-sigma converter include an analog amplifying unit to amplify an analog signal and having at least a primary feedback coefficient, a quantizer to quantize an output signal of the analog amplifying unit, a DA converter to perform DA conversion on output of the quantizer and output a feedback signal, an adder-subtractor to input into the analog amplifying unit an analog signal obtained by subtracting the feedback signal from an analog signal input therein, a reset circuit to reset the analog amplifying unit at predetermined periods, and a control circuit to control the analog amplifying unit so that the analog amplifying unit operates as an integrator with the primary feedback coefficient of 1 until a predetermined period elapses after the reset circuit resets the analog amplifying unit and as an amplifier with the primary feedback coefficient of greater than one after the predetermined period has elapsed.

A continuous time delta sigma modulator is disclosed. In one example, the continuous time delta sigma modulator includes: a quantizer, a buffer module, a randomizer, and a reference module. The quantizer includes a comparator that generates a digital output based on a comparison of a reference potential with an input generated based on a sample of an analog signal. The buffer module stores the digital output for a predetermined delay period and outputs the digital output after the predetermined delay period as a delayed digital output. The randomizer randomizes the delayed digital output to generate a randomized digital output. The reference module modifies the reference potential based on the randomized digital output.

A continuous-time analog-to-digital converter (ADC) includes a plurality of integrators selectively coupled in series. The ADC may further include a quantizer with excess loop delay (ELD) compensation. The quantizer may be coupled in series to a least one integrator. The ELD compensation may be programmable based on a transfer function of the ADC. The ADC may further include parallel digital-to-analog converters (DACs). Each DAC may have an input coupled to an output of the quantizer, and an output coupled to an input of a corresponding integrator. The ADC may further include a bypass path coupled to an input or output of one of the integrators. The bypass path may be configured to selectively bypass one or more of the integrators to change the transfer function of the ADC.

Certain aspects of the present disclosure provide methods and apparatus for implementing sampling rate scaling of an excess loop delay (ELD)-compensated continuous-time delta-sigma modulator (CTDSM) analog-to-digital converter (ADC). One example ADC generally includes a loop filter; a quantizer having an input coupled to an output of the loop filter; one or more digital-to-analog converters (DACs), each having an input coupled to an output of the quantizer, an output coupled to an input of the loop filter, and a data latch comprising a clock input for the DAC coupled to a clock input for the ADC; and a clock delay circuit having an input coupled to the clock input for the ADC and an output coupled to a clock input for the quantizer.

A multi-bit continuous-time sigma-delta modulator, SDM, includes an input configured to receive an input analog signal, a first summing junction configured to subtract a feedback analog signal from the input analog signal, a loop filter configured to filter an output signal from the first summing junction: an analog-to-digital converter, ADC, configured to convert the filtered analog output signal to a digital output signal; and a feedback path for routing the digital output signal to the first summing junction. The feedback path includes a plurality of digital-to-analog converters, DACs, configured to convert the digital output signal to an analog form. The ADC includes multiple per-bit parallel loops, each loop configured to provide a per-bit current summation of the filtered analog output signal such that an output of the multiple per-bit parallel loops is a multi-bit quantization digital output signal.

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.