A circuit includes a transistor, a signal generating circuit and a noise sensing circuit. The signal generating circuit is arranged to provide an input signal. The noise sensing circuit is coupled to the transistor and the signal generating circuit, and the noise sensing circuit is arranged for receiving the input signal provided by the signal generating circuit to generate an output signal to the transistor, wherein a signal component of the output signal generated by the noise sensing circuit cancels out a signal component of the input signal provided by the signal generating circuit, and the output signal and the input signal have opposite polarities.

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

An incremental analog-to-digital converter (ADC) with high accuracy. The incremental ADC has a delta-sigma modulator, performing delta-sigma modulation on an analog input signal to output a quantized signal, and a digital filter, receiving the quantized signal to generate a digital representation of the analog input signal. A loop filter of the delta-sigma modulator has a preset circuit. In the preset circuit, the output terminal of the loop filter is preset rather than being reset during the reset phase of the incremental ADC.

An analog-to-digital converter (“ADC”) includes an input terminal configured to receive an analog input signal. A first ADC circuit is coupled to the input terminal and includes a VCO. The first ADC circuit is configured to output a first digital signal in a frequency domain based on the analog input signal. The first digital signal includes an error component. A first DAC is configured to convert the first digital signal to an analog output signal. A first summation circuit is configured to receive the analog output signal, the analog input signal, and a loop filtered version of the analog input signal and extract the error component, and output a negative of the error component. A second ADC circuit is configured to convert the negative of the error component to a digital error signal. A second summation circuit is configured to receive the first digital signal and the digital error signal, and to output a digital output signal corresponding to the analog input at an output terminal.

The disclosure is directed to low-power high-resolution analog-to-digital converter (ADCs) circuits implemented with a delta-sigma modulators (DSMs). The DSM includes a single-bit, self-oscillating digital to analog converter (SB-DAC) and a dual-slope integrating quantizer that may replace an N-bit quantizer found in a conventional DSM. The integrating quantizer of this disclosure oscillates after quantization because the SB-DAC in the feedback path directly closes the DSM loop. The integrating quantizer circuit includes a switch at the input and two phases per sample cycle. During the first phase the switch sends an input analog signal to an integrator. During the second phase, the switch sends the feedback signal from the output of the self-oscillating SB-DAC to the integrator. The input to the SB-DAC may be output from a clocked comparator.

A built-in self-test (BIST) circuit is provided for testing an analog-to-digital converter (ADC). A multi-order sigma-delta (ΣΔ) modulator has an input that receives an input signal, a first output generating analog test signal derived from the input signal and applied to an input of the ADC and a second output generating a binary data stream. A digital recombination and filtering circuit has a first input that receives the binary data stream and a second input that receives a digital test signal output from the ADC in response to the analog test signal. The digital recombination and filtering circuit combines and filters the binary data stream and digital test signal to generate a digital result signal including a signal component derived from an error introduced by operation of the ADC. A correlation circuit is used to isolate that error signal component.

The present invention relates to a method for adjusting the resonance frequency of a loop filter in a delta-sigma modulator, e.g. in an angular rate sensor, to a predetermined frequency value, wherein the sigma-delta modulator comprises an input terminal, which is connected to the loop filter, a quantizer, which is connected to an output of the loop filter, and a feedback branch, which couples an output of the quantizer back to the input terminal. The method comprises the following steps: Optional rough adjustment of the resonance frequency of the filter by means of the regulating variable of a second oscillator, input of a filter input signal of the loop filter into a frequency adjustment circuit, determination of a noise spectrum of the filter input signal in a first frequency band and a second frequency band, wherein the first frequency band and the second frequency band are arranged symmetrically around the predetermined frequency, comparison of the noise spectra and creation of an adjustment signal that leads to a frequency adjustment when the noise spectra deviate from one another, and feedback of the adjustment signal of the frequency adjustment circuit to a control input of the loop filter for setting the filter frequency in response to the comparative result.

The present application discloses a data converter (112). The data converter includes an input terminus (98), a digital-to-analog (D/A) converter (116) and a mapping unit (114). The input terminus is configured to receive an input signal. The D/A converter includes a plurality of D/A converter units configured to generate an output signal. The mapping unit is coupled between the input terminus and the D/A converter and is configured to cause the plurality of D/A conversion units to be equivalently arranged in a relative order in which the plurality of D/A conversion units are gated according to specific electrical characteristics of the plurality of D/A conversion units for digital-to-analog conversion. The present application further provides an A/D converter, a D/A converter and a related chip.

A voltage-controlled oscillator-based delta-sigma analog-to-digital converter (VCO-based ΔΣ ADC) includes a VCO-based quantizer that includes delay elements to provide VCO outputs based on an analog input signal and combining logic to combine the VCO outputs so as to provide quantized outputs. Detection logic detects saturation of the VCO-based quantizer based on the quantized outputs and at least a portion of the VCO outputs. The VCO-based ΔΣ ADC also includes correction logic to modify the quantized outputs and provide modified quantized outputs in response to the detection logic detecting the saturation of the VCO-based quantizer and to provide the quantized outputs unmodified in the absence of saturation being detected.

A data converter is disclosed. The data converter includes a loop-filter, a quantizer, an analog dynamic element matching (DEM) shuffler, a digital DEM shuffler and a feedback digital-to-analog converter. The loop-filter receives analog signals from an analog input. The quantizer then converts the filtered analog signals from the loop-filter to digital signals at a digital output. The analog DEM shuffler shuffles a set of analog threshold levels of the quantizer to yield a set of partially shuffled digital data at an output of the quantizer. The digital DEM shuffler shuffles the set of partially shuffled digital data from the output of the quantizer to yield a set of shuffled digital data. The feedback digital-to-analog converter converts the set of shuffled digital data to a set of analog data to be fed back to the loop-filter.