Patent classifications
H04B10/0791
OPTICAL LINK FAULT IDENTIFICATION METHOD, APPARATUS AND SYSTEM
This application provides an optical link fault identification method, and relate to the field of communications technologies. The method includes: obtaining performance data of a network device, extracting a feature parameter of the performance data, and identifying a fault mode on an optical link based on the feature parameter. The method resolves problems of a difficulty in fault identification and slow troubleshooting that are caused by a large quantity of devices, many line faults, and a difficulty in obtaining manual troubleshooting cases. In addition, a fault can be quickly identified when the fault occurs, improving troubleshooting efficiency. When an optical link risk does not cause a fault, deterioration of the performance data can be found in advance based on a feature, to perform identification and warning.
Transponder Based Active Monitoring Of Optical Networks
A system is provided along a route of a network including a first transponder at a first node and a second transponder at a second node. The system further includes one or more processors configured to detect, in a first waveform measured at the first transponder, a first signature at a first time point, and configured to detect, in a second waveform measured at the second transponder, a second signature at a second time point. The one or more processors may correlate the first waveform and the second waveform, and determine, based on the correlation, that the first signature and the second signature correspond to a same event occurring along the route of the network. Based on comparing the first time point and the second time point, the one or more processors may determine an estimated location of the event.
TUNABLE OPTICAL FILTER CONTROL APPARATUS AND TUNABLE OPTICAL FILTER CONTROL METHOD
A wavelength-tunable optical filter control apparatus in an optical access system that uses wavelength-multiplexed optical signal of a plurality of wavelength channels includes a wavelength-tunable optical filter configured to pass an optical signal of a specific wavelength channel among the plurality of wavelength channels; a light receiving element configured to convert the optical signal that has passed through the wavelength-tunable optical filter into an electrical signal; a signal quality determining unit configured to determine a quality of the electrical signal; and a wavelength-tunable optical filter control unit configured to acquire a light intensity of the electrical signal and control a wavelength of the wavelength-tunable optical filter based on the acquired light intensity and a determination result of the quality of the electrical signal.
Information processing apparatus and optical fiber inspection method
An information processing apparatus of a first information processing apparatus coupled to a second information processing apparatus via an optical fiber, the information processing apparatus includes a memory, and a processor coupled to the memory and the processor configured to store, into the memory, a first reception power of an optical signal received via the optical fiber when an initial value is stored in the memory, store, into the memory, a second reception power of the optical signal received via the optical fiber when the first reception power is stored in the memory, and stop receiving the optical signal when a difference between the first reception power and the second reception power is equal to or greater than a first threshold value.
Optical test device and systems
Systems, methods, and devices are disclosed for monitoring optical communications between a managed location and a remote location. In particular, an optical signal is transmitted over an optical fiber and passed-through a test device. A portion of the optical signal is filtered from the original optical signal and passed to a monitoring unit. The monitoring unit may instruct one or more switches in the test device to loop the optical signal back toward the managed location. Subsequently, testing and monitoring may be performed at the managed location. The device may provide a test output or may transmit the information to the managed location.
Handling compensation for losses in optical fiber links
Systems and methods for measuring accumulated power losses over a fiber link are described in the present disclosure. According to one embodiment, a method includes the step of measuring accumulated losses over a fiber link. The method also includes the step of at least partially compensating for the measured accumulated losses. In response to determining that there is a compensation shortfall with respect to the accumulated losses, the method includes the step of transmitting the compensation shortfall to one or more downstream controllers.
Method and apparatus for testing using a transceiver module
An apparatus in one embodiment includes a transceiver housing operable to be inserted into a port of a host system, the port comprising at least a first channel and a second channel. The transceiver housing may be a compact small form-factor (SFP) pluggable module housing. The apparatus also includes a printed circuit board mounted in the transceiver housing and an electrical interface of the printed circuit board operable to interface with the port of the host system. The electrical interface includes a first transmit pin and a first receive pin configured to interface with the first channel of the port and a second transmit pin and a second receive pin configured to interface with the second channel of the port. A first connector couples the first transmit pin and the second receive pin, and a second connector couples the second transmit pin and the first receive pin.
Method, apparatus and device for predicting fault of optical module
A method and an apparatus for predicting a fault of an optical circuit includes determining a classification threshold of an operating parameter based on a classification sample set corresponding to the operating parameter of optical circuit and predicting, based on comparison results between the classification threshold and a plurality of measured values in a sequence, whether a fault occurs in the future on the optical circuit corresponding to the sequence.
Systems and methods for identifying a source of a degradation in a passive optical network
Techniques for identifying sources of degradations within a PON include detecting a degradation pertaining to a segment of the PON and comparing the drift over time of an optical profile of the segment with respective drifts over time of optical profiles of one or more other PON segments, where pairs of segments share respective common endpoints and an optical profile of a segment corresponds to the characteristics of optical signals delivered over the segment (e.g., attenuation, changes in frequencies, changes in power outputs, etc.). The differences between the compared drift(s) over time are utilized to narrow down the candidate components (e.g., segment endpoints, optical fibers, etc.) for the source of the degradation, and may be utilized to particularly identify a particular endpoint or optical fiber as being the source. The source of the degradation may or may not be a component of the segment to which the degradation pertained.
Transponder based active monitoring of optical networks
A system is provided along a route of a network including a first transponder at a first node and a second transponder at a second node. The system further includes one or more processors configured to detect, in a first waveform measured at the first transponder, a first signature at a first time point, and configured to detect, in a second waveform measured at the second transponder, a second signature at a second time point. The one or more processors may correlate the first waveform and the second waveform, and determine, based on the correlation, that the first signature and the second signature correspond to a same event occurring along the route of the network. Based on comparing the first time point and the second time point, the one or more processors may determine an estimated location of the event.