The various embodiments illustrated herein disclose a method for operating an imaging device. the method includes activating a first image sensor at a first duty cycle within a first time period. The method further includes activating a second image sensor at a second duty cycle within the first time period. Additionally, the method includes modifying at least one of the first duty cycle or the second duty cycle based on at least a workflow associated an operator of the imaging device.

The present embodiment relates to a radiation imaging system and the like provided with a solid-state imaging device having a structure enabling reduction of linear noise appearing in an integrated image. The solid-state imaging device comprises: L pieces of imaging pixel region arranged along a direction crossing a moving direction of a relative position of the solid-state imaging device; and L pieces of A/D converter provided corresponding to the L pieces of imaging pixel region. Each imaging pixel region includes pixels arranged two-dimensionally to form an M-row by N-column matrix. Any one of the L pieces of A/D converter executes a dummy A/D conversion once or more times after an A/D conversion of an electric signal from a pixel of an m-th row, before an A/D conversion of an electric signal from a pixel of an (m+1)-th row.

An image noise calibration apparatus includes a processor. The processor acquires raw image data output by an image sensor. The image sensor includes an image sensitive unit array, and the raw image data is output by the image sensitive unit array in an optical black state. The processor further determines fixed pattern noise calibration data of the image sensor based on the raw image data output by the image sensitive unit array. The fixed pattern noise calibration data is used for noise reduction of the image sensitive unit array, and the number of the fixed pattern noise calibration data is less than the number of image sensitive units in the image sensor.

A solid-state image sensor includes a pixel unit having a plurality of pixels arranged in matrix, a read signal processing circuit, a test signal output circuit, a test signal generating circuit, and a control circuit that controls operations of the above mentioned circuits. Each of the plurality of pixels outputs a pixel signal that is obtained by amplifying a photoelectrically converted signal using an output amplifier in one or more pixel units. The read signal processing circuit reads the pixel signal output from the pixel unit in units of one or more pixels to a corresponding signal line and processes the pixel signal. The test signal output circuit, having a test output amplifier for each signal line, outputs a signal from the test output amplifier to the signal line in response to a test signal input to the test output amplifier. The test signal generating circuit generates the test signal.

The invention relates to a method for detecting bad pixels from a pixel array of a device, for capturing an image, that is sensitive to infrared radiation. The method includes: receiving an input image captured by the pixel system, and calculating a score for a plurality of target pixels including at least some of the pixels from the input image. The score for each target pixel is generated on the basis of k pixels of the input image that are selected in a window of H by H pixels around the target pixel. H is an odd integer greater than or equal to 3, and k is an integer between 2 and 5. Each pixel, from the set formed of the k pixels and the target pixel, share at least one border or corner with another pixel from said set, and the values of the k pixels are at respective distances from the value of the target pixel, the k pixels being selected on the basis of the k distances. The method also includes detecting that at least one of the target pixels is a bad pixel on the basis of the calculated scores.

An image processing device includes an image data generation circuit configured to generate n pieces of Bayer-type divisional image data configured by divisional pixel signals having the same divisional arrangement from divisional pixel signals of mn generated by photoelectric conversion elements at n parts into which each of m pixels is divided, and an image processing circuit configured to perform image processing on the n pieces of Bayer-type divisional image data.

Imagers and associated devices and systems are disclosed herein. In one embodiment, an imager includes a pixel array and control circuitry operably coupled to the pixel array. The pixel array includes an imaging pixel configured to produce a reset signal and a non-imaging pixel configured to produce a nominal reset signal. The control circuitry is configured to produce an output signal based at least in part on one of (a) the nominal reset signal when distortion at the imaging pixel exceeds a threshold and (b) the reset signal when distortion does not exceed the threshold.

A solid state imaging device includes: a group of a plurality of pixels configured to include pixels of the same color coding and with no pixel sharing between each other; and a color filter that is formed by Bayer arrangement of the group of a plurality of pixels.

An object of the present invention is to provide an image processing apparatus, an image processing method, and a program capable of interpolating a gain of a pixel value of a phase difference detection pixel using a gain value even in the case of generating a display image requiring a real-time property. An image processing apparatus (60) sequentially obtains each frame image in time series order of a motion picture and calculates a gain value to be used in gain interpolation of a pixel value of a phase difference detection pixel of a current frame image based on a past frame image obtained in the time series order. The image processing apparatus (60) interpolates the pixel value of the phase difference detection pixel of the current frame image using the gain value.

A first imaging unit detects far-infrared rays and captures a first image. A second imaging unit detects light having a wavelength range shorter than a wavelength range of the far-infrared rays and captures a second image. An unevenness correction unit performs unevenness correction processing on the first image. A correction data acquisition unit acquires correction data for correcting unevenness. A light irradiation determination unit determines whether or not the second imaging unit is irradiated with light having a wavelength range captured by the second imaging unit. A control unit causes the correction data acquisition unit to acquire the correction data in a case where the light irradiation determination unit determines that light irradiation is not performed on the second imaging unit.