Patent classifications
H05G1/52
ELECTRONIC CALIBRATION OF FOCAL SPOT POSITION IN AN X-RAY TUBE
Technology is described for calibrating a deflected position of a central ray of an x-ray tube to a radiation imager. An x-ray system includes an x-ray tube and a tube control unit (TCU). The x-ray tube includes a cathode that includes an electron emitter configured to emit an electron beam, an anode configured to receive the electron beam and generate x-rays with a central ray from electrons of the electron beam colliding on a focal spot of the anode, and a steering magnetic multipole between the cathode and the anode that is configured to produce a steering magnetic field from a steering signal. At least two poles of the steering magnetic multipole are on opposite sides of the electron beam. The TCU includes at least one steering driver configured to generate the steering signal. The TCU is configured to convert a position correction value to the steering signal.
Ebeam tomosynthesis for radiation therapy tumor tracking
A system for tracking tumors during radiotherapy by interleaving treatment pulses with imaging pulses is disclosed. The system includes a multisource scanning eBeam X-ray tube having a plurality of focal spots. The X-ray tube is configured to emit X-rays to a plurality of different locations on a target by sequentially emitting the X-rays to the focal spots in the plurality of focal spots. This is done such that the X-rays can be emitted to the plurality of different locations on the target without substantially moving the X-ray tube or the target. The system further includes an imager panel configured to act as the target and configured to receive the X-rays from the focal spots of the X-ray tube. The system further includes a tomosynthesis reconstruction module configured to process output from the imager panel to construct an image.
Ebeam tomosynthesis for radiation therapy tumor tracking
A system for tracking tumors during radiotherapy by interleaving treatment pulses with imaging pulses is disclosed. The system includes a multisource scanning eBeam X-ray tube having a plurality of focal spots. The X-ray tube is configured to emit X-rays to a plurality of different locations on a target by sequentially emitting the X-rays to the focal spots in the plurality of focal spots. This is done such that the X-rays can be emitted to the plurality of different locations on the target without substantially moving the X-ray tube or the target. The system further includes an imager panel configured to act as the target and configured to receive the X-rays from the focal spots of the X-ray tube. The system further includes a tomosynthesis reconstruction module configured to process output from the imager panel to construct an image.
Electron-Beam Spot Optimization
Electron beam spot characteristics can be tuned in each x-ray tube by moving a focusing-ring along a longitudinal-axis of the x-ray tube. The focusing-ring can then be immovably fastened to the x-ray tube.
An x-ray source can include an x-ray tube and a focusing-ring. The focusing-ring can at least partially encircle an electron-emitter, a cathode, an evacuated-enclosure, or combinations thereof. The focusing-ring can be located outside of a vacuum of the evacuated enclosure. The focusing-ring can adjust an electron-beam spot on a target material of the x-ray tube when moved along a longitudinal-axis extending linearly from the electron-emitter to the target material.
Determining width and height of electron spot
A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.
Determining width and height of electron spot
A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.
X-RAY DIAGNOSTIC IMAGING APPARATUS, MONITORING SERVER AND ANOMALY DETECTION METHOD
In order to provide an X-ray diagnostic imaging apparatus which can detect anomalies caused by factors other than wearing of a bearing of an X-ray tube, according to the present invention, there is provided an X-ray diagnostic imaging apparatus including an X-ray tube that irradiates an object with X-rays, an X-ray detector that detects X-rays having been transmitted through the object, an image creation unit that creates a medical image of the object on the basis of the output of the X-ray detector, a change amount measurement unit that measures a change amount of an X-ray focal point which is an X-ray generation point of the X-ray tube, and an anomaly detection unit that detects an anomaly in the X-ray tube on the basis of whether or not the change amount falls within a predetermined normal change range.
CONTROLLING AN X-RAY TUBE
A method is for controlling an X-ray tube including at least one grid electrode arranged between an anode electrode and a cathode electrode. In an embodiment, the method includes focusing, via a focusing unit, a flow of electrons from the cathode electrode to the anode electrode; applying in a first switching state, a first electrical grid potential to the at least one grid electrode via a switching unit, to pinch off the flow of electrons between the anode electrode and the cathode electrode; and applying in a second switching state, a second electrical grid potential to the at least one grid electrode to enable the flow of electrons, at least the second electrical grid potential being provided by the focusing unit.
Systems and methods for focus control in x-rays
A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.
Systems and methods for focus control in x-rays
A method may include obtaining a feedback or a reference value of a tube voltage applied to a radiation source of a radiation device for generating radiation rays. The method may also include determining, based on the feedback or the reference value of the tube voltage, a specific value of a focusing parameter associated with a focusing device of the radiation device. The method may further include causing the focusing device to shape a focus of the radiation rays according to the determined value of the focusing parameter. The focus of the radiation rays may satisfy an operational constraint under the specific value of the focusing parameter.