An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.

An X-ray imaging apparatus and a consumption level estimation method for an X-ray source, which estimate the consumption level of an X-ray source without measuring grid voltage. An X-ray control part includes: a tube current value setting part setting a tube current value supplied to an X-ray source; a tube current value measurement part measuring a cathode current value as the tube current value by a cathode current detector; a time measurement part measuring the time when the tube current value is set by the tube current value setting part and the time when the tube current value measured by the tube current value measurement part reaches the set value; and a consumption level estimation part estimating the consumption level of a cathode in the X-ray source based one the time until the tube current value reaches the set value after the tube current value has been set.

A method is for spatially influencing a focal spot of an X-ray source that generates X-ray radiation, to an associated X-ray source, to an associated system and to an associated computer program product. The method according to at least one embodiment includes: producing a focal spot on an anode by way of an electron emitter including a plurality of emitter segments, individually controllable to emit electrons; determining at least one actual value of a spatial extent and/or of a position of the produced focal spot; comparing the at least one actual value with a specified reference value of the focal spot; and controlling the emitter segments based upon the comparison of the at least one actual value and the reference value such that the at least one actual value converges toward the reference value, thereby spatially influencing the focal spot of the X-ray source that generates X-ray radiation.

A method is for spatially influencing a focal spot of an X-ray source that generates X-ray radiation, to an associated X-ray source, to an associated system and to an associated computer program product. The method according to at least one embodiment includes: producing a focal spot on an anode by way of an electron emitter including a plurality of emitter segments, individually controllable to emit electrons; determining at least one actual value of a spatial extent and/or of a position of the produced focal spot; comparing the at least one actual value with a specified reference value of the focal spot; and controlling the emitter segments based upon the comparison of the at least one actual value and the reference value such that the at least one actual value converges toward the reference value, thereby spatially influencing the focal spot of the X-ray source that generates X-ray radiation.

A apparatus may include a power supply to receive a first voltage potential and output a second voltage potential that is greater than the first voltage potential and a cathode emitter to emit ions in response to application of the second voltage potential. The apparatus may also include a step down transformer to receive the second voltage potential and output a third voltage potential that is less than the second voltage potential. The apparatus may also include a heating element to, in response to application of the third voltage potential, heat the cathode emitter and lower a work function of the cathode emitter.

To achieve high quality x-ray imaging, it is important to be able to control the production of x-rays in an x-ray generator. This is achieved by an x-ray generator comprising an array of electron field emitters for producing paths of electrons, target material comprising x-ray photon producing material configured to emit x-ray photons in response to the incidence of produced electrons upon it, an array of magnetic-field generators for affecting the paths of the produced electrons from the array of electron field emitters such that one or more paths are divertable away from the x-ray photon producing material so as to reduce the production of x-ray photons by the said one or more paths of electrons, the generator further comprising a sensing circuit arranged to measure the amount of electrical charge emitted by one or more electron emitter, and a controller for controlling the array of magnetic-field generators in response to the amount of electrical charge measured.

To achieve high quality x-ray imaging, it is important to be able to control the production of x-rays in an x-ray generator. This is achieved by an x-ray generator comprising an array of electron field emitters for producing paths of electrons, target material comprising x-ray photon producing material configured to emit x-ray photons in response to the incidence of produced electrons upon it, an array of magnetic-field generators for affecting the paths of the produced electrons from the array of electron field emitters such that one or more paths are divertable away from the x-ray photon producing material so as to reduce the production of x-ray photons by the said one or more paths of electrons, the generator further comprising a sensing circuit arranged to measure the amount of electrical charge emitted by one or more electron emitter, and a controller for controlling the array of magnetic-field generators in response to the amount of electrical charge measured.

An X-ray source (10) for emitting an X-ray beam (101) is proposed. The X-ray source (10) comprises an anode (12) and an emitter arrangement (14) comprising a cathode (16) for emitting an electron beam (15) towards the anode (12) and an electron optics (18) for focusing the electron beam (15) at a focal spot (20) on the anode (12). The X-ray source (10) further comprises a controller (22) configured to determine a switching action of the emitter arrangement (14) and to actuate the emitter arrangement (14) to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot (20) on the anode (12), a size of the focal spot (20), and a shape of the focal spot (20). The controller (22) is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot (20) expected after the switching action. Further, the controller (22) is configured to actuate the electron optics (18) to compensate for a change of the size and the shape of the focal spot (20) induced by the switching action.

An X-ray source (10) for emitting an X-ray beam (101) is proposed. The X-ray source (10) comprises an anode (12) and an emitter arrangement (14) comprising a cathode (16) for emitting an electron beam (15) towards the anode (12) and an electron optics (18) for focusing the electron beam (15) at a focal spot (20) on the anode (12). The X-ray source (10) further comprises a controller (22) configured to determine a switching action of the emitter arrangement (14) and to actuate the emitter arrangement (14) to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot (20) on the anode (12), a size of the focal spot (20), and a shape of the focal spot (20). The controller (22) is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot (20) expected after the switching action. Further, the controller (22) is configured to actuate the electron optics (18) to compensate for a change of the size and the shape of the focal spot (20) induced by the switching action.

A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.