H10N70/8822

Memory cell having dielectric memory element
09721655 · 2017-08-01 · ·

Some embodiments include apparatus and methods having a memory cell with a first electrode, a second electrode, and a dielectric located between the first and second electrodes. The dielectric may be configured to allow the memory cell to form a conductive path in the dielectric from a portion of a material of the first electrode to represent a first value of information stored in the memory cell. The dielectric may also be configured to allow the memory cell to break the conductive path to represent a second value of information stored in the memory cell.

RESISTIVE MEMORY DEVICES

A resistive memory device includes a first conductive line extending in a first horizontal direction on a substrate, a plurality of second conductive lines separated from the first conductive line in a vertical direction and extending in a second horizontal direction intersecting with the first horizontal direction, on the substrate, a plurality of memory cells respectively connected between the first conductive line and one second conductive line selected from among the plurality of second conductive lines at a plurality of intersection points between the first conductive line and the plurality of second conductive lines, each of the plurality of memory cells including a selection device and a resistive memory pattern, and a bottom electrode shared by the plurality of memory cells, the bottom electrode having a variable thickness in the first horizontal direction, and including a top surface having a concave-convex shape.

Non-volatile memory with multiple latency tiers

A non-volatile memory device with multiple latency tiers includes at least two crossbar memory arrays, each crossbar memory array comprising a number of memory cells, each memory cell connected to a word line and a bit line at a cross point. The crossbar memory arrays each have a different latency. The crossbar memory arrays are formed on a single die.

Optimal device structures for back-end-of-line compatible mixed ionic electronic conductors materials

A mixed ionic electron conductor (MIEC)-based memory cell access device is provided. The MIEC-based memory cell access device includes a MIEC material portion located between a bottom electrode and a top electrode. A contact area between the MIEC material portion and the bottom electrode is substantially the same as a contact area between the MIEC material portion and the top electrode.

Switchable macroscopic quantum state devices and methods for their operation

Discloses is an electronic device and a method for its operation. The device has first and second electrodes and an active material. The active material has selectable and stable first and second macroscopic quantum states, such as charge density wave ordered states, having respectively first and second values of electrical resistivity ρ.sub.1 and ρ.sub.2 at the same temperature. ρ.sub.1 is at least 2 times ρ.sub.2. The method includes the step of switching between the first and second macroscopic quantum states by injection of current via the electrodes.

Memory Apparatus and Method of Production Thereof
20170323929 · 2017-11-09 ·

In accordance with an example embodiment of the present invention, an apparatus is disclosed. The apparatus includes a resistive memory component including an active material and two or more electrodes in electrical contact with the active material of the resistive memory component; and a selector component providing control over the resistive memory component, the selector component including an active material and two or more electrodes in electrical contact with the active material of the selector component. The resistive memory component and the selector component share one or more electrodes, and the resistive memory component and the selector component share at least part of the active material. A method and apparatus for producing the apparatus are also disclosed.

Projected memory device with carbon-based projection component

A projected memory device includes a carbon-based projection component. The device includes two electrodes, a memory segment, and a projection component. The projection component and the memory segment form a dual element that connects the two electrodes. The projection component extends parallel to and in contact with the memory segment. The memory segment includes a resistive memory material, while the projection component includes a thin film of non-insulating material that essentially comprises carbon. In a particular implementation, the non-insulating material and the projection component essentially comprises amorphous carbon. Using carbon and, in particular, amorphous carbon, as a main component of the projection component, allows unprecedented flexibility to be achieved when tuning the electrical resistance of the projection component.

CONDUCTIVE HARD MASK FOR MEMORY DEVICE FORMATION

Methods, systems, and devices for memory arrays that use a conductive hard mask during formation and, in some cases, operation are described. A hard mask may be used to define features or components during the numerous material formation and removal steps used to create memory cells within a memory array. The hard mask may be an electrically conductive material, some or all of which may be retained during formation. A conductive line may be connected to each memory cell, and because the hard mask used in forming the cell may be conductive, the cell may be operable even if portions of the hard mask remain after formation.

SWITCHING ELEMENT, SWITCHING ELEMENT ARRAY, AND RESISTIVE RANDOM ACCESS MEMORY INCLUDING SWITCHING ELEMENT, AND METHODS OF MANUFACTURING THE SAME
20170256589 · 2017-09-07 ·

A first electrode and an insulation material layer are sequentially formed over a substrate. A doping mask pattern is formed over the insulation material layer. The doping mask pattern exposes a portion of the insulation material layer. Dopants are injected into the exposed portion of the insulation material layer. The doping mask pattern is removed. A second electrode layer is formed over the insulation material layer. One or more pillar-shaped structures, each of which includes a second electrode, an insulation layer and a first electrode formed by respectively patterning the second electrode layer, the insulation material layer, and the first electrode layer. Each of the one or more pillar-shaped structures includes, in the insulation layer, a part of the exposed portion of the insulation material layer that is doped with the dopants. A threshold switching operation is performed in a region doped with the dopants of the insulation layer.

Synaptic Resistors for Concurrent Parallel Signal Processing, Memory and Learning with High Speed and Energy Efficiency
20210406660 · 2021-12-30 · ·

Synaptic resistors (synstors), and their method of manufacture and integration into exemplary circuits are provided. Synstors are configured to emulate the analog signal processing, learning, and memory functions of synapses. Circuits incorporating synstors are capable of performing signal processing and learning concurrently in parallel analog mode with speed, energy efficiency, and functions superior to computers.