H01J49/4245

Multi-reflecting time of flight mass analyser
11621156 · 2023-04-04 · ·

A mass spectrometer comprising: an ion energy filter 14 arranged and configured to filter ions according to their kinetic energy and so as to only transmit ions having a component of kinetic energy in a first dimension (z-dimension) that is within a selected range; and a multi-reflecting time of flight mass analyser or mass separator 1 having an ion accelerator 6, and two gridless ion mirrors 2 that are elongated in the first dimension (z-dimension) and configured to reflect ions multiple times in a second orthogonal dimension (x-dimension), wherein the ion accelerator 6 is arranged to receive ions from the energy filter 14 and accelerate the ions into one of the ion mirrors 2.

Instrument, including an electrostatic linear ion trap, for separating ions

An instrument for separating ions may include an ion source configured to generate ions from a sample, at least one ion separation instrument configured to separate the generated ions as a function of at least one molecular characteristic and an electrostatic linear ion trap (ELIT) positioned to receive ions exiting the at least one ion separation instrument. The ELIT has first and second ion mirrors separated by a charge detection cylinder, and is configured such that an ion trapped therein oscillates back and forth through the charge detection cylinder between the first and second ion mirrors with a duty cycle, corresponding to a ratio of time spent by the trapped ion traversing the charge detection cylinder and total time spent by the trapped ion traversing a combination of the first and second ion mirrors and the charge detection cylinder during one complete oscillation cycle, of approximately 50%.

Charge detection mass spectrometry with real time analysis and signal optimization

A charge detection mass spectrometer may include an electrostatic linear ion trap (ELIT) or orbitrap, a source of ions to supply ions to the ELIT or orbitrap, a processor operatively coupled to the ELIT or orbitrap, a display monitor coupled to the processor, and a memory having instructions stored therein executable by the processor to produce a control graphic user interface (GUI) on the display monitor, the control GUI including at least one selectable GUI element for at least one corresponding operating parameter of the ELIT or orbitrap, receive a first user command, via user interaction with the control GUI, corresponding to selection of the at least one selectable GUI element, and control the ELIT or orbitrap to control the at least one corresponding operating parameter of the ELIT or orbitrap in response to receipt of, and based on, the first user command.

ION INJECTION TO AN ELECTROSTATIC TRAP

Ions are injected into an orbital electrostatic trap. An ejection potential is applied to an ion storage device, to cause ions stored in the ion storage device to be ejected towards the orbital electrostatic trap. Synchronous injection potentials are applied to a central electrode of the orbital electrostatic trap and a deflector electrode associated with the orbital electrostatic trap, to cause the ions ejected from the ion storage device to be captured by the electrostatic trap such that they orbit the central electrode. Application of the ejection potential and application of the synchronous injection potentials are each started at respective different times, the difference in times being selected based on desired values of mass-to-charge ratios of ions to be captured by the orbital electrostatic trap.

METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHARGE DETECTION MASS SPECTROMETER

There is provided a method of operating a charge detection mass spectrometer (CDMS), the CDMS comprising an electrostatic ion trap, the electrostatic ion trap comprising a plurality of electrodes, the method comprising: a) introducing a first ion into the electrostatic ion trap at a first ion energy, b) setting the voltage of the plurality of electrodes to a first voltage map, c) obtaining first CDMS data indicative of a first ion oscillation frequency, d) obtaining an acceptable range or ranges of ion oscillation frequencies, e) changing the first ion energy to a second ion energy and/or changing the first voltage map to a second voltage map, and f) obtaining second CDMS data indicative of a second ion oscillation frequency.

Method and apparatus for injection of ions into an electrostatic ion trap

A method of injecting ions into an electrostatic trap, comprising: generating ions in an ion source; transporting the ions from the ion source to an ion store downstream of the ion source; releasing the ions from the ion store to an ion guide downstream of the ion store; and accelerating the ions from the ion guide as a pulse into an orbital electrostatic trap for mass analysis, wherein the average velocity of the ions as the ions exit from the ion guide is substantially higher than the average velocity of the ions as they exit from the ion store, wherein there is a delay between releasing the ions from the ion store and accelerating the ions from the ion guide. Also an apparatus suitable for the method.

APPARATUS AND METHODS FOR INJECTING IONS INTO AN ELECTROSTATIC TRAP
20230178356 · 2023-06-08 · ·

A mass spectrometry method comprises: introducing a first packet of ions into an electrostatic trap mass analyzer through a set of electrostatic lenses, wherein, during the introducing of the first packet, either the lenses are operated in a first mode of operation or an injection voltage of a first pre-determined magnitude is applied to an electrode of the mass analyzer; mass analyzing the first ion packet using the mass analyzer; introducing a second packet of ions into the mass analyzer through the set of lenses, wherein, during the introducing of the second packet, either the lenses are operated in a second mode of operation or an injection voltage of a second pre-determined magnitude is applied to the electrode of the mass analyzer; and mass analyzing the second packet of ions using the electrostatic trap mass analyzer.

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
20230170204 · 2023-06-01 · ·

Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field 45 is arranged within a region of small ion energy for electronically controlled tilting of ion packets 54 time front. Tilt angle γ of time front 54 is strongly amplified by a post-acceleration in a flat field 48. Electrostatic deflector 30 downstream of the post-acceleration 48 allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. γ=0 for ion packet in location 55, for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator 40 rims, adjusting ion packets inclination angles α.sub.2, and what is most important, compensating for mechanical misalignments of the optical components.

MULTIPLEX CHARGE DETECTION MASS SPECTROMETRY

Systems and multiplexing methods for measuring the mass of multiple large molecules simultaneously using multiple ion trapping with charge detection mass spectrometry (CDMS) are described. The methods trap ions with a broad range of energies that decouple ion frequency and m/z measurements allowing energy measurements of each ion throughout the acquisition. The ion energy may be obtained from the ratio of the intensity of the fundamental to the second harmonic frequencies of the periodic trapping oscillation making it possible to measure both the m/z and charge of each ion. Because ions with the exact same m/z but different energies appear at different frequencies, the probability of ion-ion interference is significantly reduced. By maximizing the decoupling of ion m/z from frequency, the rate of signal overlap is significantly reduced making it possible to trap more ions and substantially reduce analysis time.

Ion Injection into an Electrostatic Linear Ion Trap Using Zeno Pulsing
20220051887 · 2022-02-17 ·

An ion guide defining a guide axis receives ions. The ion guide applies a potential profile that includes a pseudopotential well to the ions using an ion control field. The ion control field includes a component for restraining movement of the ions normal to the guide axis and a component for controlling the movement of the ions parallel to the guide axis. The ion guide sequentially injects the ions with the same ion energy and in decreasing order of m/z value into an ELIT aligned along an ELIT axis to focus the ions irrespective of m/z value at the same location on the ELIT axis within the ELIT at the same time by varying a magnitude of the pseudopotential well. The ELIT can trap the focused ions using in-trap potential lift or mirror-switching ion capture.