Patent classifications
H01L31/0324
Photo detection device using resonance and related method
A photo detection device comprising a contact layer through which light enters; an absorbing region positioned such that light admitted through the contact layer passes into the absorbing region; at least one diffractive element operatively associated with the absorbing region operating to diffract light into the absorbing region; the configuration of the at least one diffractive element being determined by computer simulation to determine an optimal diffractive element (or elements) and absorbing region configuration for optimal quantum efficiency for at least one predetermined wavelength detection range, the at least one diffractive element operating to diffract light entering through the contact layer such that phases of diffracted waves from locations within the photo detection device or waves reflected by sidewalls and waves reflected by the at least one diffractive element form a constructive interference pattern inside the absorbing region. A method of designing a photodetector comprises using a computer simulation to determine an optimal configuration for at least one wavelength range occurring when waves reflected by the diffractive element form a constructive interference pattern inside the absorbing region.
MoS.SUB.2 .based photosensor for detecting both light wavelength and intensity
In various embodiments, a simple, robust molybdenum disulfide (MoS.sub.2) based photosensor is provided that is able to detect both light intensity and wavelength. The MoS.sub.2 based photosensor may be structured as a field effect transistor (FET) with a back-gate configuration, including MoS.sub.2 nanoflake layers, an insulating layer coated, doped substrate, and source, drain and backgate electrodes. The photoresponse of the MoS.sub.2 based photosensor exhibits a fast response component that is only weakly dependent on the wavelength of light incident on the sensor and a slow response component that is strongly dependent on the wavelength of light incident on the sensor. The fast response component alone may be analyzed to determine intensity of the light, while the slow response component may be analyzed to determine the wavelength of the light.
ELECTRIC FIELD DRIVEN ASSEMBLY OF ORDERED NANOCRYSTAL SUPERLATTICES
An electric field drives nanocrystals dispersed in solvents to assemble into ordered three-dimensional superlattices. A first electrode and a second electrode 214 are in the vessel. The electrodes face each other. A fluid containing charged nanocrystals fills the vessel between the electrodes. The electrodes are connected to a voltage supply which produces an electrical field between the electrodes. The nanocrystals will migrate toward one of the electrodes and accumulate on the electrode producing ordered nanocrystal accumulation that will provide a superlattice thin film, isolated superlattice islands, or coalesced superlattice islands.
Adamantine Semiconductor and Uses Thereof
Disclosed is an adamantine semiconductor. The semiconductor comprises a first element being from one of the following groups:
SOLAR BATTERY
The present disclosure relates to a solar battery. The solar battery comprises a semiconductor structure, a back electrode, and an upper electrode. The semiconductor structure defines a first surface and a second surface. The semiconductor structure comprises an N-type semiconductor layer and a P-type semiconductor layer. The back electrode is located on the first surface. The upper electrode is located on the second surface. The back electrode comprises a first carbon nanotube, the upper electrode comprises a second carbon nanotube, and the first carbon nanotube intersects with the second carbon nanotube. A multilayer structure is formed by an overlapping region of the first carbon nanotube, the semiconductor structure and the second carbon nanotube.
PHOTOELECTRIC CONVERSION ELEMENT
The present disclosure is a photoelectric conversion element including: a photoelectric conversion layer 5 including a first quantum dot 4a and a second quantum dot 4b, a ratio X of the number of heavy metal atoms to the number of oxygen group atoms is less than 2 on a surface of the nanoparticle of the first quantum dot 4a, the ratio X is greater than or equal to 2 on a surface of the nanoparticle of the second quantum dot 4b, and Equation (1) is satisfied:
0.3<N(1),
where N denotes a ratio of the number of second quantum dots to the number of first quantum dots.
TIME-OF-FLIGHT IMAGE SENSOR WITH QUANTOM DOT PHOTODETECTORS
A time-of-flight (ToF) sensor includes a photodetector array and a processing circuit. The photodetector array includes a plurality of photodetectors wherein each photodetector of the photodetector array includes a silicon-based, light-sensitive diode. Each silicon-based, light-sensitive diode includes a photosensitive layer comprising a plurality of quantum dot particles sensitive to a near infrared (NIR) region of an electromagnetic spectrum, wherein the plurality of quantum dot particles converts optical energy into electrical energy to generate an electrical current in response to receiving NIR light having a wavelength in the NIR region. The processing circuit is configured to receive the electrical current and calculate a time-of-flight of the received NIR light based on the electrical current.
Mid and far-infrared nanocrystals based photodetectors with enhanced performances
Disclosed is a plurality of metal chalcogenide nanocrystals coated with multiple organic and inorganic ligands; wherein the metal is selected from Hg, Pb, Sn, Cd, Bi, Sb or a mixture thereof; and the chalcogen is selected from S, Se, Te or a mixture thereof; wherein the multiple inorganic ligands includes at least one inorganic ligands are selected from S.sup.2, HS.sup., Se.sup.2, Te.sup.2, OH.sup., BF.sub.4.sup., PF.sub.6.sup., Cl.sup., Br.sup., I.sup., As.sub.2Se.sub.3, Sb.sub.2S.sub.3, Sb.sub.2Te.sub.3, Sb.sub.2Se.sub.3, As.sub.2S.sub.3 or a mixture thereof; and wherein the absorption of the CH bonds of the organic ligands relative to the absorption of metal chalcogenide nanocrystals is lower than 50%, preferably lower than 20%.
Semiconductor device, photoelectronic device, and method for manufacturing transition-metal dichalcogenide thin film
The present disclosure relates to a semiconductor device and a photoelectronic device, both including a transition-metal dichalcogenide thin-film, and to a method for producing a transition-metal dichalcogenide thin-film. The transition-metal dichalcogenide thin-film includes: a first region including a stack of N+M transition-metal dichalcogenide molecular layers; and a second region including a stack of N transition-metal dichalcogenide molecular layers, wherein the second region is horizontally adjacent to the first region, wherein the N transition-metal dichalcogenide molecular layers of the second region respectively horizontally extend from the N transition-metal dichalcogenide molecular layers of the first region.
Group IV and Group IV-VI Semiconductor Heterojunction Devices
A semiconductor PV detector comprises a Ge layer and a Pb-chalcogenide layer coupled to the Ge layer. The Ge layer comprises a first conduction band with a first conduction potential and a first valence band with a first valence potential. The Pb-chalcogenide layer comprises a second conduction band with a second conduction potential that is lower than the first conduction potential and a second valence band with a second valence potential that is lower than the first valence potential. The Ge layer and the Pb-chalcogenide layer form a heterojunction configured to allow electrons to flow from the Ge layer to the Pb-chalcogenide layer and allow holes to flow from the Pb-chalcogenide layer to the Ge layer.