Patent classifications
H01L2924/15173
PACKAGE SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
A package substrate and method of manufacturing a package substrate and a semiconductor device package are provided. The package substrate includes a circuit layer, an optically-cured dielectric layer, a plurality of block layers and a sacrificial layer. The circuit layer includes a plurality of conductive pads. The optically-cured dielectric layer has an upper surface and a lower surface opposite to the upper surface. The optically-cured dielectric layer covers the circuit layer, and first surfaces of the conductive pads are at least partially exposed from the upper surface of the optically-cured dielectric layer. The block layers are respectively disposed on the first surfaces of the conductive pads exposed by the optically-cured dielectric layer. The sacrificial layer is disposed on the optically-cured dielectric layer and covering the block layers.
INTEGRATED CIRCUIT (IC) TAG
An integrated circuit (IC) tag includes: an IC chip; a substrate that is provided with an antenna on a first surface; an adhesive portion configured to adhere a side surface of the IC chip and a peripheral of the IC chip in a state that a terminal of the IC chip is electrically coupled to the antenna; and a first member that is provided between the antenna and the adhesive portion, the first member having an elastic modulus higher than an elastic modulus of the antenna.
SEMICONDUCTOR PACKAGE INCLUDING STACKED SEMICONDUCTOR CHIPS
A semiconductor package includes: a substrate having first substrate pads formed at one side edge thereof in a first direction and second substrate pads formed at an other side edge thereof in the first direction; a sub semiconductor package formed on the substrate, and including a sub semiconductor chip, a sub molding layer which surrounds side surfaces of the sub semiconductor chip and redistribution conductive layers which extend onto the sub molding layer while being connected with sub chip pads of the sub semiconductor chip and are connected to first redistribution pads and second redistribution pads formed at one side edge and the other side edge, respectively, of the sub molding layer in the first direction; a first chip stack formed on the sub semiconductor package, and including first main semiconductor chips; and a second chip stack formed on the first chip stack, and including second main semiconductor chips.
ENHANCED INTEGRATED CIRCUIT COMPONENT POWER DELIVERY
A processor module comprises an integrated circuit component attached to a power interposer. One or more voltage regulator modules attach to the power interposer via interconnect sockets and the power interposer routes regulated power signals generated by the voltage regulator modules to the integrated circuit component. Input power signals are provided to the voltage regulator from the system board via straight pins, a cable connector, or another type of connector. The integrated circuit component's I/O signals are routed through the power interposer to a system board via a socket located between the power interposer and the socket. Not having to route regulated power signals from a system board through a socket to an integrated circuit component can result in a system board with fewer layers, which can reduce overall system cost, as well as creating more area available in the remaining layers for I/O signal entry to the socket.
Semiconductor package
This invention provides a semiconductor package, the semiconductor package includes: a semiconductor chip having a connection pad; an encapsulant covering at least a portion of the semiconductor chip; and a connection structure disposed on the semiconductor chip and the encapsulant. The connection structure comprises a first insulation layer, a first redistribution layer disposed on the first insulation layer, and a second insulation layer disposed on the first insulation layer and covering the first redistribution layer. The first redistribution layer has one or more openings. The openings have a shape having a plurality of protrusions, respectively, and B/A is 1.5 or less, where A refers to a thickness of the first redistribution layer, and B refers to a thickness of a region of the second insulation layer covering the first redistribution layer.
Stack packages including a fan-out sub-package
A stack package includes a package substrate and a fan-out sub-package mounted on the package substrate using first and second connection bumps. The fan-out sub-package includes a first semiconductor die and redistributed line (RDL) patterns. Second semiconductor dies are stacked on the package substrate to provide a first step structure, and third semiconductor dies are stacked on the second semiconductor dies to provide a second step structure. The second and third semiconductor dies are connected to the package substrate by bonding wires.
ELECTRONIC DEVICE PACKAGE AND METHOD FOR MANUFACTURING THE SAME
An electronic device package includes a circuit layer, a first semiconductor die, a second semiconductor die, a plurality of first conductive structures and a second conductive structure. The first semiconductor die is disposed on the circuit layer. The second semiconductor die is disposed on the first semiconductor die, and has an active surface toward the circuit layer. The first conductive structures are disposed between a first region of the second semiconductor die and the first semiconductor die, and electrically connecting the first semiconductor die to the second semiconductor die. The second conductive structure is disposed between a second region of the second semiconductor die and the circuit layer, and electrically connecting the circuit layer to the second semiconductor die.
SEMICONDUCTOR DEVICES
A semiconductor device comprises a substrate, a semiconductor chip on the substrate, and first and second leads between the substrate and the semiconductor chip. The first and second leads extend from an edge of the substrate toward below the semiconductor chip along a first direction parallel to a top surface of the substrate. The first lead includes a first bump connector and a first segment. The second lead includes a second bump connector. The first bump connector is spaced apart in the first direction from the second bump connector. The first segment of the first lead is spaced apart in a second direction from the second bump connector. The second direction is parallel to the top surface of the substrate and perpendicular to the first direction. A thickness of the first segment of the first lead is less than that of the second bump connector.
TERAHERTZ DEVICE
The task of the present invention is to achieve gain enhancement.
A terahertz device (10) of the present invention includes a terahertz element (20) generating an electromagnetic wave, a dielectric (50) including a dielectric material and surrounding the terahertz element (20), a gas space (92) including a gas, and a reflecting film (82) serving as a reflecting portion. The reflecting film (82) includes a portion opposing the terahertz element (20) through the dielectric (50) and the gas space (92) and reflecting the electromagnetic wave toward a direction, wherein the electromagnetic wave is generated from the terahertz element (20) and transmitted through the dielectric (50) and the gas space (92). In addition, the refractive index of the dielectric (50) is lower than the refractive index of the terahertz element (20) and is higher than the refractive index of the gas in the gas space (92).
Semiconductor package and manufacturing method thereof
A semiconductor package is provided which includes a package substrate, a first die, a second die, an interconnection member and a number of bonding wires. The first die is disposed on the package substrate. The second die is disposed over the first die. The interconnection member is configured for coupling the first die and the second die and comprises a first connection plate, a second connection plate and a bump. The first connection plate is connected to the first die. The second connection plate is connected to the second die. The bump couples the first connection plate and the second connection plate. The bonding wires couple the interconnection member to the package substrate, the first die and the second die.