An apparatus and method for using the known phenomena of quantum gate tunneling in semiconductor transistors to define the DC state of a charge-coupled amplifier is described. A first stage in which the tunneling current is bipolar (by pairing PMOS and NMOS transistors) in combination with a second stage with a controlled common mode voltage that can be used to control the first stage tunneling current, and thus the common mode voltage at the input. This can be done without the use of additional elements that may degrade performance or power consumption, since the input devices both process the input signal and maintain the DC operating point of the circuit. The approach may be advantageously used not only in charge-coupled amplifiers as described herein, but also in other capacitively coupled circuits such as charge balancing analog to digital converters (ADCs) and digital to analog converters (DACs).

A receiver including a first differential sense amplifier configured to amplify an input differential data signal to generate an output differential data signal; a first set of one or more differential decision feedback equalizer (DFE) taps configured to modify the output differential data signal based on a set of one or more differential tap signals, wherein the first set of one or more differential DFE taps affect an output common mode voltage associated with the output differential data signal; and a compensation circuit configured to adjusts the output common mode voltage to compensate for the effect on the output common mode voltage by the set of one or more differential DFE taps. The compensation circuit includes reference and replica receivers to generate reference and replica output common mode voltages, and a feedback circuit to adjust the output common mode voltage based on the reference and replica output common mode voltages.

The present disclosure discloses a sensing circuit and a source driver including the same, capable of decreasing influence on the performance of an integrator according to a panel load and reducing a chip area by excluding a feedback capacitor of the integrator. The sensing circuit may convert an input current, received from a display panel, into an output current having linearity and an amount of current smaller than the input current.

An amplifier circuit includes a circuit path of serially connected complementary type transistors. First and second feedback loops include a loop amplifier, the transistors of the circuit path and a corresponding resistor.

Systems, methods, circuits, and apparatus including computer-readable mediums for managing bit line voltage generating circuits in memory devices are provided. An example bit line voltage generating circuit is configured to provide a stable clamping voltage to at least one bit line connecting memory cells in the memory device. The bit line voltage generating circuit includes an operational amplifier configured to receive a reference voltage, a feedback voltage, and a compensation current and output an output voltage, and an output transistor configured to provide a terminal voltage as the feedback voltage and the output voltage as a target voltage that is associated with the clamping voltage. The operational amplifier is configured to be unbalanced such that the terminal voltage is smaller than the reference voltage, and the compensation current is configured to compensate the operational amplifier such that the clamping voltage is substantially constant and independent from PVT (Process-Voltage-Temperature) effect.

A linear regulator circuit having fast transient response includes an error amplifier (EA) circuit and an output stage circuit. The EA circuit amplifies a difference between a feedback signal and a reference signal to generate an error amplified signal. The output stage circuit includes at least one output power switch which is controlled by the error amplified signal to generate an output signal at an output node. The EA circuit includes at least one pre-stage amplifier circuit which includes a current source circuit, a differential input circuit, a first, a second and a third current mirror circuits and at least one feedback capacitor. One differential transistor of the differential input circuit, the first and the second current mirror circuit form a positive potential feedback (PPFB) loop. The feedback capacitor is coupled between the output node and at least one inverting node at the PPFB loop.

An integrated circuit transformer (150) is formed with a primary winding (91) located in at least a first winding layer having a first thickness, a secondary winding (92) located in at least the first winding layer and having a first center point at the first side of the transformer and two secondary terminals at a second, opposite side of the transformer, and a first center tap feed line (81) located along a symmetry axis of the transformer in an upper metal layer having a second thickness that is at least equivalent to the first thickness of the first winding layer, wherein the first center tap feed line has a direct electrical connection to the first center point in the secondary winding.

A first embodiment is directed to a circuit including a positive biasing circuit with a drive PMOS for biasing in subthreshold, a negative biasing circuit with a drive NMOS for biasing in subthreshold, and an amplification circuit coupled to the biasing circuits. The amplification circuit includes a first stage with a first boosting stage, a second stage with a second boosting stage, and a resistive element coupled between the first and second stages. A second embodiment is directed to a folded cascode operational amplifier wherein a value of the resistive element is selected to place at least one of a drive MOS in subthreshold. A third embodiment is directed to an integrated circuit with a resistive area neighboring a first boosting area and a second boosting area, the resistive area including a resistive element directly connected to a drive PMOS and a drive NMOS.

An analog-to-digital converter (“ADC”) includes an input terminal configured to receive an analog input voltage signal. A first ADC stage is coupled to the input terminal and is configured to output a first digital value corresponding to the analog input voltage signal and a first analog residue signal corresponding to a difference between the first digital value and the analog input signal. An inverter based residue amplifier is configured to receive the first analog residue signal, amplify the first analog residue signal, and output an amplified residue signal. The amplified residue signal is converted to a second digital value, and the first and second digital values are combined to create a digital output signal corresponding to the analog input voltage signal.

An amplifier circuit includes a differential input terminal, a first power supplier, an amplifier, and a current redistributor. A differential input terminal includes a first differential pair of a p-type and a second differential pair of an n-type, and receives an input voltage. A first power supplier supplies a bias current to the differential input terminal. An amplifier receives an output current of the first differential pair and an output current of the second differential pair, and applies an amplified current to an output node. A current redistributor receives the output current of the first differential pair and the output current of the second differential pair, and provides a redistribution current to the differential input terminal.