A complementary clock gate, includes a NOR gate configured to receive a data signal D and a signal QI; a first P-type transistor gated by an output value of the NOR gate; and a NAND gate, connected in series to the first P-type transistor, configured to receive a clock signal CK and an inverted data signal DN, and output an inverted clock signal CKB.

Techniques are disclosed relating to level-shifting circuitry and time borrowing across voltage domains. In some embodiments, sense amplifier circuitry generates, based on an input signal at a first voltage level, an output signal at a second, different voltage level. Pulse circuitry may generate a pulse signal in response to an active clock edge of a clock signal that is input to the sense amplifier circuitry. Initial resolution circuitry may drive the output signal of the sense amplifier circuitry to match the value of the input signal during the pulse signal. Secondary resolution circuitry may maintain a current value of the output signal after expiration of the pulse signal. This may allow the input signal to change during the pulse, e.g., to enable time borrowing by upstream circuitry.

A multi-bit flip-flop includes a first bit flip-flop and a second bit flip-flop. The first bit flip-flop includes an input multiplexer that receives a first and second data bits, and outputs one of the first and second data bits as a third data bit; a first transmission circuit; a first latch; a second transmission circuit; and a second latch that outputs a first output data bit. The second bit flip-flop includes an input multiplexer that receives a fourth data bit and the first output data bit, and outputs one of the fourth data bit and the first output data bit as a fifth data bit; a first transmission circuit, a first latch, a second transmission circuit, and a second latch that outputs a second output data bit. The first output data bit is provided from the first bit flip-flop to the second bit flip-flop along an external wire.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A complementary clock gate, includes a NOR gate configured to receive a data signal D and a signal QI; a first P-type transistor gated by an output value of the NOR gate; and a NAND gate, connected in series to the first P-type transistor, configured to receive a clock signal CK and an inverted data signal DN, and output an inverted clock signal CKB.

A flip-flop includes a first master latch in a first row, a second master latch in a second row, a first slave latch in the first row, and a second slave latch in the second row. The first master latch and the second master latch are adjacently disposed in the second direction, and the first slave latch and the second slave latch are adjacently disposed in the second direction.

Circuits, methods, and systems for generating data outputs based on sampled data inputs. One circuit includes a first latch including a first logic gate, a second logic gate, and a first keeper subcircuit. The circuit further includes a second latch including a third logic gate, a fourth logic gate, and a second keeper subcircuit. The first keeper subcircuit being electrically coupled via a first shared node of the first latch and the second latch, and the second keeper subcircuit being electrically coupled via a second shared node of the first latch and the second latch.

A flip flop circuit includes a first master portion, a second master portion, at least one determining portion and a slave portion. The first master portion is configured to operate at a first mode and to receive a first input and generate first master outputs. The second master portion is configured to operate at a second mode and to receive a second input and generate second master outputs. The at least one determining portion is configured to receive at least one enable signal, and has determining inputs and determining outputs. The determining inputs are connected to the first master outputs and the second master outputs. The determining portion is configured to determine the determining outputs being the first master outputs or the second master outputs according to the at least one enable signal. The slave portion is configured to receive the determining outputs and generate an output signal.

A flip flop circuit includes a first master portion, a second master portion, at least one determining portion and a slave portion. The first master portion is configured to operate at a first mode and to receive a first input and generate first master outputs. The second master portion is configured to operate at a second mode and to receive a second input and generate second master outputs. The at least one determining portion is configured to receive at least one enable signal, and has determining inputs and determining outputs. The determining inputs are connected to the first master outputs and the second master outputs. The determining portion is configured to determine the determining outputs being the first master outputs or the second master outputs according to the at least one enable signal. The slave portion is configured to receive the determining outputs and generate an output signal.

A True Single-Phase Clock (TSPC) NAND-based reset flip-flop includes a reset functionality to perform a reset operation. The flip-flop with the reset functionality includes a master section and a slave section. The reset functionality is achieved using two transistors in the master section. The master section and the slave section operate using the TSPC. The master section and the slave section may include a plurality of NAND circuits and a NAND and NOR circuit for performing the reset operation. The master section outputs a plurality of internal signals on receiving a data input, a scan enable signal, a scan input signal, a reset control signal, and a clock signal. The slave section generates an output on receiving the plurality of internal signals received from the master section.