An apparatus is described. The apparatus includes a physically unclonable (PUF) circuit having a programmable input. The programmable input is to receive a value that caused the PUF circuit to strengthen its stability or strengthen its instability.

The disclosed IC includes a load circuit and a temperature sensor circuit. The temperature sensor circuit measures temperature of the IC and stores temperature data in a register. An SEL mitigation circuit monitors the IC for a temperature change indicative of an SEL. A temperature change greater than a threshold over a time interval is indicative of an SEL. The SEL mitigation circuit is configured to reduce voltage applied to the IC to a voltage level that clears an SEL in the IC in response to a temperature change exceeding the threshold and to increase voltage applied to the load circuit after the reduction in voltage.

An integrated circuit including a first standard cell including, first transistors, the first transistors being first unfolded transistors, a first metal pin, a second metal pin, and a third metal pin on a first layer, the first metal pin and the second metal pin having a first minimum metal center-to-metal center pitch therebetween less than or equal to 80 nm, a fourth metal pin and a fifth metal pin at a second layer, the fourth metal pin and the fifth metal pin extending in a second direction, the second direction being perpendicular to the first direction, a first via between the first metal pin and the fourth metal pin, and a second via between the third metal pin and the fifth metal pin such that a first via center-to-via center space between the first via and the second via is greater than double the first minimum metal center-to-metal center pitch.

The disclosure relates to an integrated circuit comprising: a first voltage terminal; a second voltage terminal; and a plurality of logic cells, comprising one or more field effect transistors having a p-type channel and one or more field effect transistors having an n-type channel. The plurality of logic cells comprises a regular subset of cells and a spare subset of cells. Electrical connectors are arranged to: connect the gates of the regular subset of cells in order to provide a functional logic arrangement; connect the gates of the one or more field effect transistors having a p-type channel of the spare subset of cells to the first voltage terminal; and connect the gates of the one or more field effect transistors having an n-type channel of the spare subset of cells to the second voltage terminal.

The communication apparatus includes a logical device, a wiring line, and a changing unit; the logical device is a programmable device; the wiring line supplies a voltage to the logical device; and the changing unit changes a frequency characteristic of the wiring line based on an operating characteristic obtained by monitoring of the operating characteristic of the logical device for operating by receiving supply of the voltage. According to this, occurrence of voltage drop can be suppressed even if a circuit configured in a programmable logical device is changed.

In one embodiment, an integrated circuit is disclosed. The integrated includes a general purpose processor, an interface circuit, and a calibration adapter circuit. The general purpose processor circuit generates calibration test inputs based on user instruction. The analog interface circuit may include a calibration bus circuit. The calibration bus circuit may receive the calibration test input from the general purpose processor circuit. The calibration adapter circuit is coupled to the calibration bus circuit and the general purpose processor circuit and transmits the calibration test inputs to the calibration bus circuit.

An integrated circuit formed using a semiconductor substrate may include a logic circuit and a switch circuit, whereby the logic circuit operates at a first power supply voltage and the switch circuit operates at a second power supply voltage that is greater than the first power supply voltage. The logic circuit may be formed within a first triple well structure within the semiconductor substrate and is supplied with a first bias voltage. The switch circuit may be formed within a second triple well structure that is electrically isolated from the first triple well structure within the semiconductor substrate and is supplied with a second bias voltage. The switch circuit may receive a control signal that controls the first bias voltage and the second power supply voltage to turn off a transistor in the logic circuit during a programming operation of the integrated circuit.

A circuit arrangement, in particular for a safety I&C system of a nuclear power plant, keeps a proven diagram-centric project-specific engineering approach known from CPU-based systems while reaping the benefits of FPGA technology. To this end, the circuit arrangement includes: a generic FPGA with a plurality of logic blocks, and at least one dedicated PLD which operates as an application-specific switch-matrix for the logic blocks.

An object of the present invention is to provide a high reliable/high safe programmable logic device with high error resistance. The present invention provides a programmable logic device that has a plurality of configuration memories. The configuration memories are divided into a plurality of areas and are arranged and a part of the plurality of areas is set to a high reliable area where reliability of the configuration memory is higher than in the other area.

A programmable IC is disclosed that includes a programmable logic sub-system, a processing sub-system, and a safety sub-system. The programmable logic sub-system is configured to operate a hardware portion of the user design. The processing sub-system configured to execute a software portion of the user design. The safety sub-system is configured to perform a set of operations to detect errors in the programmable IC. The first set of operations writes to at least one of a set of registers using a write macro function. In response to writing to the register with the write macro function, a list of registers stored in the memory is updated to include the register. Registers included in the list of registers are tested to determine whether or not an upset has occurred.