A system, may include a processor configured to receive circuit design data, identify one or more critical paths of the circuit design data, and generate one or more synthetic tunable replica circuits (STRCs) that may mimic the one or more critical paths. The processor may then compile the circuit design data and the one or more STRCs into program data. The system may also include an integrated circuit including a control circuit that may receive the program data from the processor, program a plurality of programmable logic regions of the integrated circuit to implement the circuit design data and the one or more STRCs, and adjust one or more operating parameters of at least one of the plurality of programmable logic regions based on the one or more STRCs.

A method includes detecting an open in a first IO element of a first bank of IOs and not in a second bank of IOs. The first and second banks of IOs are in a channel of a first die. The method includes shifting a first connection between the first IO element and a first core fabric of the first die to second connection between a second IO element and the first core fabric. The second IO element is in the first bank of IOs. The method includes shifting a third connection between a third IO element and a second core fabric of a second die to fourth connection between a fourth IO element and the second core fabric. The third and fourth IO elements are in a third bank of IOs of the second die. The method includes not shifting connections in the second and fourth banks of IOs.

A method includes detecting an open in a first IO element of a first bank of IOs and not in a second bank of IOs. The first and second banks of IOs are in a channel of a first die. The method includes shifting a first connection between the first IO element and a first core fabric of the first die to second connection between a second IO element and the first core fabric. The second IO element is in the first bank of IOs. The method includes shifting a third connection between a third IO element and a second core fabric of a second die to fourth connection between a fourth IO element and the second core fabric. The third and fourth IO elements are in a third bank of IOs of the second die. The method includes not shifting connections in the second and fourth banks of IOs.

An embedded logic analyzer of an integrated circuit includes a comparison block configured to generate a capture data signal and a plurality of comparison enable signals based on an input data signal from one of function blocks included in the integrated circuit such that the comparison enable signals are activated respectively based on different comparison conditions; an operation block configured to perform a logic operation on the comparison enable signals to generate a data enable signal indicating a data capture timing; and packer circuitry configured to generate a packer data signal including capture data and capture time information based on the capture data signal, the data enable signal and a time information signal.

An embedded logic analyzer of an integrated circuit includes a comparison block configured to generate a capture data signal and a plurality of comparison enable signals based on an input data signal from one of function blocks included in the integrated circuit such that the comparison enable signals are activated respectively based on different comparison conditions; an operation block configured to perform a logic operation on the comparison enable signals to generate a data enable signal indicating a data capture timing; and packer circuitry configured to generate a packer data signal including capture data and capture time information based on the capture data signal, the data enable signal and a time information signal.

A programmable integrated circuit includes configuration circuitry configured to receive configurations of a user design for the programmable integrated circuit. Each of the configurations implements the user design using at least some unique circuitry in the programmable integrated circuit relative to the other ones of the configurations. The configuration circuitry is further configured to implement the user design in a first one of the configurations. The configuration circuitry is further configured to move the user design from the first one of the configurations to a second one of the configurations to cause effects of aging processes in circuits in the programmable integrated circuit that are not aged by the first one of the configurations.

A programmable integrated circuit includes configuration circuitry configured to receive configurations of a user design for the programmable integrated circuit. Each of the configurations implements the user design using at least some unique circuitry in the programmable integrated circuit relative to the other ones of the configurations. The configuration circuitry is further configured to implement the user design in a first one of the configurations. The configuration circuitry is further configured to move the user design from the first one of the configurations to a second one of the configurations to cause effects of aging processes in circuits in the programmable integrated circuit that are not aged by the first one of the configurations.

An electronic device includes a time-of-flight unit with a laser emitting ranging light toward a scene, and a detector detecting ranging light reflected from the scene. The detector includes photodetection regions of macropixels. Each macropixel includes photodiodes, and OR logic circuitry receiving outputs of photodiodes as input and generating a detection signal. Each macropixel has output combining logic, and selection circuitry selectively passing the detection signal to the output combining logic or to output combining logic of a neighboring macropixel. The output combining logic has inputs coupled to the selection circuitry and the selection circuitry of the neighboring macropixel, and generates an output signal by logically combining outputs of the selection circuitry and the selection circuitry of the neighboring macropixel. Timing circuitry determines distances to points of the scene from elapsed time between emitting the ranging light and detecting of ranging light reflected from the scene by the photodetection regions.

An electronic device includes a time-of-flight unit with a laser emitting ranging light toward a scene, and a detector detecting ranging light reflected from the scene. The detector includes photodetection regions of macropixels. Each macropixel includes photodiodes, and OR logic circuitry receiving outputs of photodiodes as input and generating a detection signal. Each macropixel has output combining logic, and selection circuitry selectively passing the detection signal to the output combining logic or to output combining logic of a neighboring macropixel. The output combining logic has inputs coupled to the selection circuitry and the selection circuitry of the neighboring macropixel, and generates an output signal by logically combining outputs of the selection circuitry and the selection circuitry of the neighboring macropixel. Timing circuitry determines distances to points of the scene from elapsed time between emitting the ranging light and detecting of ranging light reflected from the scene by the photodetection regions.

A method for programming a Field Programmable Gate Array (FPGA) via a network, the network being operated according to a predetermined communications protocol, can include: establishing a communication connection between the FPGA and an external master, setting the FPGA into a programming mode, the master providing an FPGA programming image to the FPGA in a sequence of frames so that the frames can be parsed and enabling the FPGA to write only during receiving the payload section of the frames. The FPGA programming image and parsing the sequence of frames can be performed by a permanently programmed or hardwired logic component. A network, FPGA, and a communication system can be configured to utilize embodiments of the method.